/* DATA DESCRIPTION: Citation: Nizou, Jean; Hanebuth, Till J J; Vogt, Christoph (2011): Concentrations (mg/kg) of terrigenous elements (i.e., Al, Fe, K, Ti and Si) in the 18-63 µm-sub-fraction of 16 samples from Core GeoB9504-3 determined by XRF powder measurement and ICP-OES. PANGAEA, https://doi.org/10.1594/PANGAEA.708646, In supplement to: Nizou, J et al. (2011): Deciphering signals of late Holocene fluvial and aeolian supply from a shelf sediment depocentre off Senegal (north-west Africa). Journal of Quaternary Science, 26(4), 411-421, https://doi.org/10.1002/jqs.1467 Project(s): Center for Marine Environmental Sciences (MARUM) (URI: https://www.marum.de/en/) Coverage: LATITUDE: 15.876500 * LONGITUDE: -16.675000 DATE/TIME START: 2005-06-13T17:58:00 * DATE/TIME END: 2005-06-13T17:58:00 MINIMUM DEPTH, sediment/rock: 0.03 m * MAXIMUM DEPTH, sediment/rock: 5.53 m Event(s): GeoB9504-3 (289) * LATITUDE: 15.876500 * LONGITUDE: -16.675000 * DATE/TIME: 2005-06-13T17:58:00 * ELEVATION: -43.0 m * Recovery: 5.6 m * CAMPAIGN: M65/1 (URI: https://doi.org/10.2312/cr_m65) * BASIS: Meteor (1986) (URI: https://en.wikipedia.org/wiki/RV_Meteor_(1986)) * METHOD/DEVICE: Gravity corer (Kiel type) (SL) * COMMENT: geology, 560 cm, overpenetrated Comment: Only the terrigenous fraction of the sediment was analyzed, i.e., organic matter, carbonate and biogenic opal were removed chemically before measurement. Precision on ICP-OES measurements is 2%. Samples smaller than 1 g could not be analyzed with the XRF powder measurement device. Parameter(s): DEPTH, sediment/rock [m] (Depth sed) * GEOCODE Aluminium [mg/kg] (Al) * PI: Enneking, Karsten * METHOD/DEVICE: ICP-OES, Inductively coupled plasma - optical emission spectrometry Potassium [mg/kg] (K) * PI: Enneking, Karsten * METHOD/DEVICE: ICP-OES, Inductively coupled plasma - optical emission spectrometry Titanium [mg/kg] (Ti) * PI: Enneking, Karsten * METHOD/DEVICE: ICP-OES, Inductively coupled plasma - optical emission spectrometry Iron [mg/kg] (Fe) * PI: Enneking, Karsten * METHOD/DEVICE: ICP-OES, Inductively coupled plasma - optical emission spectrometry Silicon [mg/kg] (Si) * PI: Enneking, Karsten * METHOD/DEVICE: X-ray fluorescence (XRF) * COMMENT: XRF powder measurement License: Creative Commons Attribution 3.0 Unported (CC-BY-3.0) (URI: https://creativecommons.org/licenses/by/3.0/) Size: 73 data points */ Depth sed [m] Al [mg/kg] K [mg/kg] Ti [mg/kg] Fe [mg/kg] Si [mg/kg] 0.03 21300 13700 4320 7130 374900 0.08 21600 13970 4600 7440 374100 2.23 23249 14111 4837 9368 312500 2.28 22800 14200 4660 8950 368000 2.58 23877 14517 4448 9554 316700 3.33 26380 15647 2959 12314 3.38 29093 15174 4164 20050 3.68 28600 16000 4080 14080 345800 3.78 28500 16280 3710 13470 3.88 29900 15860 3970 14510 4.48 28900 15910 4000 18750 4.58 24567 13189 3347 12019 4.63 27500 15850 3500 13650 4.88 27800 16060 3590 16040 343500 4.98 28562 15135 3641 22101 282000 5.53 28000 15510 3190 18910 334300