van Peer, Tim E; Liebrand, Diederik; Xuan, Chuang; Lippert, Peter C; Agnini, Claudia; Blum, Nevin; Blum, Peter; Bohaty, Steven M; Bown, Paul R; Greenop, Rosanna; Kordesch, Wendy E C; Leonhardt, Dominik; Friedrich, Oliver; Wilson, Paul A (2017): (Table 03) Revised splice interval from different holes of IODP Site 342-U1406 [dataset]. PANGAEA, https://doi.org/10.1594/PANGAEA.872546, In supplement to: van Peer, TE et al. (2017): Data report: revised composite depth scale and splice for IODP Site U1406. In: Proceedings of the IODP, Integrated Ocean Drilling Program, https://doi.org/10.2204/iodp.proc.342.202.2017
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Further details:
Norris, Richard D; Wilson, Paul A; Blum, Peter; Fehr, Annick; Agnini, Claudia; Bornemann, André; Boulila, Slah; Bown, Paul R; Cournède, Cécile; Friedrich, Oliver; Ghosh, Swapan K; Hollis, Christopher J; Hull, Pincelli M; Jo, K; Junium, C K; Kaneko, Masanori; Liebrand, Diederik; Lippert, Peter C; Liu, Zhiqiang; Matsui, Hiroyuki; Moriya, Kazuyoshi; Nishi, Hiroshi; Opdyke, Bradley N; Penman, Donald E; Romans, Kristen; Scher, Howie D; Sexton, Philip F; Takagi, H; Turner, S K; Whiteside, J H; Yamaguchi, T; Yamamoto, Yuhji (2014): Background and objectives from IODP Site 342-U1406. In: Proceedings of the IODP, Integrated Ocean Drilling Program, https://doi.org/10.2204/iodp.proc.342.107.2014
Project(s):
Coverage:
Latitude: 40.349930 * Longitude: -51.649830
Minimum DEPTH, sediment/rock: 0.00 m * Maximum DEPTH, sediment/rock: 281.05 m
Event(s):
342-U1406 * Latitude: 40.349930 * Longitude: -51.649830 * Elevation: -3813.8 m * Campaign: Exp342 (Paleogene Newfoundland Sediment Drifts) * Basis: Joides Resolution * Method/Device: Drilling/drill rig (DRILL)
Parameter(s):
| # | Name | Short Name | Unit | Principal Investigator | Method/Device | Comment |
|---|---|---|---|---|---|---|
| 1 | Number | No | van Peer, Tim E | |||
| 2 | Sample code/label | Sample label | van Peer, Tim E | |||
| 3 | DEPTH, sediment/rock | Depth sed | m | van Peer, Tim E | IODP Depth Scale Terminology | Geocode – Top, depth CSF-A |
| 4 | Depth, composite revised | Depth comp r | rmcd | van Peer, Tim E | IODP Depth Scale Terminology | Top, depth revised CCSF-A |
| 5 | Sample code/label | Sample label | van Peer, Tim E | |||
| 6 | DEPTH, sediment/rock | Depth sed | m | van Peer, Tim E | IODP Depth Scale Terminology | Geocode – Base, depth CSF-A |
| 7 | Depth, composite revised | Depth comp r | rmcd | van Peer, Tim E | IODP Depth Scale Terminology | Base, depth revised CCSF-A |
| 8 | Sample method | Sample method | van Peer, Tim E | |||
| 9 | Comment | Comment | van Peer, Tim E |
License:
Creative Commons Attribution 3.0 Unported (CC-BY-3.0)
Size:
428 data points