Henry, Pierre; Kanamatsu, Toshiya; Moe, Kyaw Thu; Expedition 333 Scientists (2012): Electrical conductivity from IODP Hole 333-C0012F [dataset]. SIO7 Data Center, J-CORES Database; Ocean Drilling Program, Center for Deep Earth Exploration (JAMSTEC), PANGAEA, https://doi.org/10.1594/PANGAEA.785944
Always quote citation above when using data! You can download the citation in several formats below.
Related to:
Henry, Pierre; Kanamatsu, Toshiya; Moe, Kyaw Thu; Expedition 333 Scientists (2011): NanTroSEIZE Stage 2: subduction inputs 2 and heat flow. Washington, DC (Integrated Ocean Drilling Program Management International, Inc.), 333, https://doi.org/10.2204/iodp.pr.333.2011
IODP/CDEX (2012): SIO7 Data Center, J-CORES Database. Ocean Drilling Program, Center for Deep Earth Exploration, Japan Agency for Marine-Earth Science and Technology, Yokohama Kanagawa 236-0001, JAPAN, https://www.jamstec.go.jp/sio7/j-cores.data/315/C0001H/
Other version:
IODP Hole 333-C0012F, snapshot taken on 2012-05-08, J-CORES, SIO7 Data Center [dataset]. https://www.jamstec.go.jp/sio7/j-cores.data/333/C0012F/
Project(s):
Coverage:
Latitude: 32.748025 * Longitude: 136.916777
Minimum DEPTH, sediment/rock: 523.15 m * Maximum DEPTH, sediment/rock: 523.15 m
Event(s):
Comment:
Geocode = [m CSF-A] Top Core depth (below sea floor)
Parameter(s):
| # | Name | Short Name | Unit | Principal Investigator | Method/Device | Comment |
|---|---|---|---|---|---|---|
| 1 | Sample code/label | Sample label | Expedition 333 Scientists | DSDP/ODP/IODP sample designation | ||
| 2 | DEPTH, sediment/rock | Depth sed | m | Geocode | ||
| 3 | Depth, top/min | Depth top | m | Expedition 333 Scientists | [m CSF-B] Top Core depth (below sea floor) | |
| 4 | Resistivity along X-axis | Resistivity X | Ohm m | Expedition 333 Scientists | Impedance analysis | |
| 5 | Resistivity along Y-axis | Resistivity Y | Ohm m | Expedition 333 Scientists | Impedance analysis | |
| 6 | Resistivity along Z-axis | Resistivity Z | Ohm m | Expedition 333 Scientists | Impedance analysis | |
| 7 | Conductivity along X-axis | Cond X | S/m | Expedition 333 Scientists | Impedance analysis | |
| 8 | Conductivity along Y-axis | Cond Y | S/m | Expedition 333 Scientists | Impedance analysis | |
| 9 | Conductivity along Z-axis | Cond Z | S/m | Expedition 333 Scientists | Impedance analysis | |
| 10 | Anisotropy, impedance vertical | Aniso imp v | Expedition 333 Scientists | Impedance analysis | ||
| 11 | Anisotropy, impedance horizontal | Aniso imp h | Expedition 333 Scientists | Impedance analysis | ||
| 12 | Temperature, technical | T tech | °C | Expedition 333 Scientists | Impedance analysis | Room temperature |
| 13 | Time Stamp | Time Stamp | Expedition 333 Scientists | Registration |
License:
Creative Commons Attribution 3.0 Unported (CC-BY-3.0)
Size:
12 data points
Data
| 1 Sample label | 2 Depth sed [m] | 3 Depth top [m] | 4 Resistivity X [Ohm m] | 5 Resistivity Y [Ohm m] | 6 Resistivity Z [Ohm m] | 7 Cond X [S/m] | 8 Cond Y [S/m] | 9 Cond Z [S/m] | 10 Aniso imp v | 11 Aniso imp h | 12 T tech [°C] | 13 Time Stamp |
|---|---|---|---|---|---|---|---|---|---|---|---|---|
| 333-C0012F-2R-1,65.0 | 523.15 | 523.15 | 11.905 | 11.111 | 9.434 | 0.084 | 0.09 | 0.106 | -0.069 | -0.197 | 22.8 | 2011-01-09T00:31:22 |