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Shotyk, William; Krachler, Michael; Aeschbach-Hertig, Werner; Hillier, Stephen; Zheng, Jiancheng (2010): (Table 1) Water chemistry of groundwater and snow samples from three sites in Ontario, Canada [dataset]. PANGAEA, https://doi.org/10.1594/PANGAEA.836902, Supplement to: Shotyk, W et al. (2010): Trace elements in recent groundwater of an artesian flow system and comparison with snow: enrichments, depletions, and chemical evolution of the water. Journal of Environmental Monitoring, 12(1), 208, https://doi.org/10.1039/b909723f

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Abstract:
Snow samples collected from hand-dug pits at two sites in Simcoe County, Ontario, Canada were analysed for major and trace elements using the clean lab methods established for polar ice. Potentially toxic, chalcophile elements are highly enriched in snow, relative to their natural abundance in crustal rocks, with enrichment factor (EF) values (calculated using Sc) in the range 107 to 1081 for Ag, As, Bi, Cd, Cu, Mo, Pb, Sb, Te, and Zn. Relative to M/Sc ratios in snow, water samples collected at two artesian flows in this area are significantly depleted in Ag, Al, Be, Bi, Cd, Cr, Cu, Ni, Pb, Sb, Tl, V, and Zn at both sites, and in Co, Th and Tl at one of the sites. The removal from the waters of these elements is presumably due to such processes as physical retention (filtration) of metal-bearing atmospheric aerosols by organic and mineral soil components as well as adsorption and surface complexation of ionic species onto organic, metal oxyhydroxide and clay mineral surfaces. In the case of Pb, the removal processes are so effective that apparently ''natural'' ratios of Pb to Sc are found in the groundwaters. Tritium measurements show that the groundwater at one of the sites is modern (ie not more than 30 years old) meaning that the inputs of Pb and other trace elements to the groundwaters may originally have been much higher than they are today; the M/Sc ratios measured in the groundwaters today, therefore, represent a conservative estimate of the extent of metal removal along the flow path. Lithogenic elements significantly enriched in the groundwaters at both sites include Ba, Ca, Li, Mg, Mn, Na, Rb, S, Si, Sr, and Ti. The abundance of these elements can largely be explained in terms of weathering of the dominant silicate (plagioclase, potassium feldspar, amphibole and biotite) and carbonate minerals (calcite, dolomite and ankerite) in the soils and sediments of the watershed. Arsenic, Mo, Te, and especially U are also highly enriched in the groundwaters, due to chemical weathering: these could easily be explained if there are small amounts of sulfides (As, Mo, Te) and apatite (U) in the soils of the source area. Elements neither significantly enriched nor depleted at both sites include Fe, Ga, Ge, and P.
Coverage:
Median Latitude: 43.827667 * Median Longitude: -80.505333 * South-bound Latitude: 42.940000 * West-bound Longitude: -81.190000 * North-bound Latitude: 44.583000 * East-bound Longitude: -79.866000
Date/Time Start: 2005-03-14T00:00:00 * Date/Time End: 2007-10-05T00:00:00
Event(s):
Elmsvale_area * Latitude: 44.583000 * Longitude: -79.866000 * Location: Ontario, Canada * Method/Device: Sampling by hand (HAND)
Luther_Bog * Latitude: 43.960000 * Longitude: -80.460000 * Location: Ontario, Canada * Method/Device: Sampling by hand (HAND)
Sifton_Bog * Latitude: 42.940000 * Longitude: -81.190000 * Location: Ontario, Canada * Method/Device: Sampling by hand (HAND)
Comment:
Data extracted in the frame of a joint ICSTI/PANGAEA IPY effort, see http://doi.pangaea.de/10.1594/PANGAEA.150150
Parameter(s):
#NameShort NameUnitPrincipal InvestigatorMethod/DeviceComment
1Event labelEvent
2Area/localityAreaShotyk, William
3Sample typeSamp typeShotyk, William
4DATE/TIMEDate/TimeGeocode
5Sample amountN#Shotyk, William# = Johnson n = 6, Parnell n = 3
6SilverAgng/lShotyk, WilliamInductively coupled plasma-sector field-mass spectrometry (ICP-SF-MS)
7Silver, standard deviationAg std dev±Shotyk, WilliamInductively coupled plasma-sector field-mass spectrometry (ICP-SF-MS)
8AluminiumAlµg/lShotyk, WilliamInductively coupled plasma-sector field-mass spectrometry (ICP-SF-MS)
9Aluminium, standard deviationAl std dev±Shotyk, WilliamInductively coupled plasma-sector field-mass spectrometry (ICP-SF-MS)
10ArsenicAsµg/lShotyk, WilliamInductively coupled plasma-sector field-mass spectrometry (ICP-SF-MS)
11Arsenic, standard deviationAs std dev±Shotyk, WilliamInductively coupled plasma-sector field-mass spectrometry (ICP-SF-MS)
12Barium 2+Ba2+µg/lShotyk, WilliamInductively coupled plasma-sector field-mass spectrometry (ICP-SF-MS)
13Barium, standard deviationBa std dev±Shotyk, WilliamInductively coupled plasma-sector field-mass spectrometry (ICP-SF-MS)
14BerylliumBeng/lShotyk, WilliamInductively coupled plasma-sector field-mass spectrometry (ICP-SF-MS)
15Beryllium, standard deviationBe std dev±Shotyk, WilliamInductively coupled plasma-sector field-mass spectrometry (ICP-SF-MS)
16BismuthBiµg/lShotyk, WilliamInductively coupled plasma-sector field-mass spectrometry (ICP-SF-MS)
17Bismuth, standard deviationBi std dev±Shotyk, WilliamInductively coupled plasma-sector field-mass spectrometry (ICP-SF-MS)
18CalciumCa2+mg/lShotyk, WilliamInductively coupled plasma-sector field-mass spectrometry (ICP-SF-MS)
19Calcium, standard deviationCa std dev±Shotyk, WilliamInductively coupled plasma-sector field-mass spectrometry (ICP-SF-MS)
20CadmiumCdng/lShotyk, WilliamInductively coupled plasma-sector field-mass spectrometry (ICP-SF-MS)
21Cadmium, standard deviationCd std dev±Shotyk, WilliamInductively coupled plasma-sector field-mass spectrometry (ICP-SF-MS)
22CobaltCoµg/lShotyk, WilliamInductively coupled plasma-sector field-mass spectrometry (ICP-SF-MS)
23Cobalt, standard deviationCo std dev±Shotyk, WilliamInductively coupled plasma-sector field-mass spectrometry (ICP-SF-MS)
24ChromiumCrµg/lShotyk, WilliamInductively coupled plasma-sector field-mass spectrometry (ICP-SF-MS)
25Chromium, standard deviationCr std dev±Shotyk, WilliamInductively coupled plasma-sector field-mass spectrometry (ICP-SF-MS)
26CopperCuµg/lShotyk, WilliamInductively coupled plasma-sector field-mass spectrometry (ICP-SF-MS)
27Copper, standard deviationCu std dev±Shotyk, WilliamInductively coupled plasma-sector field-mass spectrometry (ICP-SF-MS)
28IronFeµg/lShotyk, WilliamInductively coupled plasma-sector field-mass spectrometry (ICP-SF-MS)
29Iron, standard deviationFe std dev±Shotyk, WilliamInductively coupled plasma-sector field-mass spectrometry (ICP-SF-MS)
30GalliumGaµg/lShotyk, WilliamInductively coupled plasma-sector field-mass spectrometry (ICP-SF-MS)
31Gallium, standard deviationGa std dev±Shotyk, WilliamInductively coupled plasma-sector field-mass spectrometry (ICP-SF-MS)
32GermaniumGeµg/lShotyk, WilliamInductively coupled plasma-sector field-mass spectrometry (ICP-SF-MS)
33Germanium, standard deviationGe std dev±Shotyk, WilliamInductively coupled plasma-sector field-mass spectrometry (ICP-SF-MS)
34LithiumLiµg/lShotyk, WilliamInductively coupled plasma-sector field-mass spectrometry (ICP-SF-MS)
35Lithium, standard deviationLi std dev±Shotyk, WilliamInductively coupled plasma-sector field-mass spectrometry (ICP-SF-MS)
36MagnesiumMg2+mg/lShotyk, WilliamInductively coupled plasma-sector field-mass spectrometry (ICP-SF-MS)
37Magnesium, standard deviationMg std dev±Shotyk, WilliamInductively coupled plasma-sector field-mass spectrometry (ICP-SF-MS)
38Manganese 2+Mn2+µg/lShotyk, WilliamInductively coupled plasma-sector field-mass spectrometry (ICP-SF-MS)
39Manganese, standard deviationMn std dev±Shotyk, WilliamInductively coupled plasma-sector field-mass spectrometry (ICP-SF-MS)
40MolybdenumMoµg/lShotyk, WilliamInductively coupled plasma-sector field-mass spectrometry (ICP-SF-MS)
41Molybdenum, standard deviationMo std dev±Shotyk, WilliamInductively coupled plasma-sector field-mass spectrometry (ICP-SF-MS)
42SodiumNa+mg/lShotyk, WilliamInductively coupled plasma-sector field-mass spectrometry (ICP-SF-MS)
43Sodium, standard deviationNa std dev±Shotyk, WilliamInductively coupled plasma-sector field-mass spectrometry (ICP-SF-MS)
44NickelNiµg/lShotyk, WilliamInductively coupled plasma-sector field-mass spectrometry (ICP-SF-MS)
45Nickel, standard deviationNi std dev±Shotyk, WilliamInductively coupled plasma-sector field-mass spectrometry (ICP-SF-MS)
46PhosphorusPµg/lShotyk, WilliamInductively coupled plasma-sector field-mass spectrometry (ICP-SF-MS)
47Phosphorus, standard deviationP std dev±Shotyk, WilliamInductively coupled plasma-sector field-mass spectrometry (ICP-SF-MS)
48LeadPbµg/lShotyk, WilliamInductively coupled plasma-sector field-mass spectrometry (ICP-SF-MS)
49Lead, standard deviationPb std dev±Shotyk, WilliamInductively coupled plasma-sector field-mass spectrometry (ICP-SF-MS)
50RubidiumRbµg/lShotyk, WilliamInductively coupled plasma-sector field-mass spectrometry (ICP-SF-MS)
51Rubidium, standard deviationRb std dev±Shotyk, WilliamInductively coupled plasma-sector field-mass spectrometry (ICP-SF-MS)
52SulfurSmg/lShotyk, WilliamInductively coupled plasma-sector field-mass spectrometry (ICP-SF-MS)
53Sulfur, standard deviationS std dev±Shotyk, WilliamInductively coupled plasma-sector field-mass spectrometry (ICP-SF-MS)
54AntimonySbµg/lShotyk, WilliamInductively coupled plasma-sector field-mass spectrometry (ICP-SF-MS)
55Antimony, standard deviationSb std dev±Shotyk, WilliamInductively coupled plasma-sector field-mass spectrometry (ICP-SF-MS)
56ScandiumScµg/lShotyk, WilliamInductively coupled plasma-sector field-mass spectrometry (ICP-SF-MS)
57Scandium, standard deviationSc std dev±Shotyk, WilliamInductively coupled plasma-sector field-mass spectrometry (ICP-SF-MS)
58SiliconSimg/lShotyk, WilliamInductively coupled plasma-sector field-mass spectrometry (ICP-SF-MS)
59Silicon, standard deviationSi std dev±Shotyk, WilliamInductively coupled plasma-sector field-mass spectrometry (ICP-SF-MS)
60Strontium 2+Sr2+µg/lShotyk, WilliamInductively coupled plasma-sector field-mass spectrometry (ICP-SF-MS)
61Strontium, standard deviationSr std dev±Shotyk, WilliamInductively coupled plasma-sector field-mass spectrometry (ICP-SF-MS)
62TelluriumTeµg/lShotyk, WilliamInductively coupled plasma-sector field-mass spectrometry (ICP-SF-MS)
63Tellurium, standard deviationTe std dev±Shotyk, WilliamInductively coupled plasma-sector field-mass spectrometry (ICP-SF-MS)
64ThoriumThµg/lShotyk, WilliamInductively coupled plasma-sector field-mass spectrometry (ICP-SF-MS)
65Thorium, standard deviationTh std dev±Shotyk, WilliamInductively coupled plasma-sector field-mass spectrometry (ICP-SF-MS)
66TitaniumTiµg/lShotyk, WilliamInductively coupled plasma-sector field-mass spectrometry (ICP-SF-MS)
67Titanium, standard deviationTi std dev±Shotyk, WilliamInductively coupled plasma-sector field-mass spectrometry (ICP-SF-MS)
68ThalliumTlµg/lShotyk, WilliamInductively coupled plasma-sector field-mass spectrometry (ICP-SF-MS)
69Thallium, standard deviationTl std dev±Shotyk, WilliamInductively coupled plasma-sector field-mass spectrometry (ICP-SF-MS)
70UraniumUµg/lShotyk, WilliamInductively coupled plasma-sector field-mass spectrometry (ICP-SF-MS)
71Uranium, standard deviationU std dev±Shotyk, WilliamInductively coupled plasma-sector field-mass spectrometry (ICP-SF-MS)
72VanadiumVµg/lShotyk, WilliamInductively coupled plasma-sector field-mass spectrometry (ICP-SF-MS)
73Vanadium, standard deviationV std dev±Shotyk, WilliamInductively coupled plasma-sector field-mass spectrometry (ICP-SF-MS)
74ZincZnµg/lShotyk, WilliamInductively coupled plasma-sector field-mass spectrometry (ICP-SF-MS)
75Zinc, standard deviationZn std dev±Shotyk, WilliamInductively coupled plasma-sector field-mass spectrometry (ICP-SF-MS)
Size:
365 data points

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