Shau, Yen-Hong; Peacor, Donald R (1992): (Table 4) Element composition of talc from altered basalts of DSDP Hole 83-504B, Costa Rica Rift, Pacific Ocean [dataset]. PANGAEA, https://doi.org/10.1594/PANGAEA.669506, In supplement to: Shau, Y-H; Peacor, DR (1992): Phyllosilieates in hydrothermally altered basalts from DSDP Hole 504B, Leg 83- a TEM and AEM study. Contributions to Mineralogy and Petrology, 112, 119-133, https://doi.org/10.1007/BF00310959
Always quote citation above when using data! You can download the citation in several formats below.
Project(s):
Deep Sea Drilling Project (DSDP)
Coverage:
Latitude: 1.227200 * Longitude: -83.730200
Date/Time Start: 1981-11-22T00:00:00 * Date/Time End: 1982-01-02T00:00:00
Minimum DEPTH, sediment/rock: 906.0 m * Maximum DEPTH, sediment/rock: 1152.5 m
Event(s):
83-504B * Latitude: 1.227200 * Longitude: -83.730200 * Date/Time Start: 1981-11-22T00:00:00 * Date/Time End: 1982-01-02T00:00:00 * Elevation: -3460.0 m * Penetration: 1350 m * Recovery: 107.7 m * Campaign: Leg83 * Basis: Glomar Challenger * Method/Device: Drilling/drill rig (DRILL) * Comment: Leg 83 of DSDP was devoted entirely to coring and experiments in Hole 504B, the deepest borehole to date into the oceanic crust. Hole 504B now extends over a kilometer into basement, nearly twice as far as any other DSDP hole, and it is the only DSDP hole to have clearly penetrated into the intrusive sheeted dikes that underlie the extrusive pillow lavas of the upper oceanic crust. At Hole 504B, Leg 83 continued an ongoing DSDP effort that began during Legs 68, 69, and 70 in 1979, and also included part of Leg 92 in 1983. 71 cores; 514 m cored; 0 m drilled; 21 % recovery
Comment:
Oxide wt % normalized to 88.0 wt % for analytical electron microscopy (AEM). Number of cations on the basis of 22 O
Parameter(s):
| # | Name | Short Name | Unit | Principal Investigator | Method/Device | Comment |
|---|---|---|---|---|---|---|
| 1 | DEPTH, sediment/rock | Depth sed | m | Geocode | ||
| 2 | Sample code/label | Sample label | Shau, Yen-Hong | DSDP/ODP/IODP sample designation | ||
| 3 | Sample comment | Sample comment | Shau, Yen-Hong | |||
| 4 | Sample method | Sample method | Shau, Yen-Hong | |||
| 5 | Silicon dioxide | SiO2 | % | Shau, Yen-Hong | ||
| 6 | Aluminium oxide | Al2O3 | % | Shau, Yen-Hong | ||
| 7 | Iron oxide, FeO | FeO | % | Shau, Yen-Hong | total Fe as Fe2+ | |
| 8 | Manganese oxide | MnO | % | Shau, Yen-Hong | ||
| 9 | Magnesium oxide | MgO | % | Shau, Yen-Hong | ||
| 10 | Calcium oxide | CaO | % | Shau, Yen-Hong | ||
| 11 | Sodium oxide | Na2O | % | Shau, Yen-Hong | ||
| 12 | Potassium oxide | K2O | % | Shau, Yen-Hong | ||
| 13 | Silicon | Si | # of ions | Shau, Yen-Hong | ||
| 14 | Aluminium (IV) | Al(IV) | # of ions | Shau, Yen-Hong | ||
| 15 | Aluminium (VI) | Al(VI) | # of ions | Shau, Yen-Hong | ||
| 16 | Iron 2+ | Fe2+ | # of ions | Shau, Yen-Hong | ||
| 17 | Manganese | Mn | # of ions | Shau, Yen-Hong | ||
| 18 | Magnesium (VI) | Mg(VI) | # of ions | Shau, Yen-Hong | ||
| 19 | Calcium | Ca | # of ions | Shau, Yen-Hong | ||
| 20 | Sodium | Na | # of ions | Shau, Yen-Hong | ||
| 21 | Potassium | K | # of ions | Shau, Yen-Hong | ||
| 22 | Silicon number | Si/(Si+Al) | Shau, Yen-Hong | |||
| 23 | Iron number | Fe/(Fe+Mg) | Shau, Yen-Hong |
License:
Creative Commons Attribution 3.0 Unported (CC-BY-3.0)
Size:
176 data points
Data
| 1 Depth sed [m] | 2 Sample label | 3 Sample comment | 4 Sample method | 5 SiO2 [%] | 6 Al2O3 [%] | 7 FeO [%] | 8 MnO [%] | 9 MgO [%] | 10 CaO [%] | 11 Na2O [%] | 12 K2O [%] | 13 Si [# of ions] | 14 Al(IV) [# of ions] | 15 Al(VI) [# of ions] | 16 Fe2+ [# of ions] | 17 Mn [# of ions] | 18 Mg(VI) [# of ions] | 19 Ca [# of ions] | 20 Na [# of ions] | 21 K [# of ions] | 22 Si/(Si+Al) | 23 Fe/(Fe+Mg) |
|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
| 906.0 | 83-504B-79-2 | olivine phenocrysts | Analytical electron microscopy (AEM) | 62.4 | 0.50 | 2.4 | 0.00 | 29.7 | 0.00 | 0.00 | 0.00 | 7.99 | 0.01 | 0.07 | 0.26 | 0 | 5.65 | 0.00 | 0.00 | 0.00 | 0.99 | 0.04 |
| 906.0 | 83-504B-79-2 | olivine phenocrysts | Analytical electron microscopy (AEM) | 61.8 | 0.60 | 3.8 | 0.00 | 28.5 | 0.30 | 0.00 | 0.00 | 7.95 | 0.05 | 0.05 | 0.41 | 0 | 5.49 | 0.05 | 0.00 | 0.00 | 0.99 | 0.07 |
| 1152.5 | 83-504B-108-1 | olivine phenocrysts | Analytical electron microscopy (AEM) | 61.5 | 0.80 | 3.3 | 0.00 | 29.4 | 0.00 | 0.00 | 0.00 | 7.91 | 0.09 | 0.03 | 0.36 | 0 | 5.64 | 0.00 | 0.00 | 0.00 | 0.99 | 0.06 |
| 1152.5 | 83-504B-108-1 | olivine phenocrysts | Analytical electron microscopy (AEM) | 61.2 | 0.50 | 3.9 | 0.00 | 29.4 | 0.00 | 0.00 | 0.00 | 7.91 | 0.08 | 0.00 | 0.42 | 0 | 5.65 | 0.00 | 0.00 | 0.00 | 0.99 | 0.07 |
| 1152.5 | 83-504B-108-1 | olivine phenocrysts | electron microprobe analysis (EMPA) | 63.8 | 0.39 | 2.6 | 0.02 | 30.6 | 0.11 | 0.03 | 0.00 | 7.96 | 0.04 | 0.02 | 0.27 | 0 | 5.69 | 0.01 | 0.01 | 0.00 | 0.99 | 0.05 |
| 1152.5 | 83-504B-108-1 | olivine phenocrysts | electron microprobe analysis (EMPA) | 63.5 | 0.31 | 2.5 | 0.00 | 31.1 | 0.10 | 0.05 | 0.01 | 7.93 | 0.05 | 0.00 | 0.26 | 0 | 5.79 | 0.01 | 0.01 | 0.00 | 0.99 | 0.04 |
| 1152.5 | 83-504B-108-1 | olivine phenocrysts | electron microprobe analysis (EMPA) | 60.5 | 1.11 | 6.2 | 0.03 | 28.2 | 0.64 | 0.05 | 0.00 | 7.78 | 0.17 | 0.00 | 0.67 | 0 | 5.41 | 0.09 | 0.01 | 0.00 | 0.98 | 0.11 |
| 1152.5 | 83-504B-108-1 | interstitial material | electron microprobe analysis (EMPA) | 56.7 | 2.30 | 11.1 | 0.03 | 23.5 | 0.87 | 0.05 | 0.04 | 7.66 | 0.34 | 0.03 | 1.26 | 0 | 4.72 | 0.13 | 0.01 | 0.01 | 0.96 | 0.21 |