/* DATA DESCRIPTION: Citation: Larsen, Hans Christian; Saunders, Andrew D; Shipboard Scientific Party (2005): X-ray fluorescence on samples of ODP Hole 152-914B. PANGAEA, https://doi.org/10.1594/PANGAEA.271378 Related to: Larsen, Hans Christian; Saunders, Andrew D; Clift, Peter D; et al. (1994): Proceedings of the Ocean Drilling Program, 152 Initial Reports. Proceedings of the Ocean Drilling Program, Ocean Drilling Program, 152, 977 pp, https://doi.org/10.2973/odp.proc.ir.152.1994 ODP/TAMU (2005): JANUS Database. Ocean Drilling Program, Texas A&M University, College Station TX 77845-9547, USA; (data copied from Janus 2005-02 to 2005-06), http://www-odp.tamu.edu/database/ Project(s): Ocean Drilling Program (ODP) (URI: http://www-odp.tamu.edu/) Coverage: LATITUDE: 63.462300 * LONGITUDE: -39.724700 DATE/TIME START: 1993-09-30T21:59:00 * DATE/TIME END: 1993-10-03T14:45:00 MINIMUM DEPTH, sediment/rock: 216.79 m * MAXIMUM DEPTH, sediment/rock: 241.40 m Event(s): 152-914B * LATITUDE: 63.462300 * LONGITUDE: -39.724700 * DATE/TIME START: 1993-09-30T21:59:00 * DATE/TIME END: 1993-10-03T14:45:00 * ELEVATION: -533.0 m * Penetration: 245 m * Recovery: 17.78 m * LOCATION: Greenland Sea * CAMPAIGN: Leg152 (URI: https://doi.org/10.2973/odp.proc.ir.152.1994) * BASIS: Joides Resolution (URI: http://www-odp.tamu.edu/resolutn.html) * METHOD/DEVICE: Drilling/drill rig (DRILL) * COMMENT: 17 cores; 151.2 m cored; 0 m drilled; 11.8 % recovery Parameter(s): DEPTH, sediment/rock [m] (Depth sed) * GEOCODE Depth, composite [mcd] (Depth comp) * PI: Shipboard Scientific Party Sample code/label (Sample label) * PI: Shipboard Scientific Party * METHOD/DEVICE: DSDP/ODP/IODP sample designation (URI: hdl:10013/epic.27914.d001) Sample comment (Sample comment) * PI: Shipboard Scientific Party * METHOD/DEVICE: X-ray fluorescence (XRF) Silicon dioxide [%] (SiO2) * PI: Shipboard Scientific Party * METHOD/DEVICE: X-ray fluorescence (XRF) Titanium dioxide [%] (TiO2) * PI: Shipboard Scientific Party * METHOD/DEVICE: X-ray fluorescence (XRF) Aluminium oxide [%] (Al2O3) * PI: Shipboard Scientific Party * METHOD/DEVICE: X-ray fluorescence (XRF) Iron oxide, Fe2O3 [%] (Fe2O3) * PI: Shipboard Scientific Party * METHOD/DEVICE: X-ray fluorescence (XRF) Manganese oxide [%] (MnO) * PI: Shipboard Scientific Party * METHOD/DEVICE: X-ray fluorescence (XRF) Magnesium oxide [%] (MgO) * PI: Shipboard Scientific Party * METHOD/DEVICE: X-ray fluorescence (XRF) Calcium oxide [%] (CaO) * PI: Shipboard Scientific Party * METHOD/DEVICE: X-ray fluorescence (XRF) Sodium oxide [%] (Na2O) * PI: Shipboard Scientific Party * METHOD/DEVICE: X-ray fluorescence (XRF) Potassium oxide [%] (K2O) * PI: Shipboard Scientific Party * METHOD/DEVICE: X-ray fluorescence (XRF) Phosphorus pentoxide [%] (P2O5) * PI: Shipboard Scientific Party * METHOD/DEVICE: X-ray fluorescence (XRF) Sample type (Samp type) * PI: Shipboard Scientific Party * METHOD/DEVICE: X-ray fluorescence (XRF) Comment (Comment) * PI: Shipboard Scientific Party * METHOD/DEVICE: X-ray fluorescence (XRF) License: Creative Commons Attribution 3.0 Unported (CC-BY-3.0) (URI: https://creativecommons.org/licenses/by/3.0/) Size: 45 data points */ Depth sed [m] Depth comp [mcd] Sample label Sample comment SiO2 [%] TiO2 [%] Al2O3 [%] Fe2O3 [%] MnO [%] MgO [%] CaO [%] Na2O [%] K2O [%] P2O5 [%] Samp type Comment 216.79 216.79 152-914B-15R-1,69-77 RUN S2; REP P 54.36 2.12 10.58 9.95 0.10 5.01 3.03 3.39 3.36 0.14 Sediment Sediments 241.40 241.40 152-914B-17R-4,140-150 RUN S2; REP P 57.50 1.88 10.33 9.71 0.09 4.04 3.26 3.24 3.09 0.13 Sediment Sediments 241.40 241.40 152-914B-17R-4,140-150 RUN S2; REP Q 55.96 1.85 10.10 9.57 0.09 3.96 3.21 3.11 2.97 0.13 Sediment Sediments