Hirono, Tetsuro; Abrams, Lewis J (2002): (Table T2) Wet and dry resistivity along three orthogonal directions of ODP Hole 185-1149B [dataset]. PANGAEA, https://doi.org/10.1594/PANGAEA.784119, In supplement to: Hirono, T; Abrams, LJ (2002): Data report: Electrical resistivity and X-ray computed tomography measurements of sedimentary and igneous units from Hole 801C and Site 1149. In: Ludden, JN; Plank, T; Escutia, C (eds.) Proceedings of the Ocean Drilling Program, Scientific Results, College Station, TX (Ocean Drilling Program), 185, 1-18, https://doi.org/10.2973/odp.proc.sr.185.005.2002
Always quote citation above when using data! You can download the citation in several formats below.
Project(s):
Ocean Drilling Program (ODP)
Coverage:
Latitude: 31.342200 * Longitude: 143.351000
Date/Time Start: 1999-05-26T07:25:00 * Date/Time End: 1999-06-02T20:00:00
Minimum DEPTH, sediment/rock: 203.73 m * Maximum DEPTH, sediment/rock: 398.78 m
Event(s):
185-1149B * Latitude: 31.342200 * Longitude: 143.351000 * Date/Time Start: 1999-05-26T07:25:00 * Date/Time End: 1999-06-02T20:00:00 * Elevation: -5817.5 m * Penetration: 445.2 m * Recovery: 32.93 m * Location: North Pacific Ocean * Campaign: Leg185 * Basis: Joides Resolution * Method/Device: Drilling/drill rig (DRILL) * Comment: 31 core; 284.6 m cored; 151.1 m drilled; 11.6 % recovery
Comment:
Sediment depth is given in mbsf. Lithology and lithologic units are as defined during Leg 185 (Shipboard Scientific Party, 2000, doi:10.2973/odp.proc.ir.185.104.2000).
Parameter(s):
| # | Name | Short Name | Unit | Principal Investigator | Method/Device | Comment |
|---|---|---|---|---|---|---|
| 1 | Sample code/label | Sample label | Hirono, Tetsuro | DSDP/ODP/IODP sample designation | ||
| 2 | DEPTH, sediment/rock | Depth sed | m | Geocode | ||
| 3 | Resistivity along X-axis | Resistivity X | Ohm m | Hirono, Tetsuro | dry | |
| 4 | Resistivity along Y-axis | Resistivity Y | Ohm m | Hirono, Tetsuro | dry | |
| 5 | Resistivity along Z-axis | Resistivity Z | Ohm m | Hirono, Tetsuro | dry | |
| 6 | Resistivity along X-axis | Resistivity X | Ohm m | Hirono, Tetsuro | wet | |
| 7 | Resistivity along Y-axis | Resistivity Y | Ohm m | Hirono, Tetsuro | wet | |
| 8 | Resistivity along Z-axis | Resistivity Z | Ohm m | Hirono, Tetsuro | wet | |
| 9 | Computer tomograph value | CT value | Hirono, Tetsuro | X-ray computed tomography (CT) | average | |
| 10 | Lithologic unit/sequence | Unit | Hirono, Tetsuro |
License:
Creative Commons Attribution 3.0 Unported (CC-BY-3.0)
Size:
54 data points
Data
| 1 Sample label (DSDP/ODP/IODP sample designation) | 2 Depth sed [m] | 3 Resistivity X [Ohm m] (dry) | 4 Resistivity Y [Ohm m] (dry) | 5 Resistivity Z [Ohm m] (dry) | 6 Resistivity X [Ohm m] (wet) | 7 Resistivity Y [Ohm m] (wet) | 8 Resistivity Z [Ohm m] (wet) | 9 CT value (average, X-ray computed tomog...) | 10 Unit |
|---|---|---|---|---|---|---|---|---|---|
| 185-1149B-7R-1,3-5 | 203.73 | 29.8 | 31.5 | 25.2 | 27.6 | 26.5 | 24.0 | 1516 | Unit III (porcellanite) |
| 185-1149B-16R-1,79-81 | 283.09 | 13.7 | 12.6 | 12.3 | 11.3 | 11.9 | 11.1 | 1093 | Unit IV (chalk) |
| 185-1149B-18R-1,15-17 | 301.75 | 17.8 | 11.8 | 15.2 | 12.8 | 9.7 | 10.3 | 1250 | Unit IV (marl) |
| 185-1149B-24R-1,31-33 | 359.51 | 233.3 | 231.8 | 347.6 | 159.9 | 153.9 | 244.3 | 1875 | Unit IV (chert) |
| 185-1149B-27R-1,14-16 | 387.74 | 21.7 | 16.8 | 26.3 | 13.2 | 12.1 | 14.6 | 2234 | Unit IV (marl) |
| 185-1149B-28R-2,36-38 | 398.78 | 20.2 | 14.5 | 24.3 | 13.5 | 14.5 | 17.2 | 2500 | Unit IV (marl) |