/* DATA DESCRIPTION: Citation: Strand, Kari O; Passchier, Sandra; Näsi, Jari (2003): Quartz grain microtextures of sediments from ODP Hole 188-1166A (Table 1). PANGAEA, https://doi.org/10.1594/PANGAEA.705274, Supplement to: Strand, KO et al. (2003): Implications of quartz grain microtextures for onset Eocene/Oligocene glaciation in Prydz Bay, ODP Site 1166, Antarctica. Palaeogeography, Palaeoclimatology, Palaeoecology, 198(1-2), 101-111, https://doi.org/10.1016/S0031-0182(03)00396-1 Abstract: This paper presents the results of the scanning electron microscopic (SEM) analysis of quartz grains from a selection of samples at Site 1166. Ocean Drilling Program Leg 188 drilled Site 1166 on the Prydz Bay continental shelf, Antarctica, to document onset and fluctuations of East-Antarctic glaciation. This site recovered Upper Pliocene-Holocene glacial sediments directly above Cretaceous through Lower Oligocene sediments recording the transition from preglacial to early glacial conditions. SEM analysis of quartz grains at Site 1166 was used to characterize the glacial and preglacial sediments by their diagnostic textures. Angular edges, edge abrasion as well as arcuate to straight steps, are the most frequent features in glacial deposits. The highest frequency of grains with round edges is present in Middle-Late Eocene fluvio-deltaic sands. However, angular outlines, fractured plates with subparallel linear fractures and edge abrasion indicating glacier influence are also present. Preglacial carbonaceous mudstone and laminated gray claystone show distinctive high relief quartz grains and some chemical weathering on grain surfaces. The results of the microtextural analysis of quartz grains are used to verify some critical periods of ice sheet evolution, such as the transition from the East Antarctic preglacial to glacial conditions on the continental shelf from Middle/Late Eocene to Late Eocene/Early Oligocene time. Project(s): Ocean Drilling Program (ODP) (URI: http://www-odp.tamu.edu/) Coverage: LATITUDE: -67.696160 * LONGITUDE: 74.786930 DATE/TIME START: 2000-02-16T01:30:00 * DATE/TIME END: 2000-02-21T16:00:00 MINIMUM DEPTH, sediment/rock: 2.75 m * MAXIMUM DEPTH, sediment/rock: 342.88 m Event(s): 188-1166A * LATITUDE: -67.696160 * LONGITUDE: 74.786930 * DATE/TIME START: 2000-02-16T01:30:00 * DATE/TIME END: 2000-02-21T16:00:00 * ELEVATION: -475.4 m * Penetration: 381.3 m * Recovery: 71.31 m * LOCATION: Prydz Bay * CAMPAIGN: Leg188 (URI: https://doi.org/10.2973/odp.proc.ir.188.2001) * BASIS: Joides Resolution (URI: http://www-odp.tamu.edu/resolutn.html) * METHOD/DEVICE: Drilling/drill rig (DRILL) * COMMENT: 40 cores; 381.3 m cored; 0 m drilled; 18.7 % recovery Parameter(s): DEPTH, sediment/rock [m] (Depth sed) * GEOCODE Sample code/label (Sample label) * PI: Strand, Kari O (kari.strand@oulu.fi) * METHOD/DEVICE: DSDP/ODP/IODP sample designation (URI: hdl:10013/epic.27914.d001) Quartz, surface texture [%] (Qz texture) * PI: Strand, Kari O (kari.strand@oulu.fi) * METHOD/DEVICE: Scanning electron microscope (SEM) (URI: https://en.wikipedia.org/wiki/Scanning_electron_microscope) * COMMENT: Morphological textures, Angular outline Quartz, surface texture [%] (Qz texture) * PI: Strand, Kari O (kari.strand@oulu.fi) * METHOD/DEVICE: Scanning electron microscope (SEM) (URI: https://en.wikipedia.org/wiki/Scanning_electron_microscope) * COMMENT: Morphological textures, Rounded outline Quartz, surface texture [%] (Qz texture) * PI: Strand, Kari O (kari.strand@oulu.fi) * METHOD/DEVICE: Scanning electron microscope (SEM) (URI: https://en.wikipedia.org/wiki/Scanning_electron_microscope) * COMMENT: Morphological textures, Low relief Quartz, surface texture [%] (Qz texture) * PI: Strand, Kari O (kari.strand@oulu.fi) * METHOD/DEVICE: Scanning electron microscope (SEM) (URI: https://en.wikipedia.org/wiki/Scanning_electron_microscope) * COMMENT: Morphological textures, Medium relief Quartz, surface texture [%] (Qz texture) * PI: Strand, Kari O (kari.strand@oulu.fi) * METHOD/DEVICE: Scanning electron microscope (SEM) (URI: https://en.wikipedia.org/wiki/Scanning_electron_microscope) * COMMENT: Morphological textures, High relief Quartz, surface texture [%] (Qz texture) * PI: Strand, Kari O (kari.strand@oulu.fi) * METHOD/DEVICE: Scanning electron microscope (SEM) (URI: https://en.wikipedia.org/wiki/Scanning_electron_microscope) * COMMENT: Mechanical textures, Large conchoidal fractures Quartz, surface texture [%] (Qz texture) * PI: Strand, Kari O (kari.strand@oulu.fi) * METHOD/DEVICE: Scanning electron microscope (SEM) (URI: https://en.wikipedia.org/wiki/Scanning_electron_microscope) * COMMENT: Mechanical textures, Small conchoidal fractures Quartz, surface texture [%] (Qz texture) * PI: Strand, Kari O (kari.strand@oulu.fi) * METHOD/DEVICE: Scanning electron microscope (SEM) (URI: https://en.wikipedia.org/wiki/Scanning_electron_microscope) * COMMENT: Mechanical textures, Arcuate steps Quartz, surface texture [%] (Qz texture) * PI: Strand, Kari O (kari.strand@oulu.fi) * METHOD/DEVICE: Scanning electron microscope (SEM) (URI: https://en.wikipedia.org/wiki/Scanning_electron_microscope) * COMMENT: Mechanical textures, Straight steps Quartz, surface texture [%] (Qz texture) * PI: Strand, Kari O (kari.strand@oulu.fi) * METHOD/DEVICE: Scanning electron microscope (SEM) (URI: https://en.wikipedia.org/wiki/Scanning_electron_microscope) * COMMENT: Mechanical textures, Crescentic gougles Quartz, surface texture [%] (Qz texture) * PI: Strand, Kari O (kari.strand@oulu.fi) * METHOD/DEVICE: Scanning electron microscope (SEM) (URI: https://en.wikipedia.org/wiki/Scanning_electron_microscope) * COMMENT: Mechanical textures, Imbricated blocks Quartz, surface texture [%] (Qz texture) * PI: Strand, Kari O (kari.strand@oulu.fi) * METHOD/DEVICE: Scanning electron microscope (SEM) (URI: https://en.wikipedia.org/wiki/Scanning_electron_microscope) * COMMENT: Mechanical textures, Large breakage blocks Quartz, surface texture [%] (Qz texture) * PI: Strand, Kari O (kari.strand@oulu.fi) * METHOD/DEVICE: Scanning electron microscope (SEM) (URI: https://en.wikipedia.org/wiki/Scanning_electron_microscope) * COMMENT: Mechanical textures, Fractured plates Quartz, surface texture [%] (Qz texture) * PI: Strand, Kari O (kari.strand@oulu.fi) * METHOD/DEVICE: Scanning electron microscope (SEM) (URI: https://en.wikipedia.org/wiki/Scanning_electron_microscope) * COMMENT: Mechanical textures, Subparallel linear fractures Quartz, surface texture [%] (Qz texture) * PI: Strand, Kari O (kari.strand@oulu.fi) * METHOD/DEVICE: Scanning electron microscope (SEM) (URI: https://en.wikipedia.org/wiki/Scanning_electron_microscope) * COMMENT: Mechanical textures, Curved grooves Quartz, surface texture [%] (Qz texture) * PI: Strand, Kari O (kari.strand@oulu.fi) * METHOD/DEVICE: Scanning electron microscope (SEM) (URI: https://en.wikipedia.org/wiki/Scanning_electron_microscope) * COMMENT: Mechanical textures, Straight grooves Quartz, surface texture [%] (Qz texture) * PI: Strand, Kari O (kari.strand@oulu.fi) * METHOD/DEVICE: Scanning electron microscope (SEM) (URI: https://en.wikipedia.org/wiki/Scanning_electron_microscope) * COMMENT: Mechanical textures, V-shaped percussion cracks Quartz, surface texture [%] (Qz texture) * PI: Strand, Kari O (kari.strand@oulu.fi) * METHOD/DEVICE: Scanning electron microscope (SEM) (URI: https://en.wikipedia.org/wiki/Scanning_electron_microscope) * COMMENT: Mechanical textures, Meandering ridges Quartz, surface texture [%] (Qz texture) * PI: Strand, Kari O (kari.strand@oulu.fi) * METHOD/DEVICE: Scanning electron microscope (SEM) (URI: https://en.wikipedia.org/wiki/Scanning_electron_microscope) * COMMENT: Mechanical textures, Edge abrasion Quartz, surface texture [%] (Qz texture) * PI: Strand, Kari O (kari.strand@oulu.fi) * METHOD/DEVICE: Scanning electron microscope (SEM) (URI: https://en.wikipedia.org/wiki/Scanning_electron_microscope) * COMMENT: Mechanical textures, Surface abrasion Quartz, surface texture [%] (Qz texture) * PI: Strand, Kari O (kari.strand@oulu.fi) * METHOD/DEVICE: Scanning electron microscope (SEM) (URI: https://en.wikipedia.org/wiki/Scanning_electron_microscope) * COMMENT: Mechanical textures, Deep troughs Quartz, surface texture [%] (Qz texture) * PI: Strand, Kari O (kari.strand@oulu.fi) * METHOD/DEVICE: Scanning electron microscope (SEM) (URI: https://en.wikipedia.org/wiki/Scanning_electron_microscope) * COMMENT: Chemical textures, Preweathered surfaces Quartz, surface texture [%] (Qz texture) * PI: Strand, Kari O (kari.strand@oulu.fi) * METHOD/DEVICE: Scanning electron microscope (SEM) (URI: https://en.wikipedia.org/wiki/Scanning_electron_microscope) * COMMENT: Chemical textures, Weathered surfaces Quartz, surface texture [%] (Qz texture) * PI: Strand, Kari O (kari.strand@oulu.fi) * METHOD/DEVICE: Scanning electron microscope (SEM) (URI: https://en.wikipedia.org/wiki/Scanning_electron_microscope) * COMMENT: Chemical textures, Small precipitation features Quartz, surface texture [%] (Qz texture) * PI: Strand, Kari O (kari.strand@oulu.fi) * METHOD/DEVICE: Scanning electron microscope (SEM) (URI: https://en.wikipedia.org/wiki/Scanning_electron_microscope) * COMMENT: Chemical textures, Large precipitation features Quartz, surface texture [%] (Qz texture) * PI: Strand, Kari O (kari.strand@oulu.fi) * METHOD/DEVICE: Scanning electron microscope (SEM) (URI: https://en.wikipedia.org/wiki/Scanning_electron_microscope) * COMMENT: Chemical textures, Adhering particles Quartz, surface texture [%] (Qz texture) * PI: Strand, Kari O (kari.strand@oulu.fi) * METHOD/DEVICE: Scanning electron microscope (SEM) (URI: https://en.wikipedia.org/wiki/Scanning_electron_microscope) * COMMENT: Chemical textures, New growth License: Creative Commons Attribution 3.0 Unported (CC-BY-3.0) (URI: https://creativecommons.org/licenses/by/3.0/) Size: 532 data points */ Depth sed [m] Sample label (DSDP/ODP/IODP sample designation) Qz texture [%] (Morphological textures, Angul...) Qz texture [%] (Morphological textures, Round...) Qz texture [%] (Morphological textures, Low r...) Qz texture [%] (Morphological textures, Mediu...) Qz texture [%] (Morphological textures, High ...) Qz texture [%] (Mechanical textures, Large co...) Qz texture [%] (Mechanical textures, Small co...) Qz texture [%] (Mechanical textures, Arcuate ...) Qz texture [%] (Mechanical textures, Straight...) Qz texture [%] (Mechanical textures, Crescent...) Qz texture [%] (Mechanical textures, Imbricat...) Qz texture [%] (Mechanical textures, Large br...) Qz texture [%] (Mechanical textures, Fracture...) Qz texture [%] (Mechanical textures, Subparal...) Qz texture [%] (Mechanical textures, Curved g...) Qz texture [%] (Mechanical textures, Straight...) Qz texture [%] (Mechanical textures, V-shaped...) Qz texture [%] (Mechanical textures, Meanderi...) Qz texture [%] (Mechanical textures, Edge abr...) Qz texture [%] (Mechanical textures, Surface ...) Qz texture [%] (Mechanical textures, Deep tro...) Qz texture [%] (Chemical textures, Preweather...) Qz texture [%] (Chemical textures, Weathered ...) Qz texture [%] (Chemical textures, Small prec...) Qz texture [%] (Chemical textures, Large prec...) Qz texture [%] (Chemical textures, Adhering p...) Qz texture [%] (Chemical textures, New growth...) 2.75 188-1166A-1R-CC,4-6 60 40 13 53 33 7 33 60 47 20 20 47 80 27 47 53 7 27 73 33 20 7 33 73 7 53 0 20.29 188-1166A-3R-1,92-96 57 43 14 61 25 11 21 32 39 21 39 43 43 21 11 7 4 11 75 43 4 32 32 61 11 18 4 38.90 188-1166A-5R-1,69-72 65 35 12 69 19 27 35 42 58 31 12 19 42 46 0 12 8 0 77 54 12 15 31 31 19 23 0 65.56 188-1166A-8R-1,16-17 57 43 14 61 25 11 21 32 39 21 39 43 43 21 11 7 4 11 75 43 4 32 32 61 11 18 4 75.68 188-1166A-9R-1,66-70 72 28 4 68 28 4 16 12 12 4 4 20 56 36 4 16 0 8 52 16 0 12 32 80 0 8 0 84.55 188-1166A-10R-1,13-17 56 44 8 80 12 0 4 16 8 4 16 4 48 36 28 24 0 4 64 20 0 36 32 40 16 8 0 94.50 188-1166A-11R-1,49-51 56 44 11 74 15 11 33 19 19 22 15 11 48 37 19 7 0 0 74 33 0 37 19 37 7 0 4 104.91 188-1166A-12R-1,39-43 60 40 10 73 17 7 27 47 50 20 7 7 40 27 10 10 0 0 60 27 3 23 27 70 0 7 0 115.82 188-1166A-13R-2,100-104 80 20 4 76 20 16 16 40 40 24 28 28 64 36 16 16 4 4 56 20 0 28 28 52 16 12 4 125.04 188-1166A-14R-2,52-55 54 46 8 88 8 4 21 29 50 33 17 8 33 33 17 17 4 0 79 46 4 25 46 25 21 8 0 156.31 188-1166A-17RI-4,39-42 25 75 29 63 8 8 17 21 29 4 8 63 29 25 29 25 4 21 67 54 13 21 63 46 17 8 0 156.78 188-1166A-17RII-4,86-89 63 38 4 79 17 4 13 54 42 33 8 8 42 17 8 4 4 8 54 50 0 4 29 83 8 8 0 161.25 188-1166A-18R-1,23-26 52 48 8 72 20 0 16 32 24 16 16 8 40 36 24 16 0 4 60 40 0 28 36 76 8 4 0 199.63 188-1166A-22R-1,12-13 30 70 13 73 13 7 33 23 13 17 20 20 30 43 10 13 17 7 83 77 0 17 40 47 7 20 3 238.44 188-1166A-26R-1,53-54 40 60 8 72 20 4 12 24 32 24 16 20 44 32 0 0 4 8 80 68 0 16 52 84 0 20 0 288.84 188-1166A-25R-1,53-54 56 44 28 52 20 16 8 32 32 4 20 20 60 36 28 36 12 16 68 36 4 16 32 64 12 16 0 297.16 188-1166A-32R-2,34-38 87 13 7 57 37 13 17 20 20 10 40 40 43 10 3 7 0 0 40 10 0 0 30 50 20 33 3 314.26 188-1166A-34R-134-38 54 46 8 58 35 8 23 12 23 19 38 42 54 15 0 4 8 0 77 46 0 12 19 35 12 23 4 342.88 188-1166A-37R-CC,6-4 45 55 35 60 5 20 20 45 45 25 40 30 70 55 20 50 20 10 75 50 5 30 55 40 15 25 0