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Ikari, Matt J (2020): Rate- and state-dependent friction parameters from velocity-cycling tests where Vo and V attained steady state, Slip law [dataset]. PANGAEA, https://doi.org/10.1594/PANGAEA.915078, In: Ikari, MJ (2020): Laboratory friction measurements of the Waikukupa Thrust, New Zealand [dataset publication series]. PANGAEA, https://doi.org/10.1594/PANGAEA.915079

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Keyword(s):
Alpine Fault; fault; friction; healing; recurrence time; Waikukupa
Related to:
Ikari, Matt J; Carpenter, Brett M; Scuderi, Marco M; Collettini, Cristiano; Kopf, Achim J (2020): Frictional strengthening explored during non-steady state shearing: Implicationsfor fault stability and slip eventrecurrence time. Journal of Geophysical Research: Solid Earth, 125(10), e2020JB020015, https://doi.org/10.1029/2020JB020015
Coverage:
Latitude: -43.514247 * Longitude: 169.943292
Event(s):
TS14_WT4  * Latitude: -43.514247 * Longitude: 169.943292 * Location: Waikukupa Thrust, New Zealand
TS26_WT4  * Latitude: -43.514247 * Longitude: 169.943292 * Location: Waikukupa Thrust, New Zealand
Parameter(s):
#NameShort NameUnitPrincipal InvestigatorMethod/DeviceComment
Event labelEventIkari, Matt J
Sliding velocityVµm/sIkari, Matt JVo
Sliding velocityVµm/sIkari, Matt JV
DurationDurationsIkari, Matt JInter-Cycle Duration
ConstantConstIkari, Matt Ja
ConstantConstIkari, Matt Jb1
Critical slip distanceDcµmIkari, Matt JDc1 (µm)
ConstantConstIkari, Matt Jb2
Critical slip distanceDcµmIkari, Matt JDc2 (µm)
10 ParameterParameterarbitrary unitsIkari, Matt Ja-b
11 Standard deviationStd dev±Ikari, Matt Ja
12 Standard deviationStd dev±Ikari, Matt Jb1
13 Standard deviationStd dev±Ikari, Matt JDc1 (µm)
14 Standard deviationStd dev±Ikari, Matt Jb2
15 Standard deviationStd dev±Ikari, Matt JDc2 (µm)
16 Weighting factorWFIkari, Matt J
Size:
167 data points

Data

Download dataset as tab-delimited text — use the following character encoding:


Event

V [µm/s]
(Vo)

V [µm/s]
(V)

Duration [s]
(Inter-Cycle Duration)

Const
(a)

Const
(b1)

Dc [µm]
(Dc1 (µm))

Const
(b2)

Dc [µm]
(Dc2 (µm))
10 
Parameter [arbitrary units]
(a-b)
11 
Std dev [±]
(a)
12 
Std dev [±]
(b1)
13 
Std dev [±]
(Dc1 (µm))
14 
Std dev [±]
(b2)
15 
Std dev [±]
(Dc2 (µm))
16 
WF
TS14_WT4 0.0110.003449000.01010.012448.6-0.0016768.9-0.0007190.000020.000020.180.0000110.900.5
TS14_WT40.0310.003450000.00880.012072.1-0.0033864.80.0000360.000010.000020.190.000015.150.1
TS14_WT40.1010.0010100.01150.007717.30.0045279.9-0.0007740.000060.000060.260.000032.680.1
TS14_WT40.3010.0010100.01320.009716.20.0037178.7-0.0002630.000100.000100.350.000073.890.1
TS14_WT410.000.003447000.01460.01795.2-0.0032970.000020.000020.010.1
TS14_WT410.000.013449000.01770.01874.9-0.0009600.000030.000030.010.1
TS14_WT410.000.033450000.01640.01695.9-0.0005390.000020.000020.010.1
TS14_WT410.000.1010100.02040.02135.9-0.0009410.000130.000130.040.1
TS14_WT410.000.3010100.02020.02078.4-0.0004560.000100.000100.050.1
TS26_WT4 0.3010.0010000.01310.006710.30.008276.8-0.0017940.000100.000100.340.000090.831.0
TS26_WT40.1010.0010010.01360.007510.20.0073106.0-0.0012850.000050.000050.150.000040.611.0
TS26_WT410.000.3010000.01870.01976.2-0.0009710.000280.000280.120.1
TS26_WT410.000.1010010.02500.02515.9-0.0001150.000440.000430.120.1