| # | Name | Short Name | Unit | Principal Investigator | Method/Device | Comment |
| 1 | Event label | Event | | van Kaam, Rianne J M | | |
| 2 | Optional event label | Event 2 | | van Kaam, Rianne J M | | |
| 3 | Latitude of event | Latitude | | van Kaam, Rianne J M | | |
| 4 | Longitude of event | Longitude | | van Kaam, Rianne J M | | |
| 5 | Date/Time of event | Date/Time | | van Kaam, Rianne J M | | |
| 6 | Type of study | Study type | | van Kaam, Rianne J M | | |
| 7 | Sample type | Samp type | | van Kaam, Rianne J M | | |
| 8 | Specific surface area | SSA | m2/g | van Kaam, Rianne J M | Brunauer-Emmett-Teller (BET), Quantasorb. Jr. Sorption System, Quanrachrome Corporation | |
| 9 | Carbon, organic, total | TOC | % | van Kaam, Rianne J M | Flash Isotope Ratio Mass Spectrometer (IRMS); coupled with Mass Spectrometer Delta V Advantage via Conflo IV interface | [wt%] |
| 10 | δ13C, total organic carbon | δ13C TOC | ‰ PDB | van Kaam, Rianne J M | Flash Isotope Ratio Mass Spectrometer (IRMS); coupled with Mass Spectrometer Delta V Advantage via Conflo IV interface | vs. VPDB |
| 11 | Iron III, bioavailable | Fe(III) bioav | µmol/g | van Kaam, Rianne J M | VantaStar microplate reader, BMG Labtech | Extraction according to Lovley and Phillips (1987; doi:10.1128/aem.53.7.1536-1540.1987). Analysis through colorimetrically with ferrozine according to Stookey (1970; doi:10.1021/ac60289a016). |
| 12 | Aluminium | Al | µmol/g | van Kaam, Rianne J M | X-ray fluorescence spectrometer, PANalytical Epsilon 3XL | |
| 13 | Barium | Ba | µmol/g | van Kaam, Rianne J M | X-ray fluorescence spectrometer, PANalytical Epsilon 3XL | |
| 14 | Bromine | Br | µmol/g | van Kaam, Rianne J M | X-ray fluorescence spectrometer, PANalytical Epsilon 3XL | |
| 15 | Calcium | Ca | µmol/g | van Kaam, Rianne J M | X-ray fluorescence spectrometer, PANalytical Epsilon 3XL | |
| 16 | Chlorine | Cl | µmol/g | van Kaam, Rianne J M | X-ray fluorescence spectrometer, PANalytical Epsilon 3XL | |
| 17 | Chromium | Cr | µmol/g | van Kaam, Rianne J M | X-ray fluorescence spectrometer, PANalytical Epsilon 3XL | |
| 18 | Copper | Cu | µmol/g | van Kaam, Rianne J M | X-ray fluorescence spectrometer, PANalytical Epsilon 3XL | |
| 19 | Iron | Fe | µmol/g | van Kaam, Rianne J M | X-ray fluorescence spectrometer, PANalytical Epsilon 3XL | |
| 20 | Potassium | K | µmol/g | van Kaam, Rianne J M | X-ray fluorescence spectrometer, PANalytical Epsilon 3XL | |
| 21 | Magnesium | Mg | µmol/g | van Kaam, Rianne J M | X-ray fluorescence spectrometer, PANalytical Epsilon 3XL | |
| 22 | Manganese | Mn | µmol/g | van Kaam, Rianne J M | X-ray fluorescence spectrometer, PANalytical Epsilon 3XL | |
| 23 | Sodium | Na | µmol/g | van Kaam, Rianne J M | X-ray fluorescence spectrometer, PANalytical Epsilon 3XL | |
| 24 | Nickel | Ni | µmol/g | van Kaam, Rianne J M | X-ray fluorescence spectrometer, PANalytical Epsilon 3XL | |
| 25 | Oxygen | O2 | µmol/g | van Kaam, Rianne J M | X-ray fluorescence spectrometer, PANalytical Epsilon 3XL | |
| 26 | Phosphorus | P | µmol/g | van Kaam, Rianne J M | X-ray fluorescence spectrometer, PANalytical Epsilon 3XL | |
| 27 | Palladium | Pd | µmol/g | van Kaam, Rianne J M | X-ray fluorescence spectrometer, PANalytical Epsilon 3XL | |
| 28 | Palladium | Pd | µmol/g | van Kaam, Rianne J M | X-ray fluorescence spectrometer, PANalytical Epsilon 3XL | |
| 29 | Rhodium | Rh | µmol/g | van Kaam, Rianne J M | X-ray fluorescence spectrometer, PANalytical Epsilon 3XL | |
| 30 | Sulfur | S | µmol/g | van Kaam, Rianne J M | X-ray fluorescence spectrometer, PANalytical Epsilon 3XL | |
| 31 | Silicon | Si | µmol/g | van Kaam, Rianne J M | X-ray fluorescence spectrometer, PANalytical Epsilon 3XL | |
| 32 | Strontium | Sr | µmol/g | van Kaam, Rianne J M | X-ray fluorescence spectrometer, PANalytical Epsilon 3XL | |
| 33 | Titanium | Ti | µmol/g | van Kaam, Rianne J M | X-ray fluorescence spectrometer, PANalytical Epsilon 3XL | |
| 34 | Vanadium | V | µmol/g | van Kaam, Rianne J M | X-ray fluorescence spectrometer, PANalytical Epsilon 3XL | |
| 35 | Zinc | Zn | µmol/g | van Kaam, Rianne J M | X-ray fluorescence spectrometer, PANalytical Epsilon 3XL | |
| 36 | Zirconium | Zr | µmol/g | van Kaam, Rianne J M | X-ray fluorescence spectrometer, PANalytical Epsilon 3XL | |
| 37 | Amphibole | Amp | % | van Kaam, Rianne J M | X-Ray Diffractometer, Bruker Corporation, D8 coupled with a Cu Kα X-ray source [40 kV, 40 mA] | [rel. % ] |
| 38 | Carbonate minerals | Carb min | % | van Kaam, Rianne J M | X-Ray Diffractometer, Bruker Corporation, D8 coupled with a Cu Kα X-ray source [40 kV, 40 mA] | [rel. % ] |
| 39 | Clay | Clay | % | van Kaam, Rianne J M | X-Ray Diffractometer, Bruker Corporation, D8 coupled with a Cu Kα X-ray source [40 kV, 40 mA] | [rel. % ] |
| 40 | Feldspar | Fsp | % | van Kaam, Rianne J M | X-Ray Diffractometer, Bruker Corporation, D8 coupled with a Cu Kα X-ray source [40 kV, 40 mA] | [rel. % ] |
| 41 | Mica | Mica | % | van Kaam, Rianne J M | X-Ray Diffractometer, Bruker Corporation, D8 coupled with a Cu Kα X-ray source [40 kV, 40 mA] | [rel. % ] |
| 42 | Oxide minerals | Ox min | % | van Kaam, Rianne J M | X-Ray Diffractometer, Bruker Corporation, D8 coupled with a Cu Kα X-ray source [40 kV, 40 mA] | -Fe [rel. % ] |
| 43 | Oxide minerals | Ox min | % | van Kaam, Rianne J M | X-Ray Diffractometer, Bruker Corporation, D8 coupled with a Cu Kα X-ray source [40 kV, 40 mA] | [rel. % ] |
| 44 | Quartz | Qz | % | van Kaam, Rianne J M | X-Ray Diffractometer, Bruker Corporation, D8 coupled with a Cu Kα X-ray source [40 kV, 40 mA] | [rel. % ] |
| 45 | Serpentine | Srp | % | van Kaam, Rianne J M | X-Ray Diffractometer, Bruker Corporation, D8 coupled with a Cu Kα X-ray source [40 kV, 40 mA] | [rel. % ] |
| 46 | Silicate, residual | Si(OH)4 resid | % | van Kaam, Rianne J M | X-Ray Diffractometer, Bruker Corporation, D8 coupled with a Cu Kα X-ray source [40 kV, 40 mA] | [rel. % ] |
| 47 | Sulfate minerals | [SO4]2- min | % | van Kaam, Rianne J M | X-Ray Diffractometer, Bruker Corporation, D8 coupled with a Cu Kα X-ray source [40 kV, 40 mA] | [rel. % ] |
| 48 | Zeolite | Zeo | % | van Kaam, Rianne J M | X-Ray Diffractometer, Bruker Corporation, D8 coupled with a Cu Kα X-ray source [40 kV, 40 mA] | [rel. % ] |