Larsen, Hans Christian; Saunders, Andrew D; Shipboard Scientific Party (2005): X-ray fluorescence on samples of ODP Hole 152-914B [dataset]. PANGAEA, https://doi.org/10.1594/PANGAEA.271378
Always quote citation above when using data! You can download the citation in several formats below.
Related to:
Larsen, Hans Christian; Saunders, Andrew D; Clift, Peter D; et al. (1994): Proceedings of the Ocean Drilling Program, 152 Initial Reports. Proceedings of the Ocean Drilling Program, Ocean Drilling Program, 152, 977 pp, https://doi.org/10.2973/odp.proc.ir.152.1994
ODP/TAMU (2005): JANUS Database. Ocean Drilling Program, Texas A&M University, College Station TX 77845-9547, USA; (data copied from Janus 2005-02 to 2005-06), http://www-odp.tamu.edu/database/
Project(s):
Ocean Drilling Program (ODP)
Coverage:
Latitude: 63.462300 * Longitude: -39.724700
Date/Time Start: 1993-09-30T21:59:00 * Date/Time End: 1993-10-03T14:45:00
Minimum DEPTH, sediment/rock: 216.79 m * Maximum DEPTH, sediment/rock: 241.40 m
Event(s):
152-914B * Latitude: 63.462300 * Longitude: -39.724700 * Date/Time Start: 1993-09-30T21:59:00 * Date/Time End: 1993-10-03T14:45:00 * Elevation: -533.0 m * Penetration: 245 m * Recovery: 17.78 m * Location: Greenland Sea * Campaign: Leg152 * Basis: Joides Resolution * Method/Device: Drilling/drill rig (DRILL) * Comment: 17 cores; 151.2 m cored; 0 m drilled; 11.8 % recovery
Parameter(s):
| # | Name | Short Name | Unit | Principal Investigator | Method/Device | Comment |
|---|---|---|---|---|---|---|
| 1 | DEPTH, sediment/rock | Depth sed | m | Geocode | ||
| 2 | Depth, composite | Depth comp | mcd | Shipboard Scientific Party | ||
| 3 | Sample code/label | Sample label | Shipboard Scientific Party | DSDP/ODP/IODP sample designation | ||
| 4 | Sample comment | Sample comment | Shipboard Scientific Party | X-ray fluorescence (XRF) | ||
| 5 | Silicon dioxide | SiO2 | % | Shipboard Scientific Party | X-ray fluorescence (XRF) | |
| 6 | Titanium dioxide | TiO2 | % | Shipboard Scientific Party | X-ray fluorescence (XRF) | |
| 7 | Aluminium oxide | Al2O3 | % | Shipboard Scientific Party | X-ray fluorescence (XRF) | |
| 8 | Iron oxide, Fe2O3 | Fe2O3 | % | Shipboard Scientific Party | X-ray fluorescence (XRF) | |
| 9 | Manganese oxide | MnO | % | Shipboard Scientific Party | X-ray fluorescence (XRF) | |
| 10 | Magnesium oxide | MgO | % | Shipboard Scientific Party | X-ray fluorescence (XRF) | |
| 11 | Calcium oxide | CaO | % | Shipboard Scientific Party | X-ray fluorescence (XRF) | |
| 12 | Sodium oxide | Na2O | % | Shipboard Scientific Party | X-ray fluorescence (XRF) | |
| 13 | Potassium oxide | K2O | % | Shipboard Scientific Party | X-ray fluorescence (XRF) | |
| 14 | Phosphorus pentoxide | P2O5 | % | Shipboard Scientific Party | X-ray fluorescence (XRF) | |
| 15 | Sample type | Samp type | Shipboard Scientific Party | X-ray fluorescence (XRF) | ||
| 16 | Comment | Comment | Shipboard Scientific Party | X-ray fluorescence (XRF) |
License:
Creative Commons Attribution 3.0 Unported (CC-BY-3.0)
Size:
45 data points
Data
| 1 Depth sed [m] | 2 Depth comp [mcd] | 3 Sample label | 4 Sample comment | 5 SiO2 [%] | 6 TiO2 [%] | 7 Al2O3 [%] | 8 Fe2O3 [%] | 9 MnO [%] | 10 MgO [%] | 11 CaO [%] | 12 Na2O [%] | 13 K2O [%] | 14 P2O5 [%] | 15 Samp type | 16 Comment |
|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
| 216.79 | 216.79 | 152-914B-15R-1,69-77 | RUN S2; REP P | 54.36 | 2.12 | 10.58 | 9.95 | 0.10 | 5.01 | 3.03 | 3.39 | 3.36 | 0.14 | Sediment | Sediments |
| 241.40 | 241.40 | 152-914B-17R-4,140-150 | RUN S2; REP P | 57.50 | 1.88 | 10.33 | 9.71 | 0.09 | 4.04 | 3.26 | 3.24 | 3.09 | 0.13 | Sediment | Sediments |
| 241.40 | 241.40 | 152-914B-17R-4,140-150 | RUN S2; REP Q | 55.96 | 1.85 | 10.10 | 9.57 | 0.09 | 3.96 | 3.21 | 3.11 | 2.97 | 0.13 | Sediment | Sediments |