Dekov, Vesselin M; Rouxel, Olivier J; Asael, Dan; Hålenius, Ulf; Munnik, Kate (2016): (Table 2) Composition of native Cu occurrences from two samples of DSDP Hole 22-216 and 92-597C [dataset]. PANGAEA, https://doi.org/10.1594/PANGAEA.858087, In supplement to: Dekov, VM et al. (2013): Native Cu from the oceanic crust: Isotopic insights into native metal origin. Chemical Geology, 359, 136-149, https://doi.org/10.1016/j.chemgeo.2013.10.001
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Project(s):
Deep Sea Drilling Project (DSDP)
Coverage:
Median Latitude: -8.672500 * Median Longitude: 160.218850 * South-bound Latitude: -18.807200 * West-bound Longitude: 90.208000 * North-bound Latitude: 1.462200 * East-bound Longitude: -129.770300
Date/Time Start: 1972-02-18T00:00:00 * Date/Time End: 1983-03-02T00:00:00
Minimum Elevation: -4164.0 m * Maximum Elevation: -2237.0 m
Event(s):
22-216 * Latitude: 1.462200 * Longitude: 90.208000 * Date/Time: 1972-02-18T00:00:00 * Elevation: -2237.0 m * Penetration: 477.5 m * Recovery: 169.2 m * Location: Indian Ocean//RIDGE * Campaign: Leg22 * Basis: Glomar Challenger * Method/Device: Drilling/drill rig (DRILL) * Comment: 38 cores; 353 m cored; 0 m drilled; 47.9 % recovery
92-597C * Latitude: -18.807200 * Longitude: -129.770300 * Date/Time: 1983-03-02T00:00:00 * Elevation: -4164.0 m * Penetration: 143.5 m * Recovery: 55.2 m * Location: South Pacific * Campaign: Leg92 * Basis: Glomar Challenger * Method/Device: Drilling/drill rig (DRILL) * Comment: 11 cores; 97 m cored; 3 m drilled; 56.9 % recovery
Comment:
Average concentrations for point measurements under the assumption that the Cu**0 particles are homogeneous in depth and themain additional elements in the surface films are O and Cl (see the RBS data). It should be noted that the samples are inhomogeneous and therefore these results contain systematic deviations
Parameter(s):
| # | Name | Short Name | Unit | Principal Investigator | Method/Device | Comment |
|---|---|---|---|---|---|---|
| 1 | Event label | Event | Dekov, Vesselin M | |||
| 2 | Sample code/label | Sample label | Dekov, Vesselin M | DSDP/ODP/IODP sample designation | ||
| 3 | Number | No | Dekov, Vesselin M | of analyis | ||
| 4 | Copper | Cu | % | Dekov, Vesselin M | PIXE, Particle induced x-ray emission | |
| 5 | Oxygen | O | % | Dekov, Vesselin M | PIXE, Particle induced x-ray emission | Calculated from concentrations of the other elements assuming they are present in their oxidized form and using their stoichiometric relations with O. The assumption of oxidized states is justified by the simultaneous RBS measurements that show presence of O in the outer ~10 µm-film of the samples. |
| 6 | Chlorine | Cl | % | Dekov, Vesselin M | PIXE, Particle induced x-ray emission | |
| 7 | Iron | Fe | % | Dekov, Vesselin M | PIXE, Particle induced x-ray emission | |
| 8 | Silicon | Si | % | Dekov, Vesselin M | PIXE, Particle induced x-ray emission | |
| 9 | Calcium | Ca | % | Dekov, Vesselin M | PIXE, Particle induced x-ray emission | |
| 10 | Arsenic | As | mg/kg | Dekov, Vesselin M | PIXE, Particle induced x-ray emission | |
| 11 | Potassium | K | mg/kg | Dekov, Vesselin M | PIXE, Particle induced x-ray emission | |
| 12 | Manganese | Mn | mg/kg | Dekov, Vesselin M | PIXE, Particle induced x-ray emission |
License:
Creative Commons Attribution 3.0 Unported (CC-BY-3.0)
Size:
31 data points
Data
| 1 Event | 2 Sample label | 3 No | 4 Cu [%] | 5 O [%] | 6 Cl [%] | 7 Fe [%] | 8 Si [%] | 9 Ca [%] | 10 As [mg/kg] | 11 K [mg/kg] | 12 Mn [mg/kg] |
|---|---|---|---|---|---|---|---|---|---|---|---|
| 22-216 | 22-216-37-4,114-117 | 1 | 80.7 | 10.30 | 8.93 | 0.10 | |||||
| 22-216 | 22-216-37-4,114-117 | 2 | 87.7 | 11.20 | 0.79 | 0.29 | |||||
| 92-597C | 92-597C-4-2D,60-65 | 1 | 73.4 | 9.59 | 16.30 | 0.44 | 0.18 | 856 | |||
| 92-597C | 92-597C-4-2D,60-65 | 2 | 74.5 | 11.70 | 10.00 | 2.28 | 1.25 | 0.17 | 522 | 395 | 222 |