Jarvis, Ian (1985): (Appendix A) Major and trace element composition of basal sediments at DSDP Hole 85-573B [dataset]. PANGAEA, https://doi.org/10.1594/PANGAEA.803566, In supplement to: Jarvis, I (1985): Geochemistry and origin of Eocene-Oligocene metalliferous sediments from the central equatorial Pacific: Deep Sea Drilling Project Sites 573 and 574. In: Mayer, L; Theyer, E; et al. (eds.), Initial Reports of the Deep Sea Drilling Project, Washington (U.S. Govt. Printing Office), 85, 871-804, https://doi.org/10.2973/dsdp.proc.85.124.1985
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Project(s):
Deep Sea Drilling Project (DSDP)
Coverage:
Latitude: 0.498500 * Longitude: -133.309500
Date/Time Start: 1982-04-02T00:00:00 * Date/Time End: 1982-04-02T00:00:00
Minimum Elevation: -4301.0 m * Maximum Elevation: -4301.0 m
Event(s):
85-573B * Latitude: 0.498500 * Longitude: -133.309500 * Date/Time: 1982-04-02T00:00:00 * Elevation: -4301.0 m * Penetration: 529 m * Recovery: 279.7 m * Location: North Pacific/TROUGH * Campaign: Leg85 * Basis: Glomar Challenger * Method/Device: Drilling/drill rig (DRILL) * Comment: 43 cores; 390 m cored; 0 m drilled; 71.7 % recovery
Parameter(s):
| # | Name | Short Name | Unit | Principal Investigator | Method/Device | Comment |
|---|---|---|---|---|---|---|
| 1 | Sample code/label | Sample label | Jarvis, Ian | DSDP/ODP/IODP sample designation | ||
| 2 | Comment | Comment | Jarvis, Ian | |||
| 3 | Silicon dioxide | SiO2 | % | Jarvis, Ian | Phillips PV8210/ICP Emission Spectrometer | |
| 4 | Aluminium oxide | Al2O3 | % | Jarvis, Ian | Phillips PV8210/ICP Emission Spectrometer | |
| 5 | Aluminium oxide | Al2O3 | % | Jarvis, Ian | Phillips PV8210/ICP Emission Spectrometer | HCI-soluble portion |
| 6 | Iron oxide, Fe2O3 | Fe2O3 | % | Jarvis, Ian | Phillips PV8210/ICP Emission Spectrometer | Total iron |
| 7 | Iron oxide, Fe2O3 | Fe2O3 | % | Jarvis, Ian | Phillips PV8210/ICP Emission Spectrometer | Total iron; HCI-soluble portion |
| 8 | Manganese oxide | MnO | % | Jarvis, Ian | Phillips PV8210/ICP Emission Spectrometer | |
| 9 | Manganese oxide | MnO | % | Jarvis, Ian | Phillips PV8210/ICP Emission Spectrometer | HCI-soluble portion |
| 10 | Magnesium oxide | MgO | % | Jarvis, Ian | Phillips PV8210/ICP Emission Spectrometer | |
| 11 | Magnesium oxide | MgO | % | Jarvis, Ian | Phillips PV8210/ICP Emission Spectrometer | HCI-soluble portion |
| 12 | Calcium oxide | CaO | % | Jarvis, Ian | Phillips PV8210/ICP Emission Spectrometer | |
| 13 | Sodium oxide | Na2O | % | Jarvis, Ian | Phillips PV8210/ICP Emission Spectrometer | |
| 14 | Sodium oxide | Na2O | % | Jarvis, Ian | Phillips PV8210/ICP Emission Spectrometer | HCI-soluble portion |
| 15 | Potassium oxide | K2O | % | Jarvis, Ian | Phillips PV8210/ICP Emission Spectrometer | |
| 16 | Potassium oxide | K2O | % | Jarvis, Ian | Phillips PV8210/ICP Emission Spectrometer | HCI-soluble portion |
| 17 | Phosphorus pentoxide | P2O5 | % | Jarvis, Ian | Phillips PV8210/ICP Emission Spectrometer | |
| 18 | Boron | B | mg/kg | Jarvis, Ian | Phillips PV8210/ICP Emission Spectrometer | HCI-soluble portion |
| 19 | Barium | Ba | mg/kg | Jarvis, Ian | Phillips PV8210/ICP Emission Spectrometer | |
| 20 | Barium | Ba | mg/kg | Jarvis, Ian | Phillips PV8210/ICP Emission Spectrometer | HCI-soluble portion |
| 21 | Cerium | Ce | mg/kg | Jarvis, Ian | Phillips PV8210/ICP Emission Spectrometer | |
| 22 | Cobalt | Co | mg/kg | Jarvis, Ian | Phillips PV8210/ICP Emission Spectrometer | |
| 23 | Cobalt | Co | mg/kg | Jarvis, Ian | Phillips PV8210/ICP Emission Spectrometer | HCI-soluble portion |
| 24 | Chromium | Cr | mg/kg | Jarvis, Ian | Phillips PV8210/ICP Emission Spectrometer | |
| 25 | Copper | Cu | mg/kg | Jarvis, Ian | Phillips PV8210/ICP Emission Spectrometer | |
| 26 | Copper | Cu | mg/kg | Jarvis, Ian | Phillips PV8210/ICP Emission Spectrometer | HCI-soluble portion |
| 27 | Lanthanum | La | mg/kg | Jarvis, Ian | Phillips PV8210/ICP Emission Spectrometer | |
| 28 | Lithium | Li | mg/kg | Jarvis, Ian | Phillips PV8210/ICP Emission Spectrometer | |
| 29 | Lithium | Li | mg/kg | Jarvis, Ian | Phillips PV8210/ICP Emission Spectrometer | HCI-soluble portion |
| 30 | Nickel | Ni | mg/kg | Jarvis, Ian | Phillips PV8210/ICP Emission Spectrometer | |
| 31 | Nickel | Ni | mg/kg | Jarvis, Ian | Phillips PV8210/ICP Emission Spectrometer | HCI-soluble portion |
| 32 | Scandium | Sc | mg/kg | Jarvis, Ian | Phillips PV8210/ICP Emission Spectrometer | |
| 33 | Scandium | Sc | mg/kg | Jarvis, Ian | Phillips PV8210/ICP Emission Spectrometer | HCI-soluble portion |
| 34 | Strontium | Sr | mg/kg | Jarvis, Ian | Phillips PV8210/ICP Emission Spectrometer | |
| 35 | Titanium | Ti | mg/kg | Jarvis, Ian | Phillips PV8210/ICP Emission Spectrometer | |
| 36 | Titanium | Ti | mg/kg | Jarvis, Ian | Phillips PV8210/ICP Emission Spectrometer | HCI-soluble portion |
| 37 | Vanadium | V | mg/kg | Jarvis, Ian | Phillips PV8210/ICP Emission Spectrometer | |
| 38 | Vanadium | V | mg/kg | Jarvis, Ian | Phillips PV8210/ICP Emission Spectrometer | HCI-soluble portion |
| 39 | Yttrium | Y | mg/kg | Jarvis, Ian | Phillips PV8210/ICP Emission Spectrometer | |
| 40 | Zinc | Zn | mg/kg | Jarvis, Ian | Phillips PV8210/ICP Emission Spectrometer | |
| 41 | Zinc | Zn | mg/kg | Jarvis, Ian | Phillips PV8210/ICP Emission Spectrometer | HCI-soluble portion |
License:
Creative Commons Attribution 3.0 Unported (CC-BY-3.0)
Size:
958 data points