Plechov, Pavel Yu; Shishkina, T A; Ermakov, V A; Portnyagin, Maxim V (2008): (Table 4) Compositions of minerals and glass from groundmass of allivalites [dataset]. PANGAEA, https://doi.org/10.1594/PANGAEA.744589, In: Plechov, PY et al. (2008): Composition of melts and minerals from volcanic rocks of the Kuril-Kamchatka Arc [dataset publication series]. PANGAEA, https://doi.org/10.1594/PANGAEA.744594
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Published: 2008 (exact date unknown) • DOI registered: 2010-09-17
Related to:
Plechov, Pavel Yu; Shishkina, T A; Ermakov, V A; Portnyagin, Maxim V (2008): Formation conditions of allivalites, olivine-anorthite crystal enclaves, in volcanics of the Kuril-Kamchatka Arc. Petrologiya, 16(3), 232-260, https://doi.org/10.1134/S0869591108030028
Project(s):
Archive of Ocean Data (ARCOD)
Coverage:
Median Latitude: 47.014567 * Median Longitude: 150.624000 * South-bound Latitude: 43.843100 * West-bound Longitude: 145.505600 * North-bound Latitude: 51.816700 * East-bound Longitude: 157.553300
Event(s):
Comment:
0 = below detection liumit.
Parameter(s):
| # | Name | Short Name | Unit | Principal Investigator | Method/Device | Comment |
|---|---|---|---|---|---|---|
| 1 | Event label | Event | ||||
| 2 | Latitude of event | Latitude | ||||
| 3 | Longitude of event | Longitude | ||||
| 4 | Sample code/label | Sample label | Plechov, Pavel Yu | |||
| 5 | Area/locality | Area | Plechov, Pavel Yu | |||
| 6 | Number of observations | NOBS | # | Plechov, Pavel Yu | ||
| 7 | Sample type | Samp type | Plechov, Pavel Yu | |||
| 8 | Silicon dioxide | SiO2 | % | Plechov, Pavel Yu | Analytical electron microscopy (AEM) | |
| 9 | Silicon dioxide, standard deviation | SiO2 std dev | ± | Plechov, Pavel Yu | Calculated | |
| 10 | Titanium dioxide | TiO2 | % | Plechov, Pavel Yu | Analytical electron microscopy (AEM) | |
| 11 | Titanium dioxide, standard deviation | TiO2 std dev | ± | Plechov, Pavel Yu | Calculated | |
| 12 | Aluminium oxide | Al2O3 | % | Plechov, Pavel Yu | Analytical electron microscopy (AEM) | |
| 13 | Aluminium oxide, standard deviation | Al2O3 std dev | ± | Plechov, Pavel Yu | Calculated | |
| 14 | Iron oxide, FeO | FeO | % | Plechov, Pavel Yu | Analytical electron microscopy (AEM) | total |
| 15 | Iron oxide, FeO, standard deviation | FeO std dev | ± | Plechov, Pavel Yu | Calculated | |
| 16 | Manganese oxide | MnO | % | Plechov, Pavel Yu | Analytical electron microscopy (AEM) | |
| 17 | Manganese oxide, standard deviation | MnO std dev | ± | Plechov, Pavel Yu | Calculated | |
| 18 | Magnesium oxide | MgO | % | Plechov, Pavel Yu | Analytical electron microscopy (AEM) | |
| 19 | Magnesium oxide, standard deviation | MgO std dev | ± | Plechov, Pavel Yu | Calculated | |
| 20 | Calcium oxide | CaO | % | Plechov, Pavel Yu | Analytical electron microscopy (AEM) | |
| 21 | Calcium oxide, standard deviation | CaO std dev | ± | Plechov, Pavel Yu | Calculated | |
| 22 | Sodium oxide | Na2O | % | Plechov, Pavel Yu | Analytical electron microscopy (AEM) | |
| 23 | Sodium oxide, standard deviation | Na2O std dev | ± | Plechov, Pavel Yu | Calculated | |
| 24 | Potassium oxide | K2O | % | Plechov, Pavel Yu | Analytical electron microscopy (AEM) | |
| 25 | Potassium oxide, standard deviation | K2O std dev | ± | Plechov, Pavel Yu | Calculated | |
| 26 | Chromium(III) oxide | Cr2O3 | % | Plechov, Pavel Yu | Analytical electron microscopy (AEM) | |
| 27 | Chromium(III) oxide, standard deviation | Cr2O3 std dev | ± | Plechov, Pavel Yu | Calculated | |
| 28 | Nickel oxide | NiO | % | Plechov, Pavel Yu | Analytical electron microscopy (AEM) | |
| 29 | Nickel oxide, standard deviation | NiO std dev | ± | Plechov, Pavel Yu | Calculated | |
| 30 | Phosphorus pentoxide | P2O5 | % | Plechov, Pavel Yu | Analytical electron microscopy (AEM) | |
| 31 | Phosphorus pentoxide, standard deviation | P2O5 std dev | ± | Plechov, Pavel Yu | Calculated | |
| 32 | Sulfur, total | TS | % | Plechov, Pavel Yu | Analytical electron microscopy (AEM) | |
| 33 | Sulfur, standard deviation | S std dev | ± | Plechov, Pavel Yu | Calculated | |
| 34 | Chlorine | Cl | % | Plechov, Pavel Yu | Analytical electron microscopy (AEM) | |
| 35 | Chlorine, standard deviation | Cl std dev | ± | Plechov, Pavel Yu | Calculated | |
| 36 | Sum | Sum | % | Plechov, Pavel Yu | Calculated |
License:
Creative Commons Attribution 3.0 Unported (CC-BY-3.0)
Size:
374 data points