Hirose, Takehiro; Saffer, Demian M; Tobin, Harold J; Toczko, Sean; Maeda, Lena; Kubo, Yusuke; Kimura, Gaku; Moore, Gregory F; Underwood, Michael B; Kanagawa, Kyuichi; Expedition 348 Scientists (2015): Electrical conductivity from IODP Hole 348-C0002P [dataset]. PANGAEA, https://doi.org/10.1594/PANGAEA.842305
Always quote citation above when using data! You can download the citation in several formats below.
Related to:
Hirose, Takehiro; Saffer, Demian M; Tobin, Harold J; Toczko, Sean; Maeda, Lena; Kubo, Yusuke (2013): NanTroSEIZE Stage 3: NanTroSEIZE plate boundary deep riser 3. IODP Scientific Prospectus, Integrated Ocean Drilling Program, https://doi.org/10.2204/iodp.sp.348.2013
Project(s):
Coverage:
Latitude: 33.440833 * Longitude: 137.196944
Minimum DEPTH, sediment/rock: 2070.500 m * Maximum DEPTH, sediment/rock: 3050.500 m
Event(s):
Comment:
Geocode = [m, CMP] Top Depth DSF, MSF, WSF and CSF-B
Parameter(s):
# | Name | Short Name | Unit | Principal Investigator | Method/Device | Comment |
---|---|---|---|---|---|---|
1 | Sample code/label | Sample label | Expedition 348 Scientists | DSDP/ODP/IODP sample designation | Sample top | |
2 | DEPTH, sediment/rock | Depth sed | m | Geocode | ||
3 | Sample code/label 2 | Sample label 2 | Expedition 348 Scientists | DSDP/ODP/IODP sample designation | Sample bottom | |
4 | Depth, bottom/max | Depth bot | m | Expedition 348 Scientists | [m, CMP] Bottom Depth DSF, MSF, WSF and CSF-B | |
5 | Resistivity along X-axis | Resistivity X | Ohm m | Expedition 348 Scientists | Impedance analysis | |
6 | Resistivity along Y-axis | Resistivity Y | Ohm m | Expedition 348 Scientists | Impedance analysis | |
7 | Resistivity along Z-axis | Resistivity Z | Ohm m | Expedition 348 Scientists | Impedance analysis | |
8 | Conductivity along X-axis | Cond X | S/m | Expedition 348 Scientists | Impedance analysis | |
9 | Conductivity along Y-axis | Cond Y | S/m | Expedition 348 Scientists | Impedance analysis | |
10 | Conductivity along Z-axis | Cond Z | S/m | Expedition 348 Scientists | Impedance analysis | |
11 | Anisotropy, impedance horizontal | Aniso imp h | Expedition 348 Scientists | Impedance analysis | ||
12 | Temperature, technical | T tech | °C | Expedition 348 Scientists | Impedance analysis | Room temperature |
13 | Anisotropy, impedance vertical | Aniso imp v | Expedition 348 Scientists | Impedance analysis | ||
14 | Comment | Comment | Expedition 348 Scientists | Impedance analysis | On measurement | |
15 | Time Stamp | Time Stamp | Expedition 348 Scientists | Of registration |
License:
(UNKNOWN)
Size:
600 data points