Ciesielski, Paul F; Kristoffersen, Yngve; Shipboard Scientific Party (2005): X-ray fluorescence on samples of ODP Hole 114-704B [dataset]. PANGAEA, https://doi.org/10.1594/PANGAEA.271521
Always quote citation above when using data! You can download the citation in several formats below.
Related to:
Ciesielski, Paul F; Kristoffersen, Yngve; et al. (1988): Proceedings of the Ocean Drilling Program, 114 Initial Reports. Proceedings of the Ocean Drilling Program, Ocean Drilling Program, 114, 999 pp, https://doi.org/10.2973/odp.proc.ir.114.1988
ODP/TAMU (2005): JANUS Database. Ocean Drilling Program, Texas A&M University, College Station TX 77845-9547, USA; (data copied from Janus 2005-02 to 2005-06), http://www-odp.tamu.edu/database/
Project(s):
Ocean Drilling Program (ODP)
Coverage:
Latitude: -46.880000 * Longitude: 7.420500
Date/Time Start: 1987-04-26T06:45:00 * Date/Time End: 1987-05-03T10:14:00
Minimum DEPTH, sediment/rock: 284.80 m * Maximum DEPTH, sediment/rock: 454.81 m
Event(s):
114-704B * Latitude: -46.880000 * Longitude: 7.420500 * Date/Time Start: 1987-04-26T06:45:00 * Date/Time End: 1987-05-03T10:14:00 * Elevation: -2541.0 m * Penetration: 671.7 m * Recovery: 502.75 m * Location: South Atlantic Ocean * Campaign: Leg114 * Basis: Joides Resolution * Method/Device: Drilling/drill rig (DRILL) * Comment: 72 cores; 671.7 m cored; 0 m drilled; 74.8 % recovery
Parameter(s):
| # | Name | Short Name | Unit | Principal Investigator | Method/Device | Comment |
|---|---|---|---|---|---|---|
| 1 | DEPTH, sediment/rock | Depth sed | m | Geocode | ||
| 2 | Depth, composite | Depth comp | mcd | Shipboard Scientific Party | ||
| 3 | Sample code/label | Sample label | Shipboard Scientific Party | DSDP/ODP/IODP sample designation | ||
| 4 | Sample comment | Sample comment | Shipboard Scientific Party | X-ray fluorescence (XRF) | ||
| 5 | Silicon dioxide | SiO2 | % | Shipboard Scientific Party | X-ray fluorescence (XRF) | |
| 6 | Titanium dioxide | TiO2 | % | Shipboard Scientific Party | X-ray fluorescence (XRF) | |
| 7 | Aluminium oxide | Al2O3 | % | Shipboard Scientific Party | X-ray fluorescence (XRF) | |
| 8 | Iron oxide, Fe2O3 | Fe2O3 | % | Shipboard Scientific Party | X-ray fluorescence (XRF) | |
| 9 | Manganese oxide | MnO | % | Shipboard Scientific Party | X-ray fluorescence (XRF) | |
| 10 | Calcium oxide | CaO | % | Shipboard Scientific Party | X-ray fluorescence (XRF) | |
| 11 | Sodium oxide | Na2O | % | Shipboard Scientific Party | X-ray fluorescence (XRF) | |
| 12 | Potassium oxide | K2O | % | Shipboard Scientific Party | X-ray fluorescence (XRF) | |
| 13 | Phosphorus pentoxide | P2O5 | % | Shipboard Scientific Party | X-ray fluorescence (XRF) | |
| 14 | Sample type | Samp type | Shipboard Scientific Party | X-ray fluorescence (XRF) |
License:
Creative Commons Attribution 3.0 Unported (CC-BY-3.0)
Size:
25 data points
Data
| 1 Depth sed [m] | 2 Depth comp [mcd] | 3 Sample label | 4 Sample comment | 5 SiO2 [%] | 6 TiO2 [%] | 7 Al2O3 [%] | 8 Fe2O3 [%] | 9 MnO [%] | 10 CaO [%] | 11 Na2O [%] | 12 K2O [%] | 13 P2O5 [%] | 14 Samp type |
|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
| 284.80 | 284.80 | 114-704B-31X-4,10-12 | RUN UNKN; REP A | 5.54 | 1.16 | 0.38 | 0.02 | 92.24 | 0.14 | 0.04 | 0.04 | Sediment | |
| 454.81 | 454.81 | 114-704B-49X-3,61-63 | RUN UNKN; REP A | 17.90 | 0.11 | 3.75 | 1.43 | 0.05 | 74.54 | 0.63 | 0.24 | 0.10 | Sediment |