Ciesielski, Paul F; Kristoffersen, Yngve; Shipboard Scientific Party (2005): X-ray fluorescence on samples of ODP Hole 114-698A [dataset]. PANGAEA, https://doi.org/10.1594/PANGAEA.271519
Always quote citation above when using data! You can download the citation in several formats below.
Related to:
Ciesielski, Paul F; Kristoffersen, Yngve; et al. (1988): Proceedings of the Ocean Drilling Program, 114 Initial Reports. Proceedings of the Ocean Drilling Program, Ocean Drilling Program, 114, 999 pp, https://doi.org/10.2973/odp.proc.ir.114.1988
ODP/TAMU (2005): JANUS Database. Ocean Drilling Program, Texas A&M University, College Station TX 77845-9547, USA; (data copied from Janus 2005-02 to 2005-06), http://www-odp.tamu.edu/database/
Project(s):
Ocean Drilling Program (ODP)
Coverage:
Latitude: -51.459000 * Longitude: -33.099300
Date/Time Start: 1987-03-16T13:05:00 * Date/Time End: 1987-03-19T21:29:00
Minimum DEPTH, sediment/rock: 147.05 m * Maximum DEPTH, sediment/rock: 219.29 m
Event(s):
114-698A * Latitude: -51.459000 * Longitude: -33.099300 * Date/Time Start: 1987-03-16T13:05:00 * Date/Time End: 1987-03-19T21:29:00 * Elevation: -2138.0 m * Penetration: 237 m * Recovery: 52.26 m * Location: South Atlantic Ocean * Campaign: Leg114 * Basis: Joides Resolution * Method/Device: Drilling/drill rig (DRILL) * Comment: 27 cores; 237 m cored; 0 m drilled; 22.1 % recovery
Parameter(s):
| # | Name | Short Name | Unit | Principal Investigator | Method/Device | Comment |
|---|---|---|---|---|---|---|
| 1 | DEPTH, sediment/rock | Depth sed | m | Geocode | ||
| 2 | Depth, composite | Depth comp | mcd | Shipboard Scientific Party | ||
| 3 | Sample code/label | Sample label | Shipboard Scientific Party | DSDP/ODP/IODP sample designation | ||
| 4 | Sample comment | Sample comment | Shipboard Scientific Party | X-ray fluorescence (XRF) | ||
| 5 | Silicon dioxide | SiO2 | % | Shipboard Scientific Party | X-ray fluorescence (XRF) | |
| 6 | Titanium dioxide | TiO2 | % | Shipboard Scientific Party | X-ray fluorescence (XRF) | |
| 7 | Aluminium oxide | Al2O3 | % | Shipboard Scientific Party | X-ray fluorescence (XRF) | |
| 8 | Iron oxide, Fe2O3 | Fe2O3 | % | Shipboard Scientific Party | X-ray fluorescence (XRF) | |
| 9 | Manganese oxide | MnO | % | Shipboard Scientific Party | X-ray fluorescence (XRF) | |
| 10 | Magnesium oxide | MgO | % | Shipboard Scientific Party | X-ray fluorescence (XRF) | |
| 11 | Calcium oxide | CaO | % | Shipboard Scientific Party | X-ray fluorescence (XRF) | |
| 12 | Sodium oxide | Na2O | % | Shipboard Scientific Party | X-ray fluorescence (XRF) | |
| 13 | Potassium oxide | K2O | % | Shipboard Scientific Party | X-ray fluorescence (XRF) | |
| 14 | Phosphorus pentoxide | P2O5 | % | Shipboard Scientific Party | X-ray fluorescence (XRF) | |
| 15 | Sample type | Samp type | Shipboard Scientific Party | X-ray fluorescence (XRF) | ||
| 16 | Comment | Comment | Shipboard Scientific Party | X-ray fluorescence (XRF) |
License:
Creative Commons Attribution 3.0 Unported (CC-BY-3.0)
Size:
54 data points
Data
| 1 Depth sed [m] | 2 Depth comp [mcd] | 3 Sample label | 4 Sample comment | 5 SiO2 [%] | 6 TiO2 [%] | 7 Al2O3 [%] | 8 Fe2O3 [%] | 9 MnO [%] | 10 MgO [%] | 11 CaO [%] | 12 Na2O [%] | 13 K2O [%] | 14 P2O5 [%] | 15 Samp type | 16 Comment |
|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
| 147.05 | 147.05 | 114-698A-17R-1,55-57 | RUN UNKN; REP A | 34.81 | 6.16 | 23.03 | 30.29 | 0.19 | 1.12 | 0.99 | 1.16 | 0.27 | 0.22 | Sediment | |
| 148.69 | 148.69 | 114-698A-17R-2,69-71 | RUN UNKN; REP A | 18.75 | 0.03 | 2.09 | 0.72 | 0.04 | 75.72 | 0.12 | 0.15 | 0.14 | Sediment | ||
| 149.26 | 149.26 | 114-698A-17R-2,126-128 | RUN UNKN; REP A | 24.39 | 0.21 | 5.76 | 2.25 | 0.02 | 58.42 | 0.79 | 0.92 | 0.28 | Sediment | TOTAL OXIDES BELOW RANGE OF FORMS, MANUALLY ENTERED | |
| 219.29 | 219.29 | 114-698A-26R-1,29-33 | RUN UNKN; REP A | 34.81 | 6.16 | 23.03 | 30.29 | 0.19 | 1.12 | 0.99 | 1.16 | 0.27 | 0.22 |