/* DATA DESCRIPTION: Citation: Christie, David M; Pedersen, Rolf B; Miller, D Jay; Shipboard Scientific Party (2005): X-ray fluorescence on samples of ODP Hole 187-1157B. PANGAEA, https://doi.org/10.1594/PANGAEA.271500 Related to: Christie, David M; Pedersen, Rolf B; Miller, David J; et al. (2001): Proceedings of the Ocean Drilling Program, 187 Initial Reports. Proceedings of the Ocean Drilling Program, Ocean Drilling Program, 187, online, https://doi.org/10.2973/odp.proc.ir.187.2001 ODP/TAMU (2005): JANUS Database. Ocean Drilling Program, Texas A&M University, College Station TX 77845-9547, USA; (data copied from Janus 2005-02 to 2005-06), http://www-odp.tamu.edu/database/ Project(s): Ocean Drilling Program (ODP) (URI: http://www-odp.tamu.edu/) Coverage: LATITUDE: -43.261260 * LONGITUDE: 128.883810 DATE/TIME START: 1999-12-13T13:00:00 * DATE/TIME END: 1999-12-15T11:00:00 MINIMUM DEPTH, sediment/rock: 139.12 m * MAXIMUM DEPTH, sediment/rock: 152.63 m Event(s): 187-1157B * LATITUDE: -43.261260 * LONGITUDE: 128.883810 * DATE/TIME START: 1999-12-13T13:00:00 * DATE/TIME END: 1999-12-15T11:00:00 * ELEVATION: -5069.3 m * Penetration: 171 m * Recovery: 11.7 m * LOCATION: Indian Ocean * CAMPAIGN: Leg187 (URI: https://doi.org/10.2973/odp.proc.ir.187.2001) * BASIS: Joides Resolution (URI: http://www-odp.tamu.edu/resolutn.html) * METHOD/DEVICE: Drilling/drill rig (DRILL) * COMMENT: 8 cores; 40.4 m cored; 0 m drilled; 29 % recovery Parameter(s): DEPTH, sediment/rock [m] (Depth sed) * GEOCODE Depth, composite [mcd] (Depth comp) * PI: Shipboard Scientific Party Sample code/label (Sample label) * PI: Shipboard Scientific Party * METHOD/DEVICE: DSDP/ODP/IODP sample designation (URI: hdl:10013/epic.27914.d001) Sample comment (Sample comment) * PI: Shipboard Scientific Party * METHOD/DEVICE: X-ray fluorescence (XRF) Loss on ignition [%] (LOI) * PI: Shipboard Scientific Party * METHOD/DEVICE: X-ray fluorescence (XRF) * COMMENT: Bead_loi Silicon dioxide [%] (SiO2) * PI: Shipboard Scientific Party * METHOD/DEVICE: X-ray fluorescence (XRF) Titanium dioxide [%] (TiO2) * PI: Shipboard Scientific Party * METHOD/DEVICE: X-ray fluorescence (XRF) Aluminium oxide [%] (Al2O3) * PI: Shipboard Scientific Party * METHOD/DEVICE: X-ray fluorescence (XRF) Iron oxide, Fe2O3 [%] (Fe2O3) * PI: Shipboard Scientific Party * METHOD/DEVICE: X-ray fluorescence (XRF) Manganese oxide [%] (MnO) * PI: Shipboard Scientific Party * METHOD/DEVICE: X-ray fluorescence (XRF) Magnesium oxide [%] (MgO) * PI: Shipboard Scientific Party * METHOD/DEVICE: X-ray fluorescence (XRF) Calcium oxide [%] (CaO) * PI: Shipboard Scientific Party * METHOD/DEVICE: X-ray fluorescence (XRF) Sodium oxide [%] (Na2O) * PI: Shipboard Scientific Party * METHOD/DEVICE: X-ray fluorescence (XRF) Potassium oxide [%] (K2O) * PI: Shipboard Scientific Party * METHOD/DEVICE: X-ray fluorescence (XRF) Phosphorus pentoxide [%] (P2O5) * PI: Shipboard Scientific Party * METHOD/DEVICE: X-ray fluorescence (XRF) Niobium [mg/kg] (Nb) * PI: Shipboard Scientific Party * METHOD/DEVICE: X-ray fluorescence (XRF) Zirconium [mg/kg] (Zr) * PI: Shipboard Scientific Party * METHOD/DEVICE: X-ray fluorescence (XRF) Yttrium [mg/kg] (Y) * PI: Shipboard Scientific Party * METHOD/DEVICE: X-ray fluorescence (XRF) Strontium [mg/kg] (Sr) * PI: Shipboard Scientific Party * METHOD/DEVICE: X-ray fluorescence (XRF) Rubidium [mg/kg] (Rb) * PI: Shipboard Scientific Party * METHOD/DEVICE: X-ray fluorescence (XRF) Zinc [mg/kg] (Zn) * PI: Shipboard Scientific Party * METHOD/DEVICE: X-ray fluorescence (XRF) Copper [mg/kg] (Cu) * PI: Shipboard Scientific Party * METHOD/DEVICE: X-ray fluorescence (XRF) Nickel [mg/kg] (Ni) * PI: Shipboard Scientific Party * METHOD/DEVICE: X-ray fluorescence (XRF) Chromium [mg/kg] (Cr) * PI: Shipboard Scientific Party * METHOD/DEVICE: X-ray fluorescence (XRF) Vanadium [mg/kg] (V) * PI: Shipboard Scientific Party * METHOD/DEVICE: X-ray fluorescence (XRF) Cerium [mg/kg] (Ce) * PI: Shipboard Scientific Party * METHOD/DEVICE: X-ray fluorescence (XRF) Barium [mg/kg] (Ba) * PI: Shipboard Scientific Party * METHOD/DEVICE: X-ray fluorescence (XRF) License: Creative Commons Attribution 3.0 Unported (CC-BY-3.0) (URI: https://creativecommons.org/licenses/by/3.0/) Size: 86 data points */ Depth sed [m] Depth comp [mcd] Sample label Sample comment LOI [%] SiO2 [%] TiO2 [%] Al2O3 [%] Fe2O3 [%] MnO [%] MgO [%] CaO [%] Na2O [%] K2O [%] P2O5 [%] Nb [mg/kg] Zr [mg/kg] Y [mg/kg] Sr [mg/kg] Rb [mg/kg] Zn [mg/kg] Cu [mg/kg] Ni [mg/kg] Cr [mg/kg] V [mg/kg] Ce [mg/kg] Ba [mg/kg] 139.12 139.12 187-1157B-3R-1,62-67 RUN M_12; REP A 0.87 48.94 1.28 15.28 9.43 0.11 7.12 11.09 2.98 0.20 0.15 139.12 139.12 187-1157B-3R-1,62-67 RUN M_12; REP B 0.87 48.23 1.36 15.16 9.40 0.12 7.03 10.94 2.91 0.21 0.15 139.12 139.12 187-1157B-3R-1,62-67 RUN T_008; REP A 6 118 36 138 2 80 56 148 395 249 32 0 152.63 152.63 187-1157B-6R-1,43-47 RUN M_13; REP A 0.77 49.17 1.47 15.76 9.21 0.14 7.13 10.96 2.95 0.24 0.15 152.63 152.63 187-1157B-6R-1,43-47 RUN M_13; REP B 0.77 49.30 1.52 15.79 9.24 0.15 7.14 10.93 2.84 0.25 0.15 152.63 152.63 187-1157B-6R-1,43-47 RUN T_009; REP A 5 120 35 139 3 80 59 151 418 254 33 0