Hirose, Takehiro; Saffer, Demian M; Tobin, Harold J; Toczko, Sean; Maeda, Lena; Kubo, Yusuke; Kimura, Gaku; Moore, Gregory F; Underwood, Michael B; Kanagawa, Kyuichi; Expedition 348 Scientists (2015): Electrical conductivity form IODP Hole 348-C0002M [dataset]. PANGAEA, https://doi.org/10.1594/PANGAEA.843399
Always quote citation above when using data! You can download the citation in several formats below.
Related to:
Hirose, Takehiro; Saffer, Demian M; Tobin, Harold J; Toczko, Sean; Maeda, Lena; Kubo, Yusuke (2013): NanTroSEIZE Stage 3: NanTroSEIZE plate boundary deep riser 3. IODP Scientific Prospectus, Integrated Ocean Drilling Program, https://doi.org/10.2204/iodp.sp.348.2013
Project(s):
Coverage:
Latitude: 33.316110 * Longitude: 137.299160
Minimum DEPTH, sediment/rock: 476.360 m * Maximum DEPTH, sediment/rock: 506.760 m
Event(s):
Comment:
Geocode = [m CSF-A] Top Core depth (below sea floor)
Parameter(s):
# | Name | Short Name | Unit | Principal Investigator | Method/Device | Comment |
---|---|---|---|---|---|---|
1 | Sample code/label | Sample label | Expedition 348 Scientists | DSDP/ODP/IODP sample designation | Sample top | |
2 | DEPTH, sediment/rock | Depth sed | m | Geocode | ||
3 | Depth, top/min | Depth top | m | Expedition 348 Scientists | [m CSF-B] Top Core depth (below sea floor) | |
4 | Sample code/label 2 | Sample label 2 | Expedition 348 Scientists | DSDP/ODP/IODP sample designation | Sample bottom | |
5 | Depth, bottom/max | Depth bot | m | Expedition 348 Scientists | [m CSF-A] Bottom Core depth (below sea floor) | |
6 | Depth, bottom/max | Depth bot | m | Expedition 348 Scientists | [m CSF-B] Bottom Core depth (below sea floor) | |
7 | Frequency | Freq | Hz | Expedition 348 Scientists | Impedance analysis | Of applied alternating current |
8 | Resistivity along X-axis | Resistivity X | Ohm m | Expedition 348 Scientists | Impedance analysis | |
9 | Resistivity along Y-axis | Resistivity Y | Ohm m | Expedition 348 Scientists | Impedance analysis | |
10 | Resistivity along Z-axis | Resistivity Z | Ohm m | Expedition 348 Scientists | Impedance analysis | |
11 | Conductivity along X-axis | Cond X | S/m | Expedition 348 Scientists | Impedance analysis | |
12 | Conductivity along Y-axis | Cond Y | S/m | Expedition 348 Scientists | Impedance analysis | |
13 | Conductivity along Z-axis | Cond Z | S/m | Expedition 348 Scientists | Impedance analysis | |
14 | Anisotropy, impedance horizontal | Aniso imp h | Expedition 348 Scientists | Impedance analysis | ||
15 | Temperature, technical | T tech | °C | Expedition 348 Scientists | Impedance analysis | Room temperature |
16 | Anisotropy, impedance vertical | Aniso imp v | Expedition 348 Scientists | Impedance analysis | ||
17 | Time Stamp | Time Stamp | Expedition 348 Scientists | Impedance analysis | Registration |
License:
(UNKNOWN)
Size:
128 data points