Mayer, Larry A; Pisias, Nicklas G; Shipboard Scientific Party (2005): X-ray fluorescence on samples of ODP Hole 138-844C [dataset]. PANGAEA, https://doi.org/10.1594/PANGAEA.271309
Always quote citation above when using data! You can download the citation in several formats below.
Related to:
Mayer, L; Pisias, Nicklas G; Janecek, Thomas R; et al. (1992): Proceedings of the Ocean Drilling Program, 138 Initial Reports. Proceedings of the Ocean Drilling Program, Ocean Drilling Program, 138, 1462 pp, https://doi.org/10.2973/odp.proc.ir.138.1992
ODP/TAMU (2005): JANUS Database. Ocean Drilling Program, Texas A&M University, College Station TX 77845-9547, USA; (data copied from Janus 2005-02 to 2005-06), http://www-odp.tamu.edu/database/
Project(s):
Ocean Drilling Program (ODP)
Coverage:
Latitude: 7.921310 * Longitude: -90.480760
Date/Time Start: 1991-05-11T10:24:00 * Date/Time End: 1991-05-12T08:04:00
Minimum DEPTH, sediment/rock: 28.14 m * Maximum DEPTH, sediment/rock: 75.60 m
Event(s):
138-844C * Latitude: 7.921310 * Longitude: -90.480760 * Date/Time Start: 1991-05-11T10:24:00 * Date/Time End: 1991-05-12T08:04:00 * Elevation: -3414.5 m * Penetration: 180.1 m * Recovery: 189.34 m * Location: North Pacific Ocean * Campaign: Leg138 * Basis: Joides Resolution * Method/Device: Drilling/drill rig (DRILL) * Comment: 19 cores; 180.1 m cored; 0 m drilled; 105.1 % recovery
Parameter(s):
| # | Name | Short Name | Unit | Principal Investigator | Method/Device | Comment |
|---|---|---|---|---|---|---|
| 1 | DEPTH, sediment/rock | Depth sed | m | Geocode | ||
| 2 | Depth, composite | Depth comp | mcd | Shipboard Scientific Party | ||
| 3 | Sample code/label | Sample label | Shipboard Scientific Party | DSDP/ODP/IODP sample designation | ||
| 4 | Sample comment | Sample comment | Shipboard Scientific Party | X-ray fluorescence (XRF) | ||
| 5 | Loss on ignition | LOI | % | Shipboard Scientific Party | X-ray fluorescence (XRF) | Bead_loi |
| 6 | Silicon dioxide | SiO2 | % | Shipboard Scientific Party | X-ray fluorescence (XRF) | |
| 7 | Titanium dioxide | TiO2 | % | Shipboard Scientific Party | X-ray fluorescence (XRF) | |
| 8 | Aluminium oxide | Al2O3 | % | Shipboard Scientific Party | X-ray fluorescence (XRF) | |
| 9 | Iron oxide, Fe2O3 | Fe2O3 | % | Shipboard Scientific Party | X-ray fluorescence (XRF) | |
| 10 | Manganese oxide | MnO | % | Shipboard Scientific Party | X-ray fluorescence (XRF) | |
| 11 | Magnesium oxide | MgO | % | Shipboard Scientific Party | X-ray fluorescence (XRF) | |
| 12 | Calcium oxide | CaO | % | Shipboard Scientific Party | X-ray fluorescence (XRF) | |
| 13 | Sodium oxide | Na2O | % | Shipboard Scientific Party | X-ray fluorescence (XRF) | |
| 14 | Potassium oxide | K2O | % | Shipboard Scientific Party | X-ray fluorescence (XRF) | |
| 15 | Phosphorus pentoxide | P2O5 | % | Shipboard Scientific Party | X-ray fluorescence (XRF) | |
| 16 | Sample type | Samp type | Shipboard Scientific Party | X-ray fluorescence (XRF) | ||
| 17 | Comment | Comment | Shipboard Scientific Party | X-ray fluorescence (XRF) |
License:
Creative Commons Attribution 3.0 Unported (CC-BY-3.0)
Size:
56 data points
Data
| 1 Depth sed [m] | 2 Depth comp [mcd] | 3 Sample label | 4 Sample comment | 5 LOI [%] | 6 SiO2 [%] | 7 TiO2 [%] | 8 Al2O3 [%] | 9 Fe2O3 [%] | 10 MnO [%] | 11 MgO [%] | 12 CaO [%] | 13 Na2O [%] | 14 K2O [%] | 15 P2O5 [%] | 16 Samp type | 17 Comment |
|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
| 28.14 | 30.49 | 138-844C-3H-7,54-56 | RUN UNKN; REP A | 29.15 | 37.10 | 0.33 | 9.64 | 3.99 | 1.28 | 40.72 | 2.15 | 0.90 | 0.32 | Sediment | SEDIMENTS | |
| 37.26 | 41.41 | 138-844C-4H-7,16-18 | RUN UNKN; REP A | 24.85 | 0.09 | 4.01 | 2.34 | 1.47 | 64.98 | 0.03 | 0.27 | Sediment | SEDIMENTS | |||
| 58.05 | 65.70 | 138-844C-7H-1,145-147 | RUN UNKN; REP A | 16.28 | 68.00 | 0.29 | 5.78 | 5.62 | 0.23 | 2.97 | 6.78 | 5.27 | 1.14 | 0.39 | Sediment | SEDIMENTS |
| 75.60 | 84.91 | 138-844C-8H-7,50-52 | RUN UNKN; REP A | 37.82 | 25.50 | 1.65 | 0.91 | 0.25 | 71.54 | 0.12 | Sediment | SEDIMENTS |