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McHugh, Cecilia M G; Snyder, Scott W; Miller, Kenneth G (1998): Major oxides for tektites and for conglomerate clast of the Upper Eocene ejecta-bearing layer of ODP Hole 150-904A (Table 1) [dataset]. PANGAEA, https://doi.org/10.1594/PANGAEA.711490, Supplement to: McHugh, CMG et al. (1998): Upper Eocene ejecta of the New Jersey continental margin reveal dynamics of Chesapeake Bay impact. Earth and Planetary Science Letters, 160(3-4), 353-367, https://doi.org/10.1016/S0012-821X(98)00096-X

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Abstract:
Evidence for the Chesapeake Bay Crater as the source for New Jersey continental margin ejecta is provided by fine-grained tektites and coarse-grained unmelted ejecta. The Upper Eocene ejecta deposit, now demonstrated to be part of the North American strewn field, occurs on the New Jersey continental margin at Ocean Drilling Program (ODP) Sites 904 and 903. The mineralogy, major oxide composition of the ejecta materials, and biostratigraphic age of the enclosing sediments link the origin of these ejecta to the recently recognized Chesapeake Bay impact crater, located only 330 km away. Sediments associated with the ejecta provide information about the dynamics of impact events. The 35-cm-thick ejecta-bearing layer can be subdivided into three subunits that indicate a sequence of events. Bottom subunit III documents sediment failure and deposition of gravel-sized fragments, middle subunit II records deposition of abundant sand-sized ejecta by gravity settling, and upper subunit I contains a 12-cm-thick sedimentary deposit containing rare silt-sized tektites and evidence of waning currents. These events are interpreted by linking sediment deposition to seismic ground motion and subsequent tsunami waves triggered by both the Chesapeake Bay impact and slope failures.
Project(s):
Coverage:
Latitude: 38.863400 * Longitude: -72.768100
Date/Time Start: 1993-06-30T22:30:00 * Date/Time End: 1993-07-04T06:30:00
Minimum ORDINAL NUMBER: 1 * Maximum ORDINAL NUMBER: 31
Event(s):
150-904A * Latitude: 38.863400 * Longitude: -72.768100 * Date/Time Start: 1993-06-30T22:30:00 * Date/Time End: 1993-07-04T06:30:00 * Elevation: -1134.0 m * Penetration: 576.7 m * Recovery: 557.55 m * Location: South Atlantic Ocean * Campaign: Leg150 * Basis: Joides Resolution * Method/Device: Drilling/drill rig (DRILL) * Comment: 62 cores; 576.7 m cored; 0 m drilled; 96.7 % recovery
Parameter(s):
#NameShort NameUnitPrincipal InvestigatorMethod/DeviceComment
1ORDINAL NUMBEROrd NoGeocode
2Sample code/labelSample labelMcHugh, Cecilia M GDSDP/ODP/IODP sample designation
3Sample code/label 2Sample label 2McHugh, Cecilia M G
4NumberNoMcHugh, Cecilia M Gof analyses
5Sample commentSample commentMcHugh, Cecilia M G
6Silicon dioxideSiO2%McHugh, Cecilia M GElectron microprobe (EMP)
7Silicon dioxide, standard deviationSiO2 std dev±McHugh, Cecilia M GElectron microprobe (EMP)
8Aluminium oxideAl2O3%McHugh, Cecilia M GElectron microprobe (EMP)
9Aluminium oxide, standard deviationAl2O3 std dev±McHugh, Cecilia M GElectron microprobe (EMP)
10Iron oxide, FeOFeO%McHugh, Cecilia M GElectron microprobe (EMP)
11Iron oxide, FeO, standard deviationFeO std dev±McHugh, Cecilia M GElectron microprobe (EMP)
12Magnesium oxideMgO%McHugh, Cecilia M GElectron microprobe (EMP)
13Magnesium oxide, standard deviationMgO std dev±McHugh, Cecilia M GElectron microprobe (EMP)
14Calcium oxideCaO%McHugh, Cecilia M GElectron microprobe (EMP)
15Calcium oxide, standard deviationCaO std dev±McHugh, Cecilia M GElectron microprobe (EMP)
16Sodium oxideNa2O%McHugh, Cecilia M GElectron microprobe (EMP)
17Sodium oxide, standard deviationNa2O std dev±McHugh, Cecilia M GElectron microprobe (EMP)
18Potassium oxideK2O%McHugh, Cecilia M GElectron microprobe (EMP)
19Potassium oxide, standard deviationK2O std dev±McHugh, Cecilia M GElectron microprobe (EMP)
20Titanium dioxideTiO2%McHugh, Cecilia M GElectron microprobe (EMP)
21Titanium dioxide, standard deviationTiO2 std dev±McHugh, Cecilia M GElectron microprobe (EMP)
22Manganese oxideMnO%McHugh, Cecilia M GElectron microprobe (EMP)
23Manganese oxide, standard deviationMnO std dev±McHugh, Cecilia M GElectron microprobe (EMP)
24Phosphorus pentoxideP2O5%McHugh, Cecilia M GElectron microprobe (EMP)
25Phosphorus pentoxide, standard deviationP2O5 std dev±McHugh, Cecilia M GElectron microprobe (EMP)
26Chromium(III) oxideCr2O3%McHugh, Cecilia M GElectron microprobe (EMP)
27Chromium(III) oxide, standard deviationCr2O3 std dev±McHugh, Cecilia M GElectron microprobe (EMP)
Size:
663 data points

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