/* DATA DESCRIPTION:
Citation:	Moore, Gregory; Kanagawa, Kyuichi; Strasser, Michael; Dugan, Brandon; Maeda, Lena; Toczko, Sean; Expedition 338 Scientists (2014): Electrical conductivity from IODP Hole 338-C0002H [dataset]. SIO7 Data Center, J-CORES Database; Ocean Drilling Program, Center for Deep Earth Exploration (JAMSTEC), PANGAEA, https://doi.org/10.1594/PANGAEA.829561
Related to:	Moore, Gregory; Kanagawa, Kyuichi; Strasser, Michael; Dugan, Brandon; Maeda, Lena; Toczko, Sean; Expedition 338 Scientists (2013): NanTroSEIZE Stage 3: NanTroSEIZE plate boundary deep riser 2. Integrated Ocean Drilling Program Management International, Inc., for the Integrated Ocean Drilling Program, 17, 1-12, https://doi.org/10.5194/sd-17-1-2014
Other version:	IODP Hole 338-C0002H, snapshot taken on 2014-02-11, J-CORES, SIO7 Data Center (URI: https://www.jamstec.go.jp/sio7/j-cores.data/338/C0002H/)
Project(s):	Integrated Ocean Drilling Program / International Ocean Discovery Program (IODP) (URI: https://www.iodp.org/)
Coverage:	LATITUDE: 33.300420 * LONGITUDE: 136.636920
	DATE/TIME START: 2012-12-10T00:00:00 * DATE/TIME END: 2012-12-10T00:00:00
	MINIMUM DEPTH, sediment/rock: 1100.63 m * MAXIMUM DEPTH, sediment/rock: 1110.76 m
Event(s):	338-C0002H * LATITUDE: 33.300420 * LONGITUDE: 136.636920 * DATE/TIME: 2012-12-10T00:00:00 * ELEVATION: -1936.5 m * PENETRATION: 1120 m * RECOVERY: 3.91 m * LOCATION: Nankai Trough * CAMPAIGN: Exp338 (NanTroSEIZE Plate Boundary Deep Riser 2) (URI: http://www.jamstec.go.jp/chikyu/nantroseize/e/expedition_338.html) * BASIS: Chikyu (URI: https://en.wikipedia.org/wiki/Chiky%C5%AB) * METHOD/DEVICE: Drilling/drill rig (DRILL) * COMMENT: 2 cores; 19 m Interval cored; 20.6 % recovered
Comment:	Geocode = [m CSF-A] Top Core depth (below sea floor)
Parameter(s):	Sample code/label (Sample label) * PI: Expedition 338 Scientists * METHOD/DEVICE: DSDP/ODP/IODP sample designation (URI: hdl:10013/epic.27914.d001) * COMMENT: Sample top
	DEPTH, sediment/rock [m] (Depth sed) * GEOCODE
	Depth, top/min [m] (Depth top) * PI: Expedition 338 Scientists * COMMENT: [m CSF-B] Top Core depth (below sea floor)
	Sample code/label 2 (Sample label 2) * PI: Expedition 338 Scientists * METHOD/DEVICE: DSDP/ODP/IODP sample designation (URI: hdl:10013/epic.27914.d001) * COMMENT: Sample bottom
	Depth, bottom/max [m] (Depth bot) * PI: Expedition 338 Scientists * COMMENT: [m CSF-A] Bottom Core depth (below sea floor)
	Depth, bottom/max [m] (Depth bot) * PI: Expedition 338 Scientists * COMMENT: [m CSF-B] Bottom Core depth (below sea floor)
	Electrical impedance magnitude filter paper [Ohm] (Elec imp mag f paper) * PI: Expedition 338 Scientists * METHOD/DEVICE: Impedance analysis
	Electrical impedance phase angle filter paper [deg] (Elec imp phase angle f paper) * PI: Expedition 338 Scientists * METHOD/DEVICE: Impedance analysis
	Electrical impedance magnitude X [Ohm] (Elec imp mag X) * PI: Expedition 338 Scientists * METHOD/DEVICE: Impedance analysis
	Electrical impedance phase angle X [deg] (Elec imp phase angle X) * PI: Expedition 338 Scientists * METHOD/DEVICE: Impedance analysis
	Electrical impedance magnitude Y [Ohm] (Elec imp mag Y) * PI: Expedition 338 Scientists * METHOD/DEVICE: Impedance analysis
	Electrical impedance phase angle Y [deg] (Elec imp phase angle Y) * PI: Expedition 338 Scientists * METHOD/DEVICE: Impedance analysis
	Electrical impedance magnitude Z [Ohm] (Elec imp mag Z) * PI: Expedition 338 Scientists * METHOD/DEVICE: Impedance analysis
	Electrical impedance phase angle Z [deg] (Elec imp phase angle Z) * PI: Expedition 338 Scientists * METHOD/DEVICE: Impedance analysis
	Resistivity along X-axis [Ohm m] (Resistivity X) * PI: Expedition 338 Scientists * METHOD/DEVICE: Impedance analysis
	Resistivity along Y-axis [Ohm m] (Resistivity Y) * PI: Expedition 338 Scientists * METHOD/DEVICE: Impedance analysis
	Resistivity along Z-axis [Ohm m] (Resistivity Z) * PI: Expedition 338 Scientists * METHOD/DEVICE: Impedance analysis
	Conductivity along X-axis [S/m] (Cond X) * PI: Expedition 338 Scientists * METHOD/DEVICE: Impedance analysis
	Conductivity along Y-axis [S/m] (Cond Y) * PI: Expedition 338 Scientists * METHOD/DEVICE: Impedance analysis
	Conductivity along Z-axis [S/m] (Cond Z) * PI: Expedition 338 Scientists * METHOD/DEVICE: Impedance analysis
	Anisotropy, impedance horizontal (Aniso imp h) * PI: Expedition 338 Scientists * METHOD/DEVICE: Impedance analysis
	Temperature, technical [°C] (T tech) * PI: Expedition 338 Scientists * METHOD/DEVICE: Impedance analysis * COMMENT: Room temperature
	Anisotropy, impedance vertical (Aniso imp v) * PI: Expedition 338 Scientists * METHOD/DEVICE: Impedance analysis
	Time Stamp (Time Stamp) * PI: Expedition 338 Scientists * METHOD/DEVICE: Impedance analysis * COMMENT: Registration
License:	Creative Commons Attribution 3.0 Unported (CC-BY-3.0) (URI: https://creativecommons.org/licenses/by/3.0/)
Size:	46 data points
*/
Sample label (Sample top, DSDP/ODP/IODP sam...)	Depth sed [m]	Depth top [m] ([m CSF-B] Top Core depth (bel...)	Sample label 2 (Sample bottom, DSDP/ODP/IODP ...)	Depth bot [m] ([m CSF-A] Bottom Core depth (...)	Depth bot [m] ([m CSF-B] Bottom Core depth (...)	Elec imp mag f paper [Ohm] (Impedance analysis)	Elec imp phase angle f paper [deg] (Impedance analysis)	Elec imp mag X [Ohm] (Impedance analysis)	Elec imp phase angle X [deg] (Impedance analysis)	Elec imp mag Y [Ohm] (Impedance analysis)	Elec imp phase angle Y [deg] (Impedance analysis)	Elec imp mag Z [Ohm] (Impedance analysis)	Elec imp phase angle Z [deg] (Impedance analysis)	Resistivity X [Ohm m] (Impedance analysis)	Resistivity Y [Ohm m] (Impedance analysis)	Resistivity Z [Ohm m] (Impedance analysis)	Cond X [S/m] (Impedance analysis)	Cond Y [S/m] (Impedance analysis)	Cond Z [S/m] (Impedance analysis)	Aniso imp h (Impedance analysis)	T tech [°C] (Room temperature, Impedance a...)	Aniso imp v (Impedance analysis)	Time Stamp (Registration, Impedance analysis)
338-C0002H-1R-1,13.0	1100.63	1100.63	338-C0002H-1R-1,15.0	1100.65	1100.65	8.102970	-7.681628	118.4430	-5.60146	95.2115	-7.56756	101.338	-7.13656	1.953	1.542	1.636	0.512	0.648	0.611	23.5	22.68	6.6	2013-05-15T05:08:17
338-C0002H-2R-1,26.0	1110.76	1110.76	338-C0002H-2R-1,28.0	1110.78	1110.78	7.716483	-7.633421	98.2737	-7.91340	97.7633	-7.23671	123.679	-5.72968	1.709	1.507	2.182	0.585	0.663	0.458	12.6	22.20	-30.3	2013-05-15T05:08:17