/* DATA DESCRIPTION: Citation: Fouquet, Yves; Zierenberg, Robert A; Miller, D Jay; Shipboard Scientific Party (2005): X-ray fluorescence on samples of ODP Hole 170-1041B. PANGAEA, https://doi.org/10.1594/PANGAEA.271458 Related to: Kimura, Gaku; Silver, E; Blum, Peter; et al. (1997): Proceedings of the Ocean Drilling Program, 170 Initial Reports. Proceedings of the Ocean Drilling Program, Ocean Drilling Program, 170, online, https://doi.org/10.2973/odp.proc.ir.170.1997 ODP/TAMU (2005): JANUS Database. Ocean Drilling Program, Texas A&M University, College Station TX 77845-9547, USA; (data copied from Janus 2005-02 to 2005-06), http://www-odp.tamu.edu/database/ Project(s): Ocean Drilling Program (ODP) (URI: http://www-odp.tamu.edu/) Coverage: LATITUDE: 9.733700 * LONGITUDE: -86.116300 DATE/TIME START: 1996-11-27T09:15:00 * DATE/TIME END: 1996-11-30T03:45:00 MINIMUM DEPTH, sediment/rock: 179.17 m * MAXIMUM DEPTH, sediment/rock: 379.40 m Event(s): 170-1041B * LATITUDE: 9.733700 * LONGITUDE: -86.116300 * DATE/TIME START: 1996-11-27T09:15:00 * DATE/TIME END: 1996-11-30T03:45:00 * ELEVATION: -3305.9 m * Penetration: 395.6 m * Recovery: 132.97 m * LOCATION: Costa Rica margin, North Pacific Ocean * CAMPAIGN: Leg170 (URI: https://doi.org/10.2973/odp.proc.ir.170.1997) * BASIS: Joides Resolution (URI: http://www-odp.tamu.edu/resolutn.html) * METHOD/DEVICE: Drilling/drill rig (DRILL) * COMMENT: 25 cores; 240.6 m cored; 0 m drilled; 55.3 % recovery Parameter(s): DEPTH, sediment/rock [m] (Depth sed) * GEOCODE Depth, composite [mcd] (Depth comp) * PI: Shipboard Scientific Party Sample code/label (Sample label) * PI: Shipboard Scientific Party * METHOD/DEVICE: DSDP/ODP/IODP sample designation (URI: hdl:10013/epic.27914.d001) Sample comment (Sample comment) * PI: Shipboard Scientific Party * METHOD/DEVICE: X-ray fluorescence (XRF) Loss on ignition [%] (LOI) * PI: Shipboard Scientific Party * METHOD/DEVICE: X-ray fluorescence (XRF) * COMMENT: Bead_loi Silicon dioxide [%] (SiO2) * PI: Shipboard Scientific Party * METHOD/DEVICE: X-ray fluorescence (XRF) Titanium dioxide [%] (TiO2) * PI: Shipboard Scientific Party * METHOD/DEVICE: X-ray fluorescence (XRF) Aluminium oxide [%] (Al2O3) * PI: Shipboard Scientific Party * METHOD/DEVICE: X-ray fluorescence (XRF) Iron oxide, Fe2O3 [%] (Fe2O3) * PI: Shipboard Scientific Party * METHOD/DEVICE: X-ray fluorescence (XRF) Manganese oxide [%] (MnO) * PI: Shipboard Scientific Party * METHOD/DEVICE: X-ray fluorescence (XRF) Magnesium oxide [%] (MgO) * PI: Shipboard Scientific Party * METHOD/DEVICE: X-ray fluorescence (XRF) Calcium oxide [%] (CaO) * PI: Shipboard Scientific Party * METHOD/DEVICE: X-ray fluorescence (XRF) Sodium oxide [%] (Na2O) * PI: Shipboard Scientific Party * METHOD/DEVICE: X-ray fluorescence (XRF) Potassium oxide [%] (K2O) * PI: Shipboard Scientific Party * METHOD/DEVICE: X-ray fluorescence (XRF) Phosphorus pentoxide [%] (P2O5) * PI: Shipboard Scientific Party * METHOD/DEVICE: X-ray fluorescence (XRF) Niobium [mg/kg] (Nb) * PI: Shipboard Scientific Party * METHOD/DEVICE: X-ray fluorescence (XRF) Zirconium [mg/kg] (Zr) * PI: Shipboard Scientific Party * METHOD/DEVICE: X-ray fluorescence (XRF) Yttrium [mg/kg] (Y) * PI: Shipboard Scientific Party * METHOD/DEVICE: X-ray fluorescence (XRF) Strontium [mg/kg] (Sr) * PI: Shipboard Scientific Party * METHOD/DEVICE: X-ray fluorescence (XRF) Rubidium [mg/kg] (Rb) * PI: Shipboard Scientific Party * METHOD/DEVICE: X-ray fluorescence (XRF) Zinc [mg/kg] (Zn) * PI: Shipboard Scientific Party * METHOD/DEVICE: X-ray fluorescence (XRF) Copper [mg/kg] (Cu) * PI: Shipboard Scientific Party * METHOD/DEVICE: X-ray fluorescence (XRF) Nickel [mg/kg] (Ni) * PI: Shipboard Scientific Party * METHOD/DEVICE: X-ray fluorescence (XRF) Chromium [mg/kg] (Cr) * PI: Shipboard Scientific Party * METHOD/DEVICE: X-ray fluorescence (XRF) Vanadium [mg/kg] (V) * PI: Shipboard Scientific Party * METHOD/DEVICE: X-ray fluorescence (XRF) Cerium [mg/kg] (Ce) * PI: Shipboard Scientific Party * METHOD/DEVICE: X-ray fluorescence (XRF) Barium [mg/kg] (Ba) * PI: Shipboard Scientific Party * METHOD/DEVICE: X-ray fluorescence (XRF) Sample type (Samp type) * PI: Shipboard Scientific Party * METHOD/DEVICE: X-ray fluorescence (XRF) Comment (Comment) * PI: Shipboard Scientific Party * METHOD/DEVICE: X-ray fluorescence (XRF) License: Creative Commons Attribution 3.0 Unported (CC-BY-3.0) (URI: https://creativecommons.org/licenses/by/3.0/) Size: 195 data points */ Depth sed [m] Depth comp [mcd] Sample label Sample comment LOI [%] SiO2 [%] TiO2 [%] Al2O3 [%] Fe2O3 [%] MnO [%] MgO [%] CaO [%] Na2O [%] K2O [%] P2O5 [%] Nb [mg/kg] Zr [mg/kg] Y [mg/kg] Sr [mg/kg] Rb [mg/kg] Zn [mg/kg] Cu [mg/kg] Ni [mg/kg] Cr [mg/kg] V [mg/kg] Ce [mg/kg] Ba [mg/kg] Samp type Comment 179.17 179.17 170-1041B-3R-5,115-150 RUN UNKN; REP M 9.35 61.16 1.08 17.28 9.10 0.05 3.52 2.45 2.18 2.17 0.18 Sediment Sediment 179.17 179.17 170-1041B-3R-5,115-150 RUN UNKN; REP T 4 109 18 191 39 120 54 41 80 174 22 521 Sediment Sediment 234.39 234.39 170-1041B-9R-2,99-134 RUN UNKN; REP M 4.99 70.41 0.59 15.89 4.13 0.08 1.03 3.36 3.53 2.59 0.13 Sediment Sediment 234.39 234.39 170-1041B-9R-2,99-134 RUN UNKN; REP T 4 154 23 309 34 66 44 11 2 58 23 1283 Sediment Sediment 234.90 234.90 170-1041B-9R-3,1-5 RUN UNKN; REP M 5.53 69.82 0.59 15.71 4.15 0.08 1.03 3.23 3.77 2.56 0.13 Ash 234.90 234.90 170-1041B-9R-3,1-5 RUN UNKN; REP T 4 152 22 295 35 65 44 11 5 61 20 1268 Ash 321.30 321.30 170-1041B-18R-CC,0-2 RUN UNKN; REP M 35.34 18.65 0.22 5.79 2.59 0.04 0.81 67.75 0.62 0.61 Sediment Sediment 321.30 321.30 170-1041B-18R-CC,0-2 RUN UNKN; REP T 0 26 6 209 10 25 17 4 13 33 10 138 Sediment Sediment 350.60 350.60 170-1041B-21R-3,0-35 RUN UNKN; REP M 7.40 60.81 1.02 17.72 8.01 0.04 2.65 4.52 1.79 2.11 0.21 Sediment Sediment 350.60 350.60 170-1041B-21R-3,0-35 RUN UNKN; REP T 4 104 18 317 38 97 52 20 55 169 21 475 Sediment Sediment 379.40 379.40 170-1041B-24R-3,0-25 RUN UNKN; REP M 10.19 65.16 0.95 16.72 7.92 0.08 3.06 2.86 1.42 1.73 0.25 Sediment Sediment 379.40 379.40 170-1041B-24R-3,0-25 RUN UNKN; REP T 4 101 16 230 34 109 61 26 59 155 22 432 Sediment Sediment