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Fujioka, Kantaro; Nishimura, Akira; Matsuo, Yoshiko; Rodolfo, Kelvin S (1992): (Appendix) Geochemistry of ODP Leg 126 tephra samples [dataset]. PANGAEA, https://doi.org/10.1594/PANGAEA.770484, In supplement to: Fujioka, K et al. (1992): Correlation of Quaternary tephras throughout the Izu-Bonin areas. In: Taylor, B; Fujioka, K.; et al. (eds.), Proceedings of the Ocean Drilling Program, Scientific Results, College Station, TX (Ocean Drilling Program), 126, 23-45, https://doi.org/10.2973/odp.proc.sr.126.116.1992

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Project(s):
Coverage:
Median Latitude: 30.916200 * Median Longitude: 139.888700 * South-bound Latitude: 30.910900 * West-bound Longitude: 139.837000 * North-bound Latitude: 30.922000 * East-bound Longitude: 140.003800
Date/Time Start: 1989-04-29T15:56:00 * Date/Time End: 1989-05-15T03:15:00
Minimum Elevation: -2279.0 m * Maximum Elevation: -1113.0 m
Event(s):
126-788C * Latitude: 30.922000 * Longitude: 140.003800 * Date/Time Start: 1989-05-14T01:20:00 * Date/Time End: 1989-05-15T03:15:00 * Elevation: -1113.0 m * Penetration: 262.5 m * Recovery: 146.15 m * Location: Philippine Sea * Campaign: Leg126 * Basis: Joides Resolution * Method/Device: Drilling/drill rig (DRILL) * Comment: 28 cores; 258.5 m cored; 0 m drilled; 56.5 % recovery
126-790A * Latitude: 30.915400 * Longitude: 139.843900 * Date/Time Start: 1989-04-29T15:56:00 * Date/Time End: 1989-04-30T06:30:00 * Elevation: -2233.0 m * Penetration: 37.4 m * Recovery: 35.71 m * Location: Philippine Sea * Campaign: Leg126 * Basis: Joides Resolution * Method/Device: Drilling/drill rig (DRILL) * Comment: 4 cores; 37.4 m cored; 0 m drilled; 95.5 % recovery
126-790C * Latitude: 30.910900 * Longitude: 139.837000 * Date/Time Start: 1989-05-01T11:15:00 * Date/Time End: 1989-05-04T07:15:00 * Elevation: -2234.0 m * Penetration: 387.1 m * Recovery: 127.32 m * Location: Philippine Sea * Campaign: Leg126 * Basis: Joides Resolution * Method/Device: Drilling/drill rig (DRILL) * Comment: 33 cores; 302.1 m cored; 0 m drilled; 42.1 % recovery
Parameter(s):
#NameShort NameUnitPrincipal InvestigatorMethod/DeviceComment
1Event labelEvent
2Sample code/labelSample labelFujioka, KantaroDSDP/ODP/IODP sample designation
3Sample commentSample commentFujioka, Kantaro
4Silicon dioxideSiO2%Fujioka, KantaroElectron microprobe (EMP)
5Silicon dioxide, standard deviationSiO2 std dev±Fujioka, KantaroElectron microprobe (EMP)
6Titanium dioxideTiO2%Fujioka, KantaroElectron microprobe (EMP)
7Titanium dioxide, standard deviationTiO2 std dev±Fujioka, KantaroElectron microprobe (EMP)
8Aluminium oxideAl2O3%Fujioka, KantaroElectron microprobe (EMP)
9Aluminium oxide, standard deviationAl2O3 std dev±Fujioka, KantaroElectron microprobe (EMP)
10Iron oxide, FeOFeO%Fujioka, KantaroElectron microprobe (EMP)
11Iron oxide, FeO, standard deviationFeO std dev±Fujioka, KantaroElectron microprobe (EMP)
12Manganese oxideMnO%Fujioka, KantaroElectron microprobe (EMP)
13Manganese oxide, standard deviationMnO std dev±Fujioka, KantaroElectron microprobe (EMP)
14Magnesium oxideMgO%Fujioka, KantaroElectron microprobe (EMP)
15Magnesium oxide, standard deviationMgO std dev±Fujioka, KantaroElectron microprobe (EMP)
16Calcium oxideCaO%Fujioka, KantaroElectron microprobe (EMP)
17Calcium oxide, standard deviationCaO std dev±Fujioka, KantaroElectron microprobe (EMP)
18Sodium oxideNa2O%Fujioka, KantaroElectron microprobe (EMP)
19Sodium oxide, standard deviationNa2O std dev±Fujioka, KantaroElectron microprobe (EMP)
20Potassium oxideK2O%Fujioka, KantaroElectron microprobe (EMP)
21Potassium oxide, standard deviationK2O std dev±Fujioka, KantaroElectron microprobe (EMP)
22Elements, totalTotal%Fujioka, KantaroElectron microprobe (EMP)
23Standard deviationStd dev±Fujioka, KantaroElectron microprobe (EMP)
24AlkaliAlkali%Fujioka, KantaroElectron microprobe (EMP)
25Alkali, standard deviationAlkali std dev±Fujioka, KantaroElectron microprobe (EMP)
26Chromium(III) oxideCr2O3%Fujioka, KantaroElectron microprobe (EMP)
27Chromium(III) oxide, standard deviationCr2O3 std dev±Fujioka, KantaroElectron microprobe (EMP)
28Vanadium oxideV2O5%Fujioka, KantaroElectron microprobe (EMP)
29Vanadium, standard deviationV std dev±Fujioka, KantaroElectron microprobe (EMP)
30Nickel oxideNiO%Fujioka, KantaroElectron microprobe (EMP)
31Nickel oxide, standard deviationNiO std dev±Fujioka, KantaroElectron microprobe (EMP)
Size:
18190 data points

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