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Sakamoto, Tatsuhiko; Janecek, Thomas R; Emeis, Kay-Christian (2010): (Table 967ARMCD) Color reflectance data sets of Hole 160-967A. PANGAEA, https://doi.org/10.1594/PANGAEA.733467, Supplement to: Sakamoto, T et al. (1998): Continuous sedimentary sequences from the Eastern Mediterranean Sea: composite depth sections. In: Robertson, AHF; Emeis, K-C; Richter, C; Camerlenghi, A (eds.), Proceedings of the Ocean Drilling Program, Scientific Results, 160: College Station, TX (Ocean Drilling Program), 160, 37-59, https://doi.org/10.2973/odp.proc.sr.160.053.1998

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Abstract:
We have developed revised postcruise composite depth sections over the ~100-m-long, Pliocene-Holocene sediment sequences at four paleoceanographic sites (Site 964: Ionian Basin; Sites 966 and 967: Eratosthenes Seamount; Site 969: Mediterranean Ridge), which are located in different tectonic and oceanographic settings and water depths in the Eastern Mediterranean Sea. These revised composite sections were constructed using correlation intervals of a few centimeters instead of the 1- to 10-m intervals used in the shipboard composite construction procedure. These revised composite depth sections now take into account differential stretching and squeezing within a core and correct depth differences between holes caused by coring artifact and tectonic disturbances that resulted in attenuated and incomplete sections. The revised composite depth sections were constructed by combining digitized color images of split cores, visual core descriptions from shipboard operations, and color reflectance measurements with a 2-cm sampling resolution. The detailed revised depth sequences not only enable us to correlate sapropels between holes, but also other lithofacies, such as pale nannofossil oozes, reddish oozes, dark clays, and ash layers. Depending on the location of the drill site, over 80 individual sapropels are recognized in the revised composite depth sections. During Leg 160, use of the advanced piston coring system on the JOIDES Resolution typically resulted in an average gap between cores of 1-2 m, with a maximum of 8 m. Gaps within cores, resulting from faulting, slumping, or mass flows, also averaged 1-2 m in length. These revised composite depth sections can be used as starting points for the development of highresolution time scales and paleoceanographic time series in the Mediterranean.
Related to:
Heslop, David; von Dobeneck, Tilo; Höcker, Mathias (2007): Using non-negative matrix factorization in the unmixing of diffuse reflectance spectra. Marine Geology, 241(1-4), 63-78, https://doi.org/10.1016/j.margeo.2007.03.004
Coverage:
Latitude: 34.068300 * Longitude: 32.725300
Date/Time Start: 1995-04-01T23:50:00 * Date/Time End: 1995-04-02T11:40:00
Minimum DEPTH, sediment/rock: 0.02 m * Maximum DEPTH, sediment/rock: 120.12 m
Event(s):
160-967A * Latitude: 34.068300 * Longitude: 32.725300 * Date/Time Start: 1995-04-01T23:50:00 * Date/Time End: 1995-04-02T11:40:00 * Elevation: -2553.0 m * Penetration: 141.3 m * Recovery: 142.14 m * Location: Eastern Basin * Campaign: Leg160 * Basis: Joides Resolution * Device: Drilling/drill rig (DRILL) * Comment: 16 cores; 141.3 m cored; 0 m drilled; 100.6 % recovery
Parameter(s):
#NameShort NameUnitPrincipal InvestigatorMethodComment
1DEPTH, sediment/rockDepthmGeocode
2Depth, composite revisedDepth crrmcdSakamoto, TatsuhikoSpectrophotometer Minolta CM-2002
3Sample code/labelSample labelSakamoto, TatsuhikoSpectrophotometer Minolta CM-2002
4Color, L*, lightnessL*Sakamoto, TatsuhikoSpectrophotometer Minolta CM-2002
5Color, a*a*Sakamoto, TatsuhikoSpectrophotometer Minolta CM-2002
6Color, b*b*Sakamoto, TatsuhikoSpectrophotometer Minolta CM-2002
7Color code HLS-systemColor HLSSakamoto, TatsuhikoSpectrophotometer Minolta CM-2002Munsell (hue)
8Color code HLS-systemColor HLSSakamoto, TatsuhikoSpectrophotometer Minolta CM-2002Munsell (value)
9Color code HLS-systemColor HLSSakamoto, TatsuhikoSpectrophotometer Minolta CM-2002Munsell (chroma)
10Color reflectance at 400 nm wavelengthColor 400%Sakamoto, TatsuhikoSpectrophotometer Minolta CM-2002
11Color reflectance at 410 nm wavelengthColor 410%Sakamoto, TatsuhikoSpectrophotometer Minolta CM-2002
12Color reflectance at 420 nm wavelengthColor 420%Sakamoto, TatsuhikoSpectrophotometer Minolta CM-2002
13Color reflectance at 430 nm wavelengthColor 430%Sakamoto, TatsuhikoSpectrophotometer Minolta CM-2002
14Color reflectance at 440 nm wavelengthColor 440%Sakamoto, TatsuhikoSpectrophotometer Minolta CM-2002
15Color reflectance at 450 nm wavelengthColor 450%Sakamoto, TatsuhikoSpectrophotometer Minolta CM-2002
16Color reflectance at 460 nm wavelengthColor 460%Sakamoto, TatsuhikoSpectrophotometer Minolta CM-2002
17Color reflectance at 470 nm wavelengthColor 470%Sakamoto, TatsuhikoSpectrophotometer Minolta CM-2002
18Color reflectance at 480 nm wavelengthColor 480%Sakamoto, TatsuhikoSpectrophotometer Minolta CM-2002
19Color reflectance at 490 nm wavelengthColor 490%Sakamoto, TatsuhikoSpectrophotometer Minolta CM-2002
20Color reflectance at 500 nm wavelengthColor 500%Sakamoto, TatsuhikoSpectrophotometer Minolta CM-2002
21Color reflectance at 510 nm wavelengthColor 510%Sakamoto, TatsuhikoSpectrophotometer Minolta CM-2002
22Color reflectance at 520 nm wavelengthColor 520%Sakamoto, TatsuhikoSpectrophotometer Minolta CM-2002
23Color reflectance at 530 nm wavelengthColor 530%Sakamoto, TatsuhikoSpectrophotometer Minolta CM-2002
24Color reflectance at 540 nm wavelengthColor 540%Sakamoto, TatsuhikoSpectrophotometer Minolta CM-2002
25Color reflectance at 550 nm wavelengthColor 550%Sakamoto, TatsuhikoSpectrophotometer Minolta CM-2002
26Color reflectance at 560 nm wavelengthColor 560%Sakamoto, TatsuhikoSpectrophotometer Minolta CM-2002
27Color reflectance at 570 nm wavelengthColor 570%Sakamoto, TatsuhikoSpectrophotometer Minolta CM-2002
28Color reflectance at 580 nm wavelengthColor 580%Sakamoto, TatsuhikoSpectrophotometer Minolta CM-2002
29Color reflectance at 590 nm wavelengthColor 590%Sakamoto, TatsuhikoSpectrophotometer Minolta CM-2002
30Color reflectance at 600 nm wavelengthColor 600%Sakamoto, TatsuhikoSpectrophotometer Minolta CM-2002
31Color reflectance at 610 nm wavelengthColor 610%Sakamoto, TatsuhikoSpectrophotometer Minolta CM-2002
32Color reflectance at 620 nm wavelengthColor 620%Sakamoto, TatsuhikoSpectrophotometer Minolta CM-2002
33Color reflectance at 630 nm wavelengthColor 630%Sakamoto, TatsuhikoSpectrophotometer Minolta CM-2002
34Color reflectance at 640 nm wavelengthColor 640%Sakamoto, TatsuhikoSpectrophotometer Minolta CM-2002
35Color reflectance at 650 nm wavelengthColor 650%Sakamoto, TatsuhikoSpectrophotometer Minolta CM-2002
36Color reflectance at 660 nm wavelengthColor 660%Sakamoto, TatsuhikoSpectrophotometer Minolta CM-2002
37Color reflectance at 670 nm wavelengthColor 670%Sakamoto, TatsuhikoSpectrophotometer Minolta CM-2002
38Color reflectance at 680 nm wavelengthColor 680%Sakamoto, TatsuhikoSpectrophotometer Minolta CM-2002
39Color reflectance at 690 nm wavelengthColor 690%Sakamoto, TatsuhikoSpectrophotometer Minolta CM-2002
40Color reflectance at 700 nm wavelengthColor 700%Sakamoto, TatsuhikoSpectrophotometer Minolta CM-2002
Size:
230490 data points

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