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Natland, James H (1982): (Table 4) Geochemistry of glasses in boninite pillow fragments at DSDP Hole 60-458 [dataset]. PANGAEA, https://doi.org/10.1594/PANGAEA.820203, In supplement to: Natland, JH (1982): Crystal morphologies and pyroxene compositions in boninites and tholeiitic basalts from Deep Sea Drilling Project Holes 458 and 459B in the Mariana fore-arc region. In: Hussong, DM; Uyeda, S; et al. (eds.), Initial Reports of the Deep Sea Drilling Project (U.S. Govt. Printing Office), 60, 681-707, https://doi.org/10.2973/dsdp.proc.60.137.1982

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Related to:
Bougault, Henri; Maury, R C; El Azzouzi, M; Joron, Jean Louis; Cotten, Joseph; Treuil, M (1982): Tholeiites, basaltic andesites, and andesites from Leg 60 Sites: geochemistry, mineralogy, and low partition coefficient elements. In: Hussong, DM; Uyeda, S; et al. (eds.), Initial Reports of the Deep Sea Drilling Project (U.S. Govt. Printing Office), 60, 657-677, https://doi.org/10.2973/dsdp.proc.60.135.1982
Meijer, Arend; Anthony, Elizabeth; Reagan, Mark K (1982): Petrology of volcanic rocks from the fore-arc sites. In: Hussong, DM; Uyeda, S; et al. (eds.), Initial Reports of the Deep Sea Drilling Project (U.S. Govt. Printing Office), 60, 709-729, https://doi.org/10.2973/dsdp.proc.60.138.1982
Project(s):
Deep Sea Drilling Project (DSDP)
Coverage:
Latitude: 17.864200 * Longitude: 146.934300
Date/Time Start: 1978-04-18T00:00:00 * Date/Time End: 1978-04-18T00:00:00
Minimum Elevation: -3447.0 m * Maximum Elevation: -3447.0 m
Event(s):
60-458 * Latitude: 17.864200 * Longitude: 146.934300 * Date/Time: 1978-04-18T00:00:00 * Elevation: -3447.0 m * Penetration: 465.5 m * Recovery: 97.6 m * Location: North Pacific/TRENCH * Campaign: Leg60 * Basis: Glomar Challenger * Method/Device: Drilling/drill rig (DRILL) * Comment: 46 cores; 437 m cored; 28.5 m drilled; 22.3 % recovery
Comment:
CIPW norms computed assuming Fe**2+ /Fe**2+ + Fe**3+ = 0.86.
Parameter(s):
#NameShort NameUnitPrincipal InvestigatorMethod/DeviceComment
1 Sample code/labelSample labelNatland, James HDSDP/ODP/IODP sample designation
2 Reference/sourceReferenceNatland, James H
3 IdentificationIDNatland, James H
4 Silicon dioxideSiO2%Natland, James HElectron microprobe (EMP)
5 Aluminium oxideAl2O3%Natland, James HElectron microprobe (EMP)
6 Iron oxide, FeOFeO%Natland, James HElectron microprobe (EMP)Total iron
7 Magnesium oxideMgO%Natland, James HElectron microprobe (EMP)
8 Calcium oxideCaO%Natland, James HElectron microprobe (EMP)
9 Sodium oxideNa2O%Natland, James HElectron microprobe (EMP)Low Na2O result of volatilization. New analysis by J. W. Hawkins has Na2O = 2.29%
10 Potassium oxideK2O%Natland, James HElectron microprobe (EMP)
11 Titanium dioxideTiO2%Natland, James HElectron microprobe (EMP)
12 Phosphorus pentoxideP2O5%Natland, James HElectron microprobe (EMP)
13 TotalTotal%Natland, James HElectron microprobe (EMP)
14 Magnesium numberMg#Natland, James HElectron microprobe (EMP)
15 QuartzQz%Natland, James HCIPW Norm
16 CalciteCal%Natland, James HCIPW Norm
17 OrthoclaseOr%Natland, James HCIPW Norm
18 AlbiteAb%Natland, James HCIPW Norm
19 AnorthiteAn%Natland, James HCIPW Norm
20 WollastoniteWo%Natland, James HCIPW NormDiopside
21 EnstatiteEn%Natland, James HCIPW NormDiopside
22 FerrosiliteFs%Natland, James HCIPW NormDiopside
23 EnstatiteEn%Natland, James HCIPW NormHypersthene
24 FerrosiliteFs%Natland, James HCIPW NormHypersthene
25 MagnetiteFe3O4%Natland, James HCIPW Norm
26 IlmeniteIlm%Natland, James HCIPW Norm
27 ApatiteAp%Natland, James HCIPW Norm
License:
Creative Commons Attribution 3.0 Unported (CC-BY-3.0)
Size:
107 data points

Data

Download dataset as tab-delimited text — use the following character encoding:

1 
Sample label
(DSDP/ODP/IODP sample designation)		2 
Reference		3 
ID		4 
SiO2 [%]
(Electron microprobe (EMP))		5 
Al2O3 [%]
(Electron microprobe (EMP))		6 
FeO [%]
(Total iron, Electron micropro...)		7 
MgO [%]
(Electron microprobe (EMP))		8 
CaO [%]
(Electron microprobe (EMP))		9 
Na2O [%]
(Low Na2O result of volatiliza...)		10 
K2O [%]
(Electron microprobe (EMP))		11 
TiO2 [%]
(Electron microprobe (EMP))		12 
P2O5 [%]
(Electron microprobe (EMP))		13 
Total [%]
(Electron microprobe (EMP))		14 
Mg#
(Electron microprobe (EMP))		15 
Qz [%]
(CIPW Norm)		16 
Cal [%]
(CIPW Norm)		17 
Or [%]
(CIPW Norm)		18 
Ab [%]
(CIPW Norm)		19 
An [%]
(CIPW Norm)		20 
Wo [%]
(Diopside, CIPW Norm)		21 
En [%]
(Diopside, CIPW Norm)		22 
Fs [%]
(Diopside, CIPW Norm)		23 
En [%]
(Hypersthene, CIPW Norm)		24 
Fs [%]
(Hypersthene, CIPW Norm)		25 
Fe3O4 [%]
(CIPW Norm)		26 
Ilm [%]
(CIPW Norm)		27 
Ap [%]
(CIPW Norm)
60-458-28-1,142-146A62.1517.595.451.566.72#1.070.490.260.0595.340.33833.943.202.899.0532.990.000.000.003.877.651.130.500.12
60-458-39-1,23-26Meijer et al. 1982B56.8713.867.676.629.801.800.400.290.0097.310.60613.360.002.3615.2228.548.364.803.190.000.001.580.550.00
60-458-43-2,34-37Meijer et al. 1982C58.6415.388.024.568.741.840.350.520.1798.340.50318.580.002.0715.5632.653.991.981.930.000.001.650.990.39
60-458-44-1,53-56Bougault et al., 1982D61.7218.864.260.645.242.530.560.330.1194.260.21130.324.833.3121.3925.260.000.000.001.595.790.880.630.25