Fisk, Martin R; Howard, Katherine J (1990): (Table 4) Chemistry of olivine microphenocrysts of ODP Hole 115-706C [dataset]. PANGAEA, https://doi.org/10.1594/PANGAEA.755750, In supplement to: Fisk, MR; Howard, KJ (1990): Primary mineralogy of Leg 115 basalts. In: Duncan, RA; Backmann, J; Peterson, LC; et al. (eds.), Proceedings of the Ocean Drilling Program, Scientific Results, College Station, TX (Ocean Drilling Program), 115, 23-42, https://doi.org/10.2973/odp.proc.sr.115.122.1990
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Project(s):
Ocean Drilling Program (ODP)
Coverage:
Latitude: -13.114000 * Longitude: 61.371000
Date/Time Start: 1987-05-24T03:30:00 * Date/Time End: 1987-05-26T00:45:00
Minimum DEPTH, sediment/rock: 75.72 m * Maximum DEPTH, sediment/rock: 76.64 m
Event(s):
115-706C * Latitude: -13.114000 * Longitude: 61.371000 * Date/Time Start: 1987-05-24T03:30:00 * Date/Time End: 1987-05-26T00:45:00 * Elevation: -2518.0 m * Penetration: 121.7 m * Recovery: 19.72 m * Location: South Indian Ridge, South Indian Ocean * Campaign: Leg115 * Basis: Joides Resolution * Method/Device: Drilling/drill rig (DRILL) * Comment: 8 cores; 77.4 m cored; 0 m drilled; 25.5 % recovery
Parameter(s):
| # | Name | Short Name | Unit | Principal Investigator | Method/Device | Comment |
|---|---|---|---|---|---|---|
| 1 | Sample code/label | Sample label | Fisk, Martin R | DSDP/ODP/IODP sample designation | ||
| 2 | Lithologic unit/sequence | Unit | Fisk, Martin R | |||
| 3 | DEPTH, sediment/rock | Depth sed | m | Geocode | ||
| 4 | Number | No | Fisk, Martin R | |||
| 5 | Silicon dioxide | SiO2 | % | Fisk, Martin R | Electron microprobe (EMP) | |
| 6 | Iron oxide, FeO | FeO | % | Fisk, Martin R | Electron microprobe (EMP) | |
| 7 | Manganese oxide | MnO | % | Fisk, Martin R | Electron microprobe (EMP) | |
| 8 | Magnesium oxide | MgO | % | Fisk, Martin R | Electron microprobe (EMP) | |
| 9 | Nickel oxide | NiO | % | Fisk, Martin R | Electron microprobe (EMP) | |
| 10 | Sum | Sum | % | Fisk, Martin R | Electron microprobe (EMP) | |
| 11 | Forsterite | Fo | % | Fisk, Martin R | Electron microprobe (EMP) |
License:
Creative Commons Attribution 3.0 Unported (CC-BY-3.0)
Size:
70 data points
Data
| 1 Sample label | 2 Unit | 3 Depth sed [m] | 4 No | 5 SiO2 [%] | 6 FeO [%] | 7 MnO [%] | 8 MgO [%] | 9 NiO [%] | 10 Sum [%] | 11 Fo [%] |
|---|---|---|---|---|---|---|---|---|---|---|
| 115-706C-5R-2,102-105 | 1 | 75.72 | 1 | 37.20 | 28.52 | 0.43 | 32.07 | 0.11 | 98.32 | 66.3 |
| 115-706C-5R-2,102-105 | 1 | 75.72 | 2 | 37.38 | 28.97 | 0.50 | 31.69 | 0.11 | 98.64 | 65.7 |
| 115-706C-5R-2,102-105 | 1 | 75.72 | 3 | 37.85 | 28.29 | 0.48 | 31.94 | 0.11 | 98.66 | 66.4 |
| 115-706C-5R-2,102-105 | 1 | 75.72 | 4 | 36.06 | 28.38 | 0.47 | 32.65 | 0.12 | 97.68 | 66.8 |
| 115-706C-5R-3,44-48 | 1 | 76.64 | 1 | 36.90 | 28.65 | 0.46 | 32.47 | 0.17 | 98.65 | 66.4 |
| 115-706C-5R-3,44-48 | 1 | 76.64 | 2 | 36.75 | 27.78 | 0.40 | 32.59 | 0.11 | 97.64 | 67.3 |
| 115-706C-5R-3,44-48 | 1 | 76.64 | 3 | 36.54 | 28.35 | 0.45 | 32.05 | 0.11 | 97.51 | 66.4 |