Henry, Pierre; Kanamatsu, Toshiya; Moe, Kyaw Thu; Expedition 333 Scientists (2012): Electrical conductivity from IODP Hole 333-C0012E [dataset]. SIO7 Data Center, J-CORES Database; Ocean Drilling Program, Center for Deep Earth Exploration (JAMSTEC), PANGAEA, https://doi.org/10.1594/PANGAEA.785885
Always quote citation above when using data! You can download the citation in several formats below.
Related to:
Henry, Pierre; Kanamatsu, Toshiya; Moe, Kyaw Thu; Expedition 333 Scientists (2011): NanTroSEIZE Stage 2: subduction inputs 2 and heat flow. Washington, DC (Integrated Ocean Drilling Program Management International, Inc.), 333, https://doi.org/10.2204/iodp.pr.333.2011
IODP/CDEX (2012): SIO7 Data Center, J-CORES Database. Ocean Drilling Program, Center for Deep Earth Exploration, Japan Agency for Marine-Earth Science and Technology, Yokohama Kanagawa 236-0001, JAPAN, https://www.jamstec.go.jp/sio7/j-cores.data/315/C0001H/
Other version:
IODP Hole 333-C0012E, snapshot taken on 2012-05-08, J-CORES, SIO7 Data Center [dataset]. https://www.jamstec.go.jp/sio7/j-cores.data/333/C0012E/
Project(s):
Coverage:
Latitude: 32.748335 * Longitude: 136.917363
Minimum DEPTH, sediment/rock: 500.850 m * Maximum DEPTH, sediment/rock: 526.765 m
Event(s):
Comment:
Geocode = [m CSF-A] Top Core depth (below sea floor)
Parameter(s):
# | Name | Short Name | Unit | Principal Investigator | Method/Device | Comment |
---|---|---|---|---|---|---|
1 | Sample code/label | Sample label | Expedition 333 Scientists | DSDP/ODP/IODP sample designation | ||
2 | DEPTH, sediment/rock | Depth sed | m | Geocode | ||
3 | Depth, top/min | Depth top | m | Expedition 333 Scientists | [m CSF-B] Top Core depth (below sea floor) | |
4 | Resistivity along X-axis | Resistivity X | Ohm m | Expedition 333 Scientists | Impedance analysis | |
5 | Resistivity along Y-axis | Resistivity Y | Ohm m | Expedition 333 Scientists | Impedance analysis | |
6 | Resistivity along Z-axis | Resistivity Z | Ohm m | Expedition 333 Scientists | Impedance analysis | |
7 | Conductivity along X-axis | Cond X | S/m | Expedition 333 Scientists | Impedance analysis | |
8 | Conductivity along Y-axis | Cond Y | S/m | Expedition 333 Scientists | Impedance analysis | |
9 | Conductivity along Z-axis | Cond Z | S/m | Expedition 333 Scientists | Impedance analysis | |
10 | Anisotropy, impedance vertical | Aniso imp v | Expedition 333 Scientists | Impedance analysis | ||
11 | Anisotropy, impedance horizontal | Aniso imp h | Expedition 333 Scientists | Impedance analysis | ||
12 | Temperature, technical | T tech | °C | Expedition 333 Scientists | Impedance analysis | Room temperature |
13 | Time Stamp | Time Stamp | Expedition 333 Scientists | Registration |
License:
Creative Commons Attribution 3.0 Unported (CC-BY-3.0)
Size:
48 data points
Data
1 Sample label | 2 Depth sed [m] | 3 Depth top [m] | 4 Resistivity X [Ohm m] | 5 Resistivity Y [Ohm m] | 6 Resistivity Z [Ohm m] | 7 Cond X [S/m] | 8 Cond Y [S/m] | 9 Cond Z [S/m] | 10 Aniso imp v | 11 Aniso imp h | 12 T tech [°C] | 13 Time Stamp |
---|---|---|---|---|---|---|---|---|---|---|---|---|
333-C0012E-1X-1,85.0 | 500.850 | 500.850 | 1.695 | 1.748 | 3.279 | 0.590 | 0.572 | 0.305 | 0.031 | 0.623 | 23.5 | 2011-01-09T00:31:21 |
333-C0012E-3X-1,94.0 | 519.940 | 519.940 | 2.463 | 2.183 | 3.937 | 0.406 | 0.458 | 0.254 | -0.120 | 0.519 | 23.5 | 2011-01-09T00:31:22 |
333-C0012E-3X-4,94.0 | 522.785 | 522.785 | 2.315 | 2.278 | 3.876 | 0.432 | 0.439 | 0.258 | -0.016 | 0.512 | 23.4 | 2011-01-09T00:31:22 |
333-C0012E-3X-8,67.0 | 526.765 | 526.765 | 9.346 | 9.346 | 9.259 | 0.107 | 0.107 | 0.108 | 0.000 | -0.009 | 23.1 | 2011-01-09T00:31:22 |