/* DATA DESCRIPTION: Citation: Elling, Felix J; Spiegel, Cornelia; Estrada, Solveig (2016): Chemical composition of Basilika Formation (Bjørndalen area) and Mount Lawson Formation bentonites (<2 µm fractions) [dataset]. PANGAEA, https://doi.org/10.1594/PANGAEA.860771, In supplement to: Elling, Felix J; Spiegel, Cornelia; Estrada, Solveig; Davis, Donald W; Reinhardt, Lutz; Henjes-Kunst, Friedhelm; Allroggen, Niklas; Dohrmann, Reiner; Piepjohn, Karsten; Lisker, Frank (2016): Origin of Bentonites and Detrital Zircons of the Paleocene Basilika Formation, Svalbard. Frontiers in Earth Science, 4:73, https://doi.org/10.3389/feart.2016.00073 Project(s): Center for Marine Environmental Sciences (MARUM) (URI: https://www.marum.de/en/) Geosciences, University of Bremen (GeoB) (URI: https://www.geo.uni-bremen.de/page.php?langid=EN) Coverage: MEDIAN LATITUDE: 78.083619 * MEDIAN LONGITUDE: -12.431056 * SOUTH-BOUND LATITUDE: 77.806833 * WEST-BOUND LONGITUDE: -81.763611 * NORTH-BOUND LATITUDE: 78.188944 * EAST-BOUND LONGITUDE: 15.286639 Event(s): Ellesmere_Island_Lawson_ash1 * LATITUDE: 77.840056 * LONGITUDE: -81.684361 * LOCATION: Ellesmere Island * METHOD/DEVICE: Geological sample (GEOS) * COMMENT: Ellesmere Island, Split Lake, Mount Lawson Formation Ellesmere_Island_Lawson_ash2 * LATITUDE: 77.806833 * LONGITUDE: -81.763611 * LOCATION: Ellesmere Island * METHOD/DEVICE: Geological sample (GEOS) * COMMENT: Ellesmere Island, Split Lake, Mount Lawson Formation Svalbard_H1 * LATITUDE: 78.188944 * LONGITUDE: 15.286639 * LOCATION: Svalbard, Norway * METHOD/DEVICE: Geological sample (GEOS) * COMMENT: Svalbard, Bjorndalen, Basilika Formation Svalbard_H2 * LATITUDE: 78.188944 * LONGITUDE: 15.286639 * LOCATION: Svalbard, Norway * METHOD/DEVICE: Geological sample (GEOS) * COMMENT: Svalbard, Bjorndalen, Basilika Formation Svalbard_H3 * LATITUDE: 78.182722 * LONGITUDE: 15.284194 * LOCATION: Svalbard, Norway * METHOD/DEVICE: Geological sample (GEOS) * COMMENT: Svalbard, Bjorndalen, Basilika Formation Svalbard_H3b * LATITUDE: 78.188917 * LONGITUDE: 15.286556 * LOCATION: Svalbard, Norway * METHOD/DEVICE: Geological sample (GEOS) * COMMENT: Svalbard, Bjorndalen, Basilika Formation Svalbard_H4 * LATITUDE: 78.188917 * LONGITUDE: 15.286556 * LOCATION: Svalbard, Norway * METHOD/DEVICE: Geological sample (GEOS) * COMMENT: Svalbard, Bjorndalen, Basilika Formation Parameter(s): Event label (Event) * PI: Elling, Felix J (https://orcid.org/0000-0003-0405-4033, felling@leibniz.uni-kiel.de) Latitude of event (Latitude) * PI: Elling, Felix J (https://orcid.org/0000-0003-0405-4033, felling@leibniz.uni-kiel.de) Longitude of event (Longitude) * PI: Elling, Felix J (https://orcid.org/0000-0003-0405-4033, felling@leibniz.uni-kiel.de) Horizon (Horizon) * PI: Elling, Felix J (https://orcid.org/0000-0003-0405-4033, felling@leibniz.uni-kiel.de) Sample code/label (Sample label) * PI: Elling, Felix J (https://orcid.org/0000-0003-0405-4033, felling@leibniz.uni-kiel.de) Comment (Comment) * PI: Elling, Felix J (https://orcid.org/0000-0003-0405-4033, felling@leibniz.uni-kiel.de) Silicon dioxide [%] (SiO2) * PI: Elling, Felix J (https://orcid.org/0000-0003-0405-4033, felling@leibniz.uni-kiel.de) * METHOD/DEVICE: X-ray fluorescence (XRF) Titanium dioxide [%] (TiO2) * PI: Elling, Felix J (https://orcid.org/0000-0003-0405-4033, felling@leibniz.uni-kiel.de) * METHOD/DEVICE: X-ray fluorescence (XRF) Aluminium oxide [%] (Al2O3) * PI: Elling, Felix J (https://orcid.org/0000-0003-0405-4033, felling@leibniz.uni-kiel.de) * METHOD/DEVICE: X-ray fluorescence (XRF) Iron oxide, Fe2O3 [%] (Fe2O3) * PI: Elling, Felix J (https://orcid.org/0000-0003-0405-4033, felling@leibniz.uni-kiel.de) * METHOD/DEVICE: X-ray fluorescence (XRF) * COMMENT: total Manganese oxide [%] (MnO) * PI: Elling, Felix J (https://orcid.org/0000-0003-0405-4033, felling@leibniz.uni-kiel.de) * METHOD/DEVICE: X-ray fluorescence (XRF) Magnesium oxide [%] (MgO) * PI: Elling, Felix J (https://orcid.org/0000-0003-0405-4033, felling@leibniz.uni-kiel.de) * METHOD/DEVICE: X-ray fluorescence (XRF) Calcium oxide [%] (CaO) * PI: Elling, Felix J (https://orcid.org/0000-0003-0405-4033, felling@leibniz.uni-kiel.de) * METHOD/DEVICE: X-ray fluorescence (XRF) Sodium oxide [%] (Na2O) * PI: Elling, Felix J (https://orcid.org/0000-0003-0405-4033, felling@leibniz.uni-kiel.de) * METHOD/DEVICE: X-ray fluorescence (XRF) Potassium oxide [%] (K2O) * PI: Elling, Felix J (https://orcid.org/0000-0003-0405-4033, felling@leibniz.uni-kiel.de) * METHOD/DEVICE: X-ray fluorescence (XRF) Phosphorus pentoxide [%] (P2O5) * PI: Elling, Felix J (https://orcid.org/0000-0003-0405-4033, felling@leibniz.uni-kiel.de) * METHOD/DEVICE: X-ray fluorescence (XRF) Sulfur trioxide [%] (SO3) * PI: Elling, Felix J (https://orcid.org/0000-0003-0405-4033, felling@leibniz.uni-kiel.de) * METHOD/DEVICE: X-ray fluorescence (XRF) Chlorine [%] (Cl) * PI: Elling, Felix J (https://orcid.org/0000-0003-0405-4033, felling@leibniz.uni-kiel.de) * METHOD/DEVICE: X-ray fluorescence (XRF) Fluorine [%] (F) * PI: Elling, Felix J (https://orcid.org/0000-0003-0405-4033, felling@leibniz.uni-kiel.de) * METHOD/DEVICE: X-ray fluorescence (XRF) Loss on ignition [%] (LOI) * PI: Elling, Felix J (https://orcid.org/0000-0003-0405-4033, felling@leibniz.uni-kiel.de) * METHOD/DEVICE: X-ray fluorescence (XRF) Sum [%] (Sum) * PI: Elling, Felix J (https://orcid.org/0000-0003-0405-4033, felling@leibniz.uni-kiel.de) * METHOD/DEVICE: X-ray fluorescence (XRF) Comment (Comment) * PI: Elling, Felix J (https://orcid.org/0000-0003-0405-4033, felling@leibniz.uni-kiel.de) Barium [mg/kg] (Ba) * PI: Elling, Felix J (https://orcid.org/0000-0003-0405-4033, felling@leibniz.uni-kiel.de) * METHOD/DEVICE: X-ray fluorescence (XRF) Cobalt [mg/kg] (Co) * PI: Elling, Felix J (https://orcid.org/0000-0003-0405-4033, felling@leibniz.uni-kiel.de) * METHOD/DEVICE: X-ray fluorescence (XRF) Chromium [mg/kg] (Cr) * PI: Elling, Felix J (https://orcid.org/0000-0003-0405-4033, felling@leibniz.uni-kiel.de) * METHOD/DEVICE: X-ray fluorescence (XRF) Copper [mg/kg] (Cu) * PI: Elling, Felix J (https://orcid.org/0000-0003-0405-4033, felling@leibniz.uni-kiel.de) * METHOD/DEVICE: X-ray fluorescence (XRF) Nickel [mg/kg] (Ni) * PI: Elling, Felix J (https://orcid.org/0000-0003-0405-4033, felling@leibniz.uni-kiel.de) * METHOD/DEVICE: X-ray fluorescence (XRF) Rubidium [mg/kg] (Rb) * PI: Elling, Felix J (https://orcid.org/0000-0003-0405-4033, felling@leibniz.uni-kiel.de) * METHOD/DEVICE: X-ray fluorescence (XRF) Scandium [mg/kg] (Sc) * PI: Elling, Felix J (https://orcid.org/0000-0003-0405-4033, felling@leibniz.uni-kiel.de) * METHOD/DEVICE: X-ray fluorescence (XRF) Strontium [mg/kg] (Sr) * PI: Elling, Felix J (https://orcid.org/0000-0003-0405-4033, felling@leibniz.uni-kiel.de) * METHOD/DEVICE: X-ray fluorescence (XRF) Vanadium [mg/kg] (V) * PI: Elling, Felix J (https://orcid.org/0000-0003-0405-4033, felling@leibniz.uni-kiel.de) * METHOD/DEVICE: X-ray fluorescence (XRF) Yttrium [mg/kg] (Y) * PI: Elling, Felix J (https://orcid.org/0000-0003-0405-4033, felling@leibniz.uni-kiel.de) * METHOD/DEVICE: X-ray fluorescence (XRF) Zinc [mg/kg] (Zn) * PI: Elling, Felix J (https://orcid.org/0000-0003-0405-4033, felling@leibniz.uni-kiel.de) * METHOD/DEVICE: X-ray fluorescence (XRF) Zirconium [mg/kg] (Zr) * PI: Elling, Felix J (https://orcid.org/0000-0003-0405-4033, felling@leibniz.uni-kiel.de) * METHOD/DEVICE: X-ray fluorescence (XRF) Comment (Comment) * PI: Elling, Felix J (https://orcid.org/0000-0003-0405-4033, felling@leibniz.uni-kiel.de) Silver [mg/kg] (Ag) * PI: Elling, Felix J (https://orcid.org/0000-0003-0405-4033, felling@leibniz.uni-kiel.de) * METHOD/DEVICE: Inductively coupled plasma - mass spectrometry (ICP-MS) Arsenic [mg/kg] (As) * PI: Elling, Felix J (https://orcid.org/0000-0003-0405-4033, felling@leibniz.uni-kiel.de) * METHOD/DEVICE: Inductively coupled plasma - mass spectrometry (ICP-MS) Beryllium [mg/kg] (Be) * PI: Elling, Felix J (https://orcid.org/0000-0003-0405-4033, felling@leibniz.uni-kiel.de) * METHOD/DEVICE: Inductively coupled plasma - mass spectrometry (ICP-MS) Bismuth [mg/kg] (Bi) * PI: Elling, Felix J (https://orcid.org/0000-0003-0405-4033, felling@leibniz.uni-kiel.de) * METHOD/DEVICE: Inductively coupled plasma - mass spectrometry (ICP-MS) Cadmium [mg/kg] (Cd) * PI: Elling, Felix J (https://orcid.org/0000-0003-0405-4033, felling@leibniz.uni-kiel.de) * METHOD/DEVICE: Inductively coupled plasma - mass spectrometry (ICP-MS) Caesium [mg/kg] (Cs) * PI: Elling, Felix J (https://orcid.org/0000-0003-0405-4033, felling@leibniz.uni-kiel.de) * METHOD/DEVICE: Inductively coupled plasma - mass spectrometry (ICP-MS) Gallium [mg/kg] (Ga) * PI: Elling, Felix J (https://orcid.org/0000-0003-0405-4033, felling@leibniz.uni-kiel.de) * METHOD/DEVICE: Inductively coupled plasma - mass spectrometry (ICP-MS) Hafnium [mg/kg] (Hf) * PI: Elling, Felix J (https://orcid.org/0000-0003-0405-4033, felling@leibniz.uni-kiel.de) * METHOD/DEVICE: Inductively coupled plasma - mass spectrometry (ICP-MS) Lithium [mg/kg] (Li) * PI: Elling, Felix J (https://orcid.org/0000-0003-0405-4033, felling@leibniz.uni-kiel.de) * METHOD/DEVICE: Inductively coupled plasma - mass spectrometry (ICP-MS) Molybdenum [mg/kg] (Mo) * PI: Elling, Felix J (https://orcid.org/0000-0003-0405-4033, felling@leibniz.uni-kiel.de) * METHOD/DEVICE: Inductively coupled plasma - mass spectrometry (ICP-MS) Niobium [mg/kg] (Nb) * PI: Elling, Felix J (https://orcid.org/0000-0003-0405-4033, felling@leibniz.uni-kiel.de) * METHOD/DEVICE: Inductively coupled plasma - mass spectrometry (ICP-MS) Lead [mg/kg] (Pb) * PI: Elling, Felix J (https://orcid.org/0000-0003-0405-4033, felling@leibniz.uni-kiel.de) * METHOD/DEVICE: Inductively coupled plasma - mass spectrometry (ICP-MS) Antimony [mg/kg] (Sb) * PI: Elling, Felix J (https://orcid.org/0000-0003-0405-4033, felling@leibniz.uni-kiel.de) * METHOD/DEVICE: Inductively coupled plasma - mass spectrometry (ICP-MS) Selenium [mg/kg] (Se) * PI: Elling, Felix J (https://orcid.org/0000-0003-0405-4033, felling@leibniz.uni-kiel.de) * METHOD/DEVICE: Inductively coupled plasma - mass spectrometry (ICP-MS) Tin [mg/kg] (Sn) * PI: Elling, Felix J (https://orcid.org/0000-0003-0405-4033, felling@leibniz.uni-kiel.de) * METHOD/DEVICE: Inductively coupled plasma - mass spectrometry (ICP-MS) Tantalum [mg/kg] (Ta) * PI: Elling, Felix J (https://orcid.org/0000-0003-0405-4033, felling@leibniz.uni-kiel.de) * METHOD/DEVICE: Inductively coupled plasma - mass spectrometry (ICP-MS) Tellurium [mg/kg] (Te) * PI: Elling, Felix J (https://orcid.org/0000-0003-0405-4033, felling@leibniz.uni-kiel.de) * METHOD/DEVICE: Inductively coupled plasma - mass spectrometry (ICP-MS) Thorium [mg/kg] (Th) * PI: Elling, Felix J (https://orcid.org/0000-0003-0405-4033, felling@leibniz.uni-kiel.de) * METHOD/DEVICE: Inductively coupled plasma - mass spectrometry (ICP-MS) Thallium [mg/kg] (Tl) * PI: Elling, Felix J (https://orcid.org/0000-0003-0405-4033, felling@leibniz.uni-kiel.de) * METHOD/DEVICE: Inductively coupled plasma - mass spectrometry (ICP-MS) Uranium [mg/kg] (U) * PI: Elling, Felix J (https://orcid.org/0000-0003-0405-4033, felling@leibniz.uni-kiel.de) * METHOD/DEVICE: Inductively coupled plasma - mass spectrometry (ICP-MS) Tungsten [mg/kg] (W) * PI: Elling, Felix J (https://orcid.org/0000-0003-0405-4033, felling@leibniz.uni-kiel.de) * METHOD/DEVICE: Inductively coupled plasma - mass spectrometry (ICP-MS) Lanthanum [mg/kg] (La) * PI: Elling, Felix J (https://orcid.org/0000-0003-0405-4033, felling@leibniz.uni-kiel.de) * METHOD/DEVICE: Inductively coupled plasma - mass spectrometry (ICP-MS) Cerium [mg/kg] (Ce) * PI: Elling, Felix J (https://orcid.org/0000-0003-0405-4033, felling@leibniz.uni-kiel.de) * METHOD/DEVICE: Inductively coupled plasma - mass spectrometry (ICP-MS) Praseodymium [mg/kg] (Pr) * PI: Elling, Felix J (https://orcid.org/0000-0003-0405-4033, felling@leibniz.uni-kiel.de) * METHOD/DEVICE: Inductively coupled plasma - mass spectrometry (ICP-MS) Neodymium [mg/kg] (Nd) * PI: Elling, Felix J (https://orcid.org/0000-0003-0405-4033, felling@leibniz.uni-kiel.de) * METHOD/DEVICE: Inductively coupled plasma - mass spectrometry (ICP-MS) Samarium [mg/kg] (Sm) * PI: Elling, Felix J (https://orcid.org/0000-0003-0405-4033, felling@leibniz.uni-kiel.de) * METHOD/DEVICE: Inductively coupled plasma - mass spectrometry (ICP-MS) Europium [mg/kg] (Eu) * PI: Elling, Felix J (https://orcid.org/0000-0003-0405-4033, felling@leibniz.uni-kiel.de) * METHOD/DEVICE: Inductively coupled plasma - mass spectrometry (ICP-MS) Gadolinium [mg/kg] (Gd) * PI: Elling, Felix J (https://orcid.org/0000-0003-0405-4033, felling@leibniz.uni-kiel.de) * METHOD/DEVICE: Inductively coupled plasma - mass spectrometry (ICP-MS) Terbium [mg/kg] (Tb) * PI: Elling, Felix J (https://orcid.org/0000-0003-0405-4033, felling@leibniz.uni-kiel.de) * METHOD/DEVICE: Inductively coupled plasma - mass spectrometry (ICP-MS) Dysprosium [mg/kg] (Dy) * PI: Elling, Felix J (https://orcid.org/0000-0003-0405-4033, felling@leibniz.uni-kiel.de) * METHOD/DEVICE: Inductively coupled plasma - mass spectrometry (ICP-MS) Holmium [mg/kg] (Ho) * PI: Elling, Felix J (https://orcid.org/0000-0003-0405-4033, felling@leibniz.uni-kiel.de) * METHOD/DEVICE: Inductively coupled plasma - mass spectrometry (ICP-MS) Erbium [mg/kg] (Er) * PI: Elling, Felix J (https://orcid.org/0000-0003-0405-4033, felling@leibniz.uni-kiel.de) * METHOD/DEVICE: Inductively coupled plasma - mass spectrometry (ICP-MS) Thulium [mg/kg] (Tm) * PI: Elling, Felix J (https://orcid.org/0000-0003-0405-4033, felling@leibniz.uni-kiel.de) * METHOD/DEVICE: Inductively coupled plasma - mass spectrometry (ICP-MS) Ytterbium [mg/kg] (Yb) * PI: Elling, Felix J (https://orcid.org/0000-0003-0405-4033, felling@leibniz.uni-kiel.de) * METHOD/DEVICE: Inductively coupled plasma - mass spectrometry (ICP-MS) Lutetium [mg/kg] (Lu) * PI: Elling, Felix J (https://orcid.org/0000-0003-0405-4033, felling@leibniz.uni-kiel.de) * METHOD/DEVICE: Inductively coupled plasma - mass spectrometry (ICP-MS) License: Creative Commons Attribution 3.0 Unported (CC-BY-3.0) (URI: https://creativecommons.org/licenses/by/3.0/) Size: 536 data points */ Event Latitude Longitude Horizon Sample label Comment SiO2 [%] (X-ray fluorescence (XRF)) TiO2 [%] (X-ray fluorescence (XRF)) Al2O3 [%] (X-ray fluorescence (XRF)) Fe2O3 [%] (total, X-ray fluorescence (XRF)) MnO [%] (X-ray fluorescence (XRF)) MgO [%] (X-ray fluorescence (XRF)) CaO [%] (X-ray fluorescence (XRF)) Na2O [%] (X-ray fluorescence (XRF)) K2O [%] (X-ray fluorescence (XRF)) P2O5 [%] (X-ray fluorescence (XRF)) SO3 [%] (X-ray fluorescence (XRF)) Cl [%] (X-ray fluorescence (XRF)) F [%] (X-ray fluorescence (XRF)) LOI [%] (X-ray fluorescence (XRF)) Sum [%] (X-ray fluorescence (XRF)) Comment Ba [mg/kg] (X-ray fluorescence (XRF)) Co [mg/kg] (X-ray fluorescence (XRF)) Cr [mg/kg] (X-ray fluorescence (XRF)) Cu [mg/kg] (X-ray fluorescence (XRF)) Ni [mg/kg] (X-ray fluorescence (XRF)) Rb [mg/kg] (X-ray fluorescence (XRF)) Sc [mg/kg] (X-ray fluorescence (XRF)) Sr [mg/kg] (X-ray fluorescence (XRF)) V [mg/kg] (X-ray fluorescence (XRF)) Y [mg/kg] (X-ray fluorescence (XRF)) Zn [mg/kg] (X-ray fluorescence (XRF)) Zr [mg/kg] (X-ray fluorescence (XRF)) Comment Ag [mg/kg] (Inductively coupled plasma - ...) As [mg/kg] (Inductively coupled plasma - ...) Be [mg/kg] (Inductively coupled plasma - ...) Bi [mg/kg] (Inductively coupled plasma - ...) Cd [mg/kg] (Inductively coupled plasma - ...) Cs [mg/kg] (Inductively coupled plasma - ...) Ga [mg/kg] (Inductively coupled plasma - ...) Hf [mg/kg] (Inductively coupled plasma - ...) Li [mg/kg] (Inductively coupled plasma - ...) Mo [mg/kg] (Inductively coupled plasma - ...) Nb [mg/kg] (Inductively coupled plasma - ...) Pb [mg/kg] (Inductively coupled plasma - ...) Sb [mg/kg] (Inductively coupled plasma - ...) Se [mg/kg] (Inductively coupled plasma - ...) Sn [mg/kg] (Inductively coupled plasma - ...) Ta [mg/kg] (Inductively coupled plasma - ...) Te [mg/kg] (Inductively coupled plasma - ...) Th [mg/kg] (Inductively coupled plasma - ...) Tl [mg/kg] (Inductively coupled plasma - ...) U [mg/kg] (Inductively coupled plasma - ...) W [mg/kg] (Inductively coupled plasma - ...) La [mg/kg] (Inductively coupled plasma - ...) Ce [mg/kg] (Inductively coupled plasma - ...) Pr [mg/kg] (Inductively coupled plasma - ...) Nd [mg/kg] (Inductively coupled plasma - ...) Sm [mg/kg] (Inductively coupled plasma - ...) Eu [mg/kg] (Inductively coupled plasma - ...) Gd [mg/kg] (Inductively coupled plasma - ...) Tb [mg/kg] (Inductively coupled plasma - ...) Dy [mg/kg] (Inductively coupled plasma - ...) Ho [mg/kg] (Inductively coupled plasma - ...) Er [mg/kg] (Inductively coupled plasma - ...) Tm [mg/kg] (Inductively coupled plasma - ...) Yb [mg/kg] (Inductively coupled plasma - ...) Lu [mg/kg] (Inductively coupled plasma - ...) Svalbard_H1 78.1889 15.2866 H1 8a Major elements (XRF, wt%) 47.03 4.680 20.22 9.51 0.019 1.50 0.363 0.38 2.572 0.395 0.03 <0.002 <0.05 12.80 99.43 Trace elements (XRF, ppm) 1449 14 118 155 30 112 41 211 470 56 128 512 Trace elements (ICP-MS, ppm) 0.5 24.0 97 1.69 0.28 0.20 7.2 27.8 15 32.8 3.9 75 26 2.1 5.4 5.1 0.20 25 0.27 7.79 2.9 72.4 169.3 21.6 88.6 17.5 4.7 14.7 2.1 11.3 2.0 5.5 0.7 4.4 0.6 Svalbard_H2 78.1889 15.2866 H2 7a Major elements (XRF, wt%) 47.18 4.528 19.77 11.21 0.053 1.47 0.129 0.85 2.504 0.386 <0.01 <0.002 <0.05 11.49 99.50 Trace elements (XRF, ppm) 876 38 91 177 24 110 34 159 452 50 106 512 Trace elements (ICP-MS, ppm) 0.5 34.2 87 1.91 0.29 0.14 6.9 27.9 14 32.3 3.1 75 26 1.6 5.4 4.7 0.16 22 0.28 5.49 2.5 56.2 128.0 15.0 58.2 11.1 3.0 9.5 1.5 8.7 1.6 4.5 0.6 3.7 0.5 Svalbard_H3 78.1827 15.2842 H3 5a Major elements (XRF, wt%) 45.27 1.180 22.91 11.18 0.025 1.32 0.154 0.50 3.330 0.220 0.02 0.004 <0.05 13.10 99.16 Trace elements (XRF, ppm) 402 8 62 69 21 135 20 135 263 151 209 2398 Trace elements (ICP-MS, ppm) 1.2 32.3 151 2.19 0.32 0.11 8.0 32.1 65 40.8 3.9 135 38 6.1 14.1 23.1 0.22 92 0.31 10.76 1.8 263.6 605.6 67.7 235.6 39.2 8.1 31.6 4.9 27.3 4.9 13.3 1.7 10.5 1.5 Svalbard_H3b 78.1889 15.2866 H3b 5c Major elements (XRF, wt%) 46.34 1.181 22.59 10.94 0.222 1.33 0.126 0.51 3.387 0.214 0.01 0.003 <0.05 12.38 99.23 Trace elements (XRF, ppm) 868 31 77 40 66 140 22 129 318 156 283 2000 Trace elements (ICP-MS, ppm) 0.9 26.4 151 2.57 0.37 0.32 8.5 29.7 56 45.7 2.3 95 31 1.1 12.5 19.9 0.20 85 0.32 8.71 1.5 209.9 493.3 55.1 193.9 33.8 7.3 29.7 4.7 26.5 4.9 13.0 1.7 10.3 1.5 Svalbard_H4 78.1889 15.2866 H4 6a Major elements (XRF, wt%) 47.38 1.123 22.89 10.55 0.086 1.42 0.156 0.58 3.486 0.202 <0.01 <0.002 <0.05 11.54 99.37 Trace elements (XRF, ppm) 599 18 91 47 48 144 19 116 341 98 237 1261 Trace elements (ICP-MS, ppm) 0.9 19.4 144 2.74 0.41 0.21 8.6 31.6 32 53.6 2.6 103 27 1.1 8.7 12.6 0.17 54 0.35 8.52 1.4 175.4 387.1 44.4 154.4 26.2 4.7 20.9 3.2 17.6 3.2 8.8 1.2 7.4 1.1 Svalbard_H4 78.1889 15.2866 H4 10 Major elements (XRF, wt%) 46.78 1.101 23.34 9.43 0.024 1.41 0.241 0.39 3.324 0.176 0.01 0.002 <0.05 12.90 99.16 Trace elements (XRF, ppm) 2143 6 66 38 28 134 23 232 240 112 249 1682 Trace elements (ICP-MS, ppm) 1.1 27.3 138 2.42 0.25 0.17 8.7 31.9 45 51.4 2.7 142 25 1.1 10.7 17.0 0.13 68 0.34 9.42 1.1 210.2 467.5 53.6 188.4 31.0 5.5 24.0 3.6 20.4 3.7 10.2 1.4 8.4 1.2 Ellesmere_Island_Lawson_ash1 77.8401 -81.6844 Lawson ash 1 LR 008/08 Major elements (XRF, wt%) 52.91 1.521 14.86 6.92 0.082 4.54 1.146 2.54 2.734 0.446 0.06 <0.002 <0.05 11.71 99.48 Trace elements (XRF, ppm) 464 35 60 190 149 105 20 404 91 63 225 597 Trace elements (ICP-MS, ppm) 0.8 5.3 55 4.07 0.55 0.20 1.7 33.0 26 35.8 1.4 105 37 0.6 8.8 13.1 0.06 50 0.07 9.19 1.7 231.0 493.2 57.6 197.4 32.3 6.7 22.1 2.8 14.3 2.3 5.5 0.7 3.7 0.5 Ellesmere_Island_Lawson_ash2 77.8068 -81.7636 Lawson ash 2 LR 002/08 Major elements (XRF, wt%) 50.81 3.272 16.10 8.94 0.018 3.94 1.678 1.65 0.547 0.118 0.04 0.003 <0.05 12.49 99.61 Trace elements (XRF, ppm) 210 77 183 732 141 27 47 126 370 33 256 113 Trace elements (ICP-MS, ppm) 0.2 1.9 33 0.62 0.13 0.45 0.5 12.7 7 17.6 2.1 15 10 0.2 3.9 1.4 0.20 3 0.04 2.70 6.9 25.0 55.8 6.6 28.5 6.8 2.0 6.8 1.0 5.8 1.1 2.7 0.3 1.9 0.3