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Kozdon, Reinhard; Kelly, Daniel Clay; Kita, Noriko T; Fournelle, John H; Valley, John W (2013): (Table S1) In situ δ¹⁸O measurements in the basal areas of muricae from ODP Site 143-865 [dataset]. PANGAEA, https://doi.org/10.1594/PANGAEA.821635, In supplement to: Kozdon, R et al. (2011): Planktonic foraminiferal oxygen isotope analysis by ion microprobe technique suggests warm tropical sea surface temperatures during the Early Paleogene. Paleoceanography, 26(3), PA3206, https://doi.org/10.1029/2010PA002056

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Project(s):
Coverage:
Median Latitude: 18.440350 * Median Longitude: -179.555000 * South-bound Latitude: 18.440300 * West-bound Longitude: -179.555000 * North-bound Latitude: 18.440400 * East-bound Longitude: -179.555000
Date/Time Start: 1992-03-27T00:00:00 * Date/Time End: 1992-04-04T14:15:00
Minimum DEPTH, sediment/rock: 71.70 m * Maximum DEPTH, sediment/rock: 105.00 m
Event(s):
143-865  * Latitude: 18.440300 * Longitude: -179.555000 * Date/Time Start: 1992-03-27T00:00:00 * Date/Time End: 1992-04-04T00:00:00 * Elevation: -1528.0 m * Penetration: 1172.7 m * Recovery: 369.3 m * Location: North Pacific Ocean * Campaign: Leg143 * Basis: Joides Resolution * Method/Device: Composite Core (COMPCORE) * Comment: 128 cores; 1172.7 m cored; 0 m drilled; 31.5% recovery
143-865C  * Latitude: 18.440400 * Longitude: -179.555000 * Date/Time Start: 1992-04-04T01:30:00 * Date/Time End: 1992-04-04T14:15:00 * Elevation: -1528.0 m * Penetration: 136.3 m * Recovery: 114.11 m * Location: North Pacific Ocean * Campaign: Leg143 * Basis: Joides Resolution * Method/Device: Drilling/drill rig (DRILL) * Comment: 15 cores; 136.3 m cored; 0 m drilled; 83.7 % recovery
Comment:
Sediment depth is given in mbsf. After ion microprobe measurements, the appearance and location of analysis pits were imaged by SEM. Oxygen isotope data from pits overlapping epoxy resin, cracks, cavities, inclusions, or areas of high porosities (ion yield less than 90% of that obtained in the nonporous standard) are considered as possibly compromised, and data from these measurements were not used for climate reconstruction. However, these measurements are listed in the table.
Parameter(s):
#NameShort NameUnitPrincipal InvestigatorMethod/DeviceComment
Event labelEvent
DateDateKozdon, ReinhardSession
Sample commentSample commentKozdon, Reinhard
NumberNoKozdon, Reinhard
Sample IDSample IDKozdon, Reinhard
DEPTH, sediment/rockDepth sedmGeocode
δ18Oδ18OKozdon, ReinhardIon microprobewith respect to PDB, converted by the equation of Coplen et al. (1983)
δ18Oδ18OKozdon, ReinhardIon microprobewith respect to SMOW, corrected for instrumental bias
δ18Oδ18OKozdon, ReinhardIon microprobewith respect to SMOW, Raw measured 18O/16O ratios, converted to the delta notation by normalizing to SMOW (18O/16O)VSMOW = 0.00200520 (Baertschi, 1976)
10 Error, absoluteError a±Kozdon, ReinhardIon microprobeinternal error of a single analysis calculated as the twice of the standard error of the mean of 20 cycles
11 Oxygen-16, secondary ion intensity16O106 cpsKozdon, ReinhardIon microprobe
12 Oxygen-16, secondary ion yield16O yield109 cps/nAKozdon, ReinhardIon microprobe
13 Standard deviationStd dev±Kozdon, ReinhardIon microprobe2 SD of standard analyses
14 CommentCommentKozdon, Reinhard
Size:
1587 data points

Data

Download dataset as tab-delimited text — use the following character encoding:


Event

Date
(Session)

Sample comment

No

Sample ID

Depth sed [m]

δ18O []
(with respect to PDB, converte...)

δ18O []
(with respect to SMOW, correct...)

δ18O []
(with respect to SMOW, Raw mea...)
10 
Error a [±]
(internal error of a single an...)
11 
16O [106 cps]
12 
16O yield [109 cps/nA]
13 
Std dev [±]
(2 SD of standard analyses)
14 
Comment
143-865C 2008-12Session I, Sample Mount ODP865C (I)80Test#01-1103.102.241.46low count rate (cavity)
143-865C2008-12Session I, Sample Mount ODP865C (I)81Test#01-2103.10-2.7428.0720.650.352.521.630.18
143-865C2008-12Session I, Sample Mount ODP865C (I)82Test#02-1103.10-3.3227.4820.060.262.501.630.18
143-865C2008-12Session I, Sample Mount ODP865C (I)83Test#02-2103.10-3.1427.6620.240.342.591.680.18
143-865C2008-12Session I, Sample Mount ODP865C (I)84Test#03-1103.10-3.2427.5620.140.312.581.660.18
143-865C2008-12Session I, Sample Mount ODP865C (I)85Test#04-1102.900.402.281.46irregular pit (inclusion)
143-865C2008-12Session I, Sample Mount ODP865C (I)86Test#05-1102.90-3.1027.7020.280.322.541.620.18
143-865C2008-12Session I, Sample Mount ODP865C (I)87Test#05-2102.900.422.071.32low count rate (prorosity)
143-865C2008-12Session I, Sample Mount ODP865C (I)88Test#06-1102.90-3.1927.6120.190.252.601.670.18
143-865C2008-12Session I, Sample Mount ODP865C (I)89Test#07-1102.75-4.4626.3018.890.312.661.700.18
143-865C2008-12Session I, Sample Mount ODP865C (I)90Test#07-2102.75-4.0426.7419.330.292.651.690.18
143-865C2008-12Session I, Sample Mount ODP865C (I)91Test#08-1102.751.691.07pit overlapping epoxy
143-865 2009-02Session II, Sample Mount ODP865 (II)9Test#03-1105.00-2.8627.9623.550.361.881.290.39
143-8652009-02Session II, Sample Mount ODP865 (II)10Test#03-2105.00-3.3627.4423.040.302.011.360.39
143-8652009-02Session II, Sample Mount ODP865 (II)11Test#04-1105.00-3.3827.4323.020.331.961.320.39
143-8652009-02Session II, Sample Mount ODP865 (II)12Test#04-2105.00-3.3727.4323.030.272.071.380.39
143-8652009-02Session II, Sample Mount ODP865 (II)13Test#06-1105.00-3.9626.8322.420.322.091.370.39
143-8652009-02Session II, Sample Mount ODP865 (II)14Test#06-2105.00-3.1627.6523.250.262.061.320.39
143-8652009-02Session II, Sample Mount ODP865 (II)15Test#06-3105.00-3.4927.3122.910.222.121.330.39
143-8652009-02Session II, Sample Mount ODP865 (II)16Test#09-1103.10-3.2027.6123.200.252.161.350.39
143-8652009-02Session II, Sample Mount ODP865 (II)17Test#09-2103.100.580.36pit overlapping epoxy
143-8652009-02Session II, Sample Mount ODP865 (II)18Test#10-1103.101.991.27pit overlapping epoxy
143-8652009-02Session II, Sample Mount ODP865 (II)19Test#10-2103.10-3.4927.3122.900.392.081.330.39
143-8652009-02Session II, Sample Mount ODP865 (II)20Test#10-3103.10-3.3927.4223.010.371.981.280.39
143-8652009-02Session II, Sample Mount ODP865 (II)27Test#11-1103.50-4.0526.7422.190.292.051.340.24
143-8652009-02Session II, Sample Mount ODP865 (II)28Test#11-2103.50-3.5827.2222.670.332.101.380.24
143-8652009-02Session II, Sample Mount ODP865 (II)29Test#12-1103.501.230.80pit overlapping epoxy
143-8652009-02Session II, Sample Mount ODP865 (II)30Test#13-1103.50-4.0026.7822.230.232.001.280.24
143-8652009-02Session II, Sample Mount ODP865 (II)31Test#13-2103.50-3.9826.8122.260.291.981.280.24
143-8652009-02Session II, Sample Mount ODP865 (II)32Test#13-3103.50-3.9526.8422.280.322.001.280.24
143-8652009-02Session II, Sample Mount ODP865 (II)33Test#14-1103.501.741.13pit overlapping epoxy
143-8652009-02Session II, Sample Mount ODP865 (II)34Test#18-1103.00-3.9426.8522.290.341.851.290.24
143-8652009-02Session II, Sample Mount ODP865 (II)35Test#18-2103.00-4.1126.6822.130.381.931.380.24
143-8652009-02Session II, Sample Mount ODP865 (II)36Test#20-1103.001.681.21low count rate (cavity)
143-8652009-02Session II, Sample Mount ODP865 (II)37Test#21-1103.001.751.27pit overlapping epoxy
143-8652009-02Session II, Sample Mount ODP865 (II)38Test#24-1103.00-3.5927.2122.660.291.961.430.24
143-8652009-02Session II, Sample Mount ODP865 (II)39Test#24-2103.00-3.4227.3922.830.291.961.390.24
143-8652009-02Session II, Sample Mount ODP865 (II)44Test #26-1103.10-3.3927.5223.150.331.961.370.51
143-8652009-02Session II, Sample Mount ODP865 (II)45Test #26-2103.10-3.8326.9622.590.311.941.350.51
143-8652009-02Session II, Sample Mount ODP865 (II)46Test #27-1103.10-4.2626.5222.160.271.891.410.51
143-8652009-02Session II, Sample Mount ODP865 (II)47Test #28-1102.90-2.9727.8523.480.271.951.420.51
143-8652009-02Session II, Sample Mount ODP865 (II)48Test #28-2102.901.851.38Cs beam instability
143-8652009-02Session II, Sample Mount ODP865 (II)49Test #31-1102.901.331.00porosity, low count rate
143-8652009-02Session II, Sample Mount ODP865 (II)50Test #31-2102.901.701.31porosity, low count rate
143-8652009-02Session II, Sample Mount ODP865 (II)51Test #34-1104.281.671.24low count rate (cavity)
143-8652009-02Session II, Sample Mount ODP865 (II)52Test #34-2104.281.691.24low count rate (cavity)
143-8652009-02Session II, Sample Mount ODP865 (II)53Test #35-1104.281.651.22pit overlapping epoxy
143-8652009-02Session II, Sample Mount ODP865 (II)54Test #36-1104.281.751.29low count rate (cavity)
143-8652009-02Session II, Sample Mount ODP865 (II)55Test #36-2104.281.711.27pit overlappng epoxy
143-8652009-02Session II, Sample Mount ODP865 (II)61Test #37-1104.28-3.9126.8822.470.291.911.320.43
143-8652009-02Session II, Sample Mount ODP865 (II)62Test #38-1104.281.491.01low count rate (cavity)
143-8652009-02Session II, Sample Mount ODP865 (II)63Test #39-1104.28-3.3827.4323.020.292.061.430.43
143-8652009-02Session II, Sample Mount ODP865 (II)64Test #39-2104.281.721.20pit overlapping epoxy
143-8652009-02Session II, Sample Mount ODP865 (II)65Test #40-1102.871.761.23pit overlapping epoxy
143-8652009-02Session II, Sample Mount ODP865 (II)66Test #40-2102.87-3.2627.5523.140.391.881.320.43
143-8652009-02Session II, Sample Mount ODP865 (II)67Test #40-3102.871.731.22low count rate (cavity)
143-8652009-02Session II, Sample Mount ODP865 (II)68Test #41-1102.871.140.81pit overlapping epoxy
143-8652009-02Session II, Sample Mount ODP865 (II)69Test #44-1102.871.921.36inclusion
143-8652009-02Session II, Sample Mount ODP865 (II)70Test #44-2102.87-3.7327.0622.660.271.931.370.43
143-8652009-02Session II, Sample Mount ODP865 (II)71Test #45-1102.971.651.17low count rate (cavity)
143-8652009-02Session II, Sample Mount ODP865 (II)72Test #46-1102.890.690.49pit mainly in epoxy
143-8652009-02Session II, Sample Mount ODP865 (II)77Test #47-1102.891.080.71pit overlapping epoxy
143-8652009-02Session II, Sample Mount ODP865 (II)78Test #48-1102.89-3.6127.1922.590.392.091.350.48
143-8652009-02Session II, Sample Mount ODP865 (II)79Test #48-2102.89-3.7927.0022.400.232.181.410.48
143-8652009-02Session II, Sample Mount ODP865 (II)80Test #50-1102.89-3.7227.0822.480.272.091.350.48
143-8652009-02Session II, Sample Mount ODP865 (II)81Test #50-2102.89-3.4027.4022.800.262.111.370.48
143-8652009-02Session II, Sample Mount ODP865 (II)82Test #50-3102.89-3.6527.1422.540.252.071.350.48
143-8652009-02Session II, Sample Mount ODP865 (II)83Test #52-1102.90-4.3026.4821.880.232.161.400.48
143-8652009-02Session II, Sample Mount ODP865 (II)84Test #52-2102.90-3.9426.8522.250.332.071.340.48
143-8652009-02Session II, Sample Mount ODP865 (II)85Test #55-1102.84-3.8926.9022.230.322.031.320.48
143-8652009-02Session II, Sample Mount ODP865 (II)86Test #56-1102.84-4.1926.5921.990.322.161.400.48
143-8652009-02Session II, Sample Mount ODP865 (II)87Test #58-1102.841.921.26low count rate (cavity)
143-8652009-02Session II, Sample Mount ODP865 (II)88Test #58-2102.841.330.97pit overlapping epoxy
143-8652009-02Session II, Sample Mount ODP865 (II)95Test #62-1102.67-4.2026.5821.980.372.011.300.49
143-8652009-02Session II, Sample Mount ODP865 (II)96Test #63-1102.67-4.2726.5121.910.302.121.400.49
143-8652009-02Session II, Sample Mount ODP865 (II)97Test #66-1102.87-4.4726.3021.700.262.081.370.49
143-8652009-02Session II, Sample Mount ODP865 (II)98Test #68-1102.00-3.5227.2822.670.342.211.440.49
143-8652009-02Session II, Sample Mount ODP865 (II)99Test #70-1102.001.911.25pit overlapping epoxy
143-8652009-02Session II, Sample Mount ODP865 (II)100Test #71-1102.00-3.0727.7523.140.282.181.430.49
143-8652009-02Session II, Sample Mount ODP865 (II)101Test #72-1102.60-3.1427.6723.070.262.171.520.49
143-8652009-02Session II, Sample Mount ODP865 (II)102Test #73-1102.60-3.2427.5722.960.282.211.460.49
143-8652009-02Session II, Sample Mount ODP865 (II)103Test #74-1102.60-3.6927.1122.510.262.101.400.49
143-8652009-02Session II, Sample Mount ODP865 (II)104Test #76-1102.60-3.6927.1122.510.331.991.320.49
143-8652009-02Session II, Sample Mount ODP865 (II)109Test #78-1101.30-3.7427.0522.640.302.131.450.30
143-8652009-02Session II, Sample Mount ODP865 (II)110Test #79-1101.30-3.9326.8622.450.332.071.410.30
143-8652009-02Session II, Sample Mount ODP865 (II)111Test #80-1101.301.921.31low count rate (cavity)
143-8652009-02Session II, Sample Mount ODP865 (II)112Test #82-1101.300.331.921.30low count rate (cavity)
143-8652009-02Session II, Sample Mount ODP865 (II)113Test #83-171.70-2.9027.9223.510.292.081.410.30
143-8652009-02Session II, Sample Mount ODP865 (II)114Test #84-171.70-2.6928.1423.730.322.091.420.30
143-8652009-02Session II, Sample Mount ODP865 (II)115Test #85-171.70-3.2727.5423.120.252.071.410.30
143-8652009-02Session II, Sample Mount ODP865 (II)116Test #86-171.70-3.4027.4123.000.211.991.350.30
143-8652009-02Session II, Sample Mount ODP865 (II)117Test #87-171.70-3.2627.5523.140.321.981.340.30
143-8652009-02Session II, Sample Mount ODP865 (II)118Test #88-171.701.791.20pit overlapping epoxy
143-8652009-02Session II, Sample Mount ODP865 (II)119Test #93-1104.301.871.26low count rate (cavity)
143-8652009-02Session II, Sample Mount ODP865 (II)120Test #94-1104.30-3.7427.0622.650.242.071.400.30
143-8652009-02Session II, Sample Mount ODP865 (II)121Test #95-1100.50-3.5627.240.351.991.350.30
143-8652009-02Session II, Sample Mount ODP865 (II)122Test #97-1100.50-3.9526.8422.430.242.071.400.30
143-8652009-02Session III, Sample Mount ODP865 (III)358Test#04-198.70-3.1627.6519.210.503.231.770.19
143-8652009-02Session III, Sample Mount ODP865 (III)359Test#04-298.70-2.0428.8120.360.523.111.720.19
143-8652009-02Session III, Sample Mount ODP865 (III)360Test#05-198.70-2.8827.9419.500.483.191.780.19
143-8652009-02Session III, Sample Mount ODP865 (III)361Test#07-186.60-2.3528.4920.050.513.161.790.19
143-8652009-02Session III, Sample Mount ODP865 (III)362Test#11-186.60-2.0628.7920.340.583.101.740.19
143-8652009-02Session III, Sample Mount ODP865 (III)363Test#11-286.60-2.2328.6120.160.473.021.730.19
143-8652009-02Session III, Sample Mount ODP865 (III)364Test#12-186.602.941.69pit overlapping epoxy
143-8652009-02Session III, Sample Mount ODP865 (III)365Test#12-286.60-2.2328.6120.170.453.071.770.19
143-8652009-02Session III, Sample Mount ODP865 (III)366Test#14-182.562.301.36low count rate (porous)
143-8652009-02Session III, Sample Mount ODP865 (III)367Test#14-282.562.881.74overlapping previoud pit
143-8652009-02Session III, Sample Mount ODP865 (III)368Test#14-382.56-3.1927.6219.180.443.621.840.19
143-8652009-02Session III, Sample Mount ODP865 (III)369Test#15-182.56-3.0427.7819.340.493.791.820.19
143-8652009-02Session III, Sample Mount ODP865 (III)374Test #15-182.56-3.0827.7419.120.503.621.820.30
143-8652009-02Session III, Sample Mount ODP865 (III)375Test #15-282.56-2.9327.8919.270.503.601.820.30
143-8652009-02Session III, Sample Mount ODP865 (III)376Test #18-187.54-3.3627.4418.830.513.501.790.30
143-8652009-02Session III, Sample Mount ODP865 (III)377Test #20-187.54-2.8827.9419.320.483.581.840.30
143-8652009-02Session III, Sample Mount ODP865 (III)378Test #20-287.542.911.52low count rate (porous)
143-8652009-02Session III, Sample Mount ODP865 (III)379Test #22-187.543.121.65low count rate (porous)
143-8652009-02Session III, Sample Mount ODP865 (III)380Test #22-287.54-3.7627.1218.510.493.351.790.30
143-8652009-02Session III, Sample Mount ODP865 (III)381Test #23-187.54-3.7127.0918.480.653.181.710.30
143-8652009-02Session III, Sample Mount ODP865 (III)382Test #23-287.542.951.60pit overlapping epoxy
143-8652009-02Session III, Sample Mount ODP865 (III)383Test #26-177.20-2.1328.7220.090.433.381.820.30
143-8652009-02Session III, Sample Mount ODP865 (III)384Test #26-277.202.971.61low count rate (cavity/crack)
143-8652009-02Session III, Sample Mount ODP865 (III)385Test #27-177.20-3.6527.1518.540.513.281.810.30
143-8652009-02Session III, Sample Mount ODP865 (III)386Test #27-277.20-3.0027.8219.200.383.211.800.30
143-8652009-02Session III, Sample Mount ODP865 (III)395Test #34-178.70-2.5828.2519.610.473.341.810.30
143-8652009-02Session III, Sample Mount ODP865 (III)396Test #34-278.70-2.6628.1719.530.493.331.820.30
143-8652009-02Session III, Sample Mount ODP865 (III)397Test #39-178.20-2.6728.1519.520.533.221.760.30
143-8652009-02Session III, Sample Mount ODP865 (III)398Test #39-278.20-2.7328.1019.460.413.261.790.30
143-8652009-02Session III, Sample Mount ODP865 (III)399Test #40-178.20-2.2828.5619.920.443.191.760.30
143-8652009-02Session III, Sample Mount ODP865 (III)400Test #40-278.201.901.06low count rate (cavity)
143-8652009-02Session III, Sample Mount ODP865 (III)401Test #41-178.20-1.8329.0320.390.643.151.770.30
143-8652009-02Session III, Sample Mount ODP865 (III)402Test #46-179.60-2.2928.5519.910.423.321.800.30
143-8652009-02Session III, Sample Mount ODP865 (III)403Test #46-279.60-2.8727.9519.320.473.271.790.30
143-8652009-02Session III, Sample Mount ODP865 (III)404Test #47-179.60-2.8427.9919.350.543.251.810.30
143-8652009-02Session III, Sample Mount ODP865 (III)405Test #47-279.60-3.4227.3918.760.453.231.810.30
143-8652009-02Session III, Sample Mount ODP865 (III)410Test #49-180.20-3.0327.7819.110.513.471.820.36
143-8652009-02Session III, Sample Mount ODP865 (III)411Test #49-280.202.961.59low count rate (cavity)
143-8652009-02Session III, Sample Mount ODP865 (III)412Test #50-180.202.171.19low count rate (porosity)
143-8652009-02Session III, Sample Mount ODP865 (III)413Test #50-280.202.061.15low count rate (porosity)
143-8652009-02Session III, Sample Mount ODP865 (III)414Test #50-380.202.991.64low count rate (cavity)
143-8652009-02Session III, Sample Mount ODP865 (III)415Test #50-480.20-2.3828.4619.780.453.181.770.36
143-8652009-02Session III, Sample Mount ODP865 (III)416Test #53-180.20-1.7929.0620.380.503.161.790.36
143-8652009-02Session III, Sample Mount ODP865 (III)417Test #57-181.70-2.4728.3719.690.522.981.720.36
143-8652009-02Session III, Sample Mount ODP865 (III)418Test #59-181.702.921.69low count rate (cavity)
143-8652009-02Session III, Sample Mount ODP865 (III)419Test #59-281.702.921.71inclusion
143-8652009-02Session III, Sample Mount ODP865 (III)424Test #60-181.703.001.57low count rate (cavity)
143-8652009-02Session III, Sample Mount ODP865 (III)425Test #60-281.70-3.2827.5318.890.403.351.750.44
143-8652009-02Session III, Sample Mount ODP865 (III)426Test #60-381.70-3.6827.1118.480.493.451.800.44
143-8652009-02Session III, Sample Mount ODP865 (III)427Test #63-180.70-3.0427.7719.140.373.431.810.44
143-8652009-02Session III, Sample Mount ODP865 (III)428Test #63-280.70-3.7127.0918.460.363.331.780.44
143-8652009-02Session III, Sample Mount ODP865 (III)429Test #65-180.70-3.0527.7619.120.553.171.700.44
143-8652009-02Session III, Sample Mount ODP865 (III)430Test #65-280.702.821.52low count rate (cavity)
143-8652009-02Session III, Sample Mount ODP865 (III)431Test #66-180.70-3.1827.6318.990.443.241.770.44
143-8652009-02Session III, Sample Mount ODP865 (III)432Test #66-280.70-2.8927.9319.290.443.141.720.44
143-8652009-02Session III, Sample Mount ODP865 (III)433Test #67-185.332.971.63pit overlapping epoxy
143-8652009-02Session III, Sample Mount ODP865 (III)434Test #67-285.33-2.6328.2019.560.513.091.730.44
143-8652009-02Session III, Sample Mount ODP865 (III)440Test #68-185.33-3.4127.3918.830.383.251.760.31
143-8652009-02Session III, Sample Mount ODP865 (III)441Test #69-285.33-3.0427.7819.220.533.181.760.31
143-8652009-02Session III, Sample Mount ODP865 (III)442Test #73-191.10-2.9927.8219.260.513.111.750.31
143-8652009-02Session III, Sample Mount ODP865 (III)443Test #75-191.101.911.08low count rate (epoxy)
143-8652009-02Session III, Sample Mount ODP865 (III)444Test #75-291.10-3.3427.4718.910.443.051.750.31
143-8652009-02Session III, Sample Mount ODP865 (III)445Test #76-191.10-2.8128.0219.450.452.931.720.31
143-8652009-02Session III, Sample Mount ODP865 (III)446Test #76-291.10-2.4328.4119.840.512.991.780.31
143-8652009-02Session III, Sample Mount ODP865 (III)447Test #77-191.10-3.1027.7219.160.533.551.830.31
143-8652009-02Session III, Sample Mount ODP865 (III)448Test #77-291.10-3.6727.1218.570.503.651.780.31