Citation:

PANGAEA.915079

Name: Rate- and state-dependent friction parameters from velocity-step tests, Slip law
Creator: Matt J Ikari
Published: 2020-04-22
License: https://creativecommons.org/licenses/by/4.0/
Keywords: Alpine Fault; fault; friction; healing; recurrence time; Waikukupa

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Keyword(s):

Alpine Fault; fault; friction; healing; recurrence time; Waikukupa

Related to:

Ikari, Matt J; Carpenter, Brett M; Scuderi, Marco M; Collettini, Cristiano; Kopf, Achim J (2020): Frictional strengthening explored during non-steady state shearing: Implicationsfor fault stability and slip eventrecurrence time. Journal of Geophysical Research: Solid Earth, 125(10), e2020JB020015, https://doi.org/10.1029/2020JB020015

Coverage:

Latitude: -43.514247 * Longitude: 169.943292

Event(s):

TS22_WT4 * Latitude: -43.514247 * Longitude: 169.943292 * Location: Waikukupa Thrust, New Zealand

TS23_WT4 * Latitude: -43.514247 * Longitude: 169.943292 * Location: Waikukupa Thrust, New Zealand

Parameter(s):

#	Name	Short Name	Unit	Principal Investigator	Comment
1	Event label	Event		Ikari, Matt J
2	Sliding velocity	V	µm/s	Ikari, Matt J	Vo
3	Sliding velocity	V	µm/s	Ikari, Matt J	V
4	Constant	Const		Ikari, Matt J	a
5	Constant	Const		Ikari, Matt J	b1
6	Critical slip distance	Dc	µm	Ikari, Matt J	Dc1 (µm)
7	Constant	Const		Ikari, Matt J	b2
8	Critical slip distance	Dc	µm	Ikari, Matt J	Dc2 (µm)
9	Parameter	Parameter	arbitrary units	Ikari, Matt J	a-b
10	Standard deviation	Std dev	±	Ikari, Matt J	a
11	Standard deviation	Std dev	±	Ikari, Matt J	b1
12	Standard deviation	Std dev	±	Ikari, Matt J	Dc1 (µm)
13	Standard deviation	Std dev	±	Ikari, Matt J	b2
14	Standard deviation	Std dev	±	Ikari, Matt J	Dc2 (µm)
15	Weighting factor	WF		Ikari, Matt J

License:

Creative Commons Attribution 4.0 International (CC-BY-4.0)

Size:

164 data points

Data

Download dataset as tab-delimited text — use the following character encoding:

1 Event	2 V [µm/s] (Vo)	3 V [µm/s] (V)	4 Const (a)	5 Const (b1)	6 Dc [µm] (Dc1 (µm))	7 Const (b2)	8 Dc [µm] (Dc2 (µm))	9 Parameter [arbitrary units] (a-b)	10 Std dev [±] (a)	11 Std dev [±] (b1)	12 Std dev [±] (Dc1 (µm))	13 Std dev [±] (b2)	14 Std dev [±] (Dc2 (µm))	15 WF
TS22_WT4	0.010	0.03	0.0108	0.0075	1.1	0.0071	13.3	-0.0038	0.00007	0.00006	0.01	0.00001	0.03	1
TS22_WT4	0.030	0.10	0.0080	0.0109	5.9			-0.0029	0.00001	0.00001	0.01			1
TS22_WT4	0.100	0.30	0.0110	0.0104	6.0	0.0039	177.3	-0.0032	0.00007	0.00007	0.06	0.00002	1.43	1
TS22_WT4	0.300	1.00	0.0144	0.0068	3.9	0.0098	28.5	-0.0023	0.00028	0.00022	0.30	0.00015	0.38	1
TS22_WT4	1.000	3.00	0.0137	0.0074	8.2	0.0074	58.8	-0.0011	0.00007	0.00006	0.16	0.00006	0.40	1
TS22_WT4	3.000	10.00	0.0149	0.0086	8.8	0.0066	71.2	-0.0003	0.00013	0.00012	0.64	0.00009	0.94	1
TS22_WT4	10.000	30.00	0.0162	0.0101	9.9	0.0067	76.4	-0.0007	0.00049	0.00045	9.83	0.00036	4.05	1
TS22_WT4	30.000	100.00	0.0181	0.0117	10.3	0.0100	86.9	-0.0037	0.00120	0.00106	2.12	0.00076	6.68	1
TS23_WT4	0.003	0.01	0.0069	0.0082	2.1	0.0032	20.8	-0.0045	0.00005	0.00004	0.03	0.00004	0.35	1
TS23_WT4	0.010	0.03	0.0093	0.0107	2.9	0.0041	44.3	-0.0055	0.00005	0.00004	0.02	0.00002	0.36	1
TS23_WT4	0.003	0.01	0.0063	0.0073	2.2	0.0050	15.9	-0.0059	0.00010	0.00008	0.08	0.00011	0.36	1
TS23_WT4	0.010	0.03	0.0098	0.0104	2.9	0.0048	25.8	-0.0054	0.00009	0.00007	0.05	0.00007	0.40	1