/* DATA DESCRIPTION: Citation: Mayer, Larry A; Pisias, Nicklas G; Shipboard Scientific Party (2005): X-ray fluorescence on samples of ODP Hole 138-844C. PANGAEA, https://doi.org/10.1594/PANGAEA.271309 Related to: Mayer, L; Pisias, Nicklas G; Janecek, Thomas R; et al. (1992): Proceedings of the Ocean Drilling Program, 138 Initial Reports. Proceedings of the Ocean Drilling Program, Ocean Drilling Program, 138, 1462 pp, https://doi.org/10.2973/odp.proc.ir.138.1992 ODP/TAMU (2005): JANUS Database. Ocean Drilling Program, Texas A&M University, College Station TX 77845-9547, USA; (data copied from Janus 2005-02 to 2005-06), http://www-odp.tamu.edu/database/ Project(s): Ocean Drilling Program (ODP) (URI: http://www-odp.tamu.edu/) Coverage: LATITUDE: 7.921310 * LONGITUDE: -90.480760 DATE/TIME START: 1991-05-11T10:24:00 * DATE/TIME END: 1991-05-12T08:04:00 MINIMUM DEPTH, sediment/rock: 28.14 m * MAXIMUM DEPTH, sediment/rock: 75.60 m Event(s): 138-844C * LATITUDE: 7.921310 * LONGITUDE: -90.480760 * DATE/TIME START: 1991-05-11T10:24:00 * DATE/TIME END: 1991-05-12T08:04:00 * ELEVATION: -3414.5 m * Penetration: 180.1 m * Recovery: 189.34 m * LOCATION: North Pacific Ocean * CAMPAIGN: Leg138 (URI: https://doi.org/10.2973/odp.proc.ir.138.1992) * BASIS: Joides Resolution (URI: http://www-odp.tamu.edu/resolutn.html) * METHOD/DEVICE: Drilling/drill rig (DRILL) * COMMENT: 19 cores; 180.1 m cored; 0 m drilled; 105.1 % recovery Parameter(s): DEPTH, sediment/rock [m] (Depth sed) * GEOCODE Depth, composite [mcd] (Depth comp) * PI: Shipboard Scientific Party Sample code/label (Sample label) * PI: Shipboard Scientific Party * METHOD/DEVICE: DSDP/ODP/IODP sample designation (URI: hdl:10013/epic.27914.d001) Sample comment (Sample comment) * PI: Shipboard Scientific Party * METHOD/DEVICE: X-ray fluorescence (XRF) Loss on ignition [%] (LOI) * PI: Shipboard Scientific Party * METHOD/DEVICE: X-ray fluorescence (XRF) * COMMENT: Bead_loi Silicon dioxide [%] (SiO2) * PI: Shipboard Scientific Party * METHOD/DEVICE: X-ray fluorescence (XRF) Titanium dioxide [%] (TiO2) * PI: Shipboard Scientific Party * METHOD/DEVICE: X-ray fluorescence (XRF) Aluminium oxide [%] (Al2O3) * PI: Shipboard Scientific Party * METHOD/DEVICE: X-ray fluorescence (XRF) Iron oxide, Fe2O3 [%] (Fe2O3) * PI: Shipboard Scientific Party * METHOD/DEVICE: X-ray fluorescence (XRF) Manganese oxide [%] (MnO) * PI: Shipboard Scientific Party * METHOD/DEVICE: X-ray fluorescence (XRF) Magnesium oxide [%] (MgO) * PI: Shipboard Scientific Party * METHOD/DEVICE: X-ray fluorescence (XRF) Calcium oxide [%] (CaO) * PI: Shipboard Scientific Party * METHOD/DEVICE: X-ray fluorescence (XRF) Sodium oxide [%] (Na2O) * PI: Shipboard Scientific Party * METHOD/DEVICE: X-ray fluorescence (XRF) Potassium oxide [%] (K2O) * PI: Shipboard Scientific Party * METHOD/DEVICE: X-ray fluorescence (XRF) Phosphorus pentoxide [%] (P2O5) * PI: Shipboard Scientific Party * METHOD/DEVICE: X-ray fluorescence (XRF) Sample type (Samp type) * PI: Shipboard Scientific Party * METHOD/DEVICE: X-ray fluorescence (XRF) Comment (Comment) * PI: Shipboard Scientific Party * METHOD/DEVICE: X-ray fluorescence (XRF) License: Creative Commons Attribution 3.0 Unported (CC-BY-3.0) (URI: https://creativecommons.org/licenses/by/3.0/) Size: 56 data points */ Depth sed [m] Depth comp [mcd] Sample label Sample comment LOI [%] SiO2 [%] TiO2 [%] Al2O3 [%] Fe2O3 [%] MnO [%] MgO [%] CaO [%] Na2O [%] K2O [%] P2O5 [%] Samp type Comment 28.14 30.49 138-844C-3H-7,54-56 RUN UNKN; REP A 29.15 37.10 0.33 9.64 3.99 1.28 40.72 2.15 0.90 0.32 Sediment SEDIMENTS 37.26 41.41 138-844C-4H-7,16-18 RUN UNKN; REP A 24.85 0.09 4.01 2.34 1.47 64.98 0.03 0.27 Sediment SEDIMENTS 58.05 65.70 138-844C-7H-1,145-147 RUN UNKN; REP A 16.28 68.00 0.29 5.78 5.62 0.23 2.97 6.78 5.27 1.14 0.39 Sediment SEDIMENTS 75.60 84.91 138-844C-8H-7,50-52 RUN UNKN; REP A 37.82 25.50 1.65 0.91 0.25 71.54 0.12 Sediment SEDIMENTS