Schmincke, Hans-Ulrich; Weaver, Philip PE; Shipboard Scientific Party (2005): X-ray fluorescence on samples of ODP Hole 157-954A [dataset]. PANGAEA, https://doi.org/10.1594/PANGAEA.271410
Always quote citation above when using data! You can download the citation in several formats below.
Related to:
ODP/TAMU (2005): JANUS Database. Ocean Drilling Program, Texas A&M University, College Station TX 77845-9547, USA; (data copied from Janus 2005-02 to 2005-06), http://www-odp.tamu.edu/database/
Schmincke, Hans-Ulrich; Weaver, Philip PE; Firth, John V; et al. (1995): Proceedings of the Ocean Drilling Program, 157 Initial Reports. Proceedings of the Ocean Drilling Program, Ocean Drilling Program, 157, 843 pp, https://doi.org/10.2973/odp.proc.ir.157.1995
Project(s):
Ocean Drilling Program (ODP)
Coverage:
Latitude: 28.436600 * Longitude: -15.532100
Date/Time Start: 1994-09-04T13:41:00 * Date/Time End: 1994-09-05T20:13:00
Minimum DEPTH, sediment/rock: 11.48 m * Maximum DEPTH, sediment/rock: 56.83 m
Event(s):
157-954A * Latitude: 28.436600 * Longitude: -15.532100 * Date/Time Start: 1994-09-04T13:41:00 * Date/Time End: 1994-09-05T20:13:00 * Elevation: -3497.0 m * Penetration: 83.8 m * Recovery: 80.4 m * Location: Canarias Sea * Campaign: Leg157 * Basis: Joides Resolution * Method/Device: Drilling/drill rig (DRILL) * Comment: 12 cores; 83.8 m cored; 0 m drilled; 95.9 % recovery
Parameter(s):
| # | Name | Short Name | Unit | Principal Investigator | Method/Device | Comment |
|---|---|---|---|---|---|---|
| 1 | DEPTH, sediment/rock | Depth sed | m | Geocode | ||
| 2 | Depth, composite | Depth comp | mcd | Shipboard Scientific Party | ||
| 3 | Sample code/label | Sample label | Shipboard Scientific Party | DSDP/ODP/IODP sample designation | ||
| 4 | Sample comment | Sample comment | Shipboard Scientific Party | X-ray fluorescence (XRF) | ||
| 5 | Loss on ignition | LOI | % | Shipboard Scientific Party | X-ray fluorescence (XRF) | Bead_loi |
| 6 | Silicon dioxide | SiO2 | % | Shipboard Scientific Party | X-ray fluorescence (XRF) | |
| 7 | Titanium dioxide | TiO2 | % | Shipboard Scientific Party | X-ray fluorescence (XRF) | |
| 8 | Aluminium oxide | Al2O3 | % | Shipboard Scientific Party | X-ray fluorescence (XRF) | |
| 9 | Iron oxide, Fe2O3 | Fe2O3 | % | Shipboard Scientific Party | X-ray fluorescence (XRF) | |
| 10 | Manganese oxide | MnO | % | Shipboard Scientific Party | X-ray fluorescence (XRF) | |
| 11 | Magnesium oxide | MgO | % | Shipboard Scientific Party | X-ray fluorescence (XRF) | |
| 12 | Calcium oxide | CaO | % | Shipboard Scientific Party | X-ray fluorescence (XRF) | |
| 13 | Sodium oxide | Na2O | % | Shipboard Scientific Party | X-ray fluorescence (XRF) | |
| 14 | Potassium oxide | K2O | % | Shipboard Scientific Party | X-ray fluorescence (XRF) | |
| 15 | Phosphorus pentoxide | P2O5 | % | Shipboard Scientific Party | X-ray fluorescence (XRF) | |
| 16 | Niobium | Nb | mg/kg | Shipboard Scientific Party | X-ray fluorescence (XRF) | |
| 17 | Zirconium | Zr | mg/kg | Shipboard Scientific Party | X-ray fluorescence (XRF) | |
| 18 | Yttrium | Y | mg/kg | Shipboard Scientific Party | X-ray fluorescence (XRF) | |
| 19 | Strontium | Sr | mg/kg | Shipboard Scientific Party | X-ray fluorescence (XRF) | |
| 20 | Rubidium | Rb | mg/kg | Shipboard Scientific Party | X-ray fluorescence (XRF) | |
| 21 | Zinc | Zn | mg/kg | Shipboard Scientific Party | X-ray fluorescence (XRF) | |
| 22 | Copper | Cu | mg/kg | Shipboard Scientific Party | X-ray fluorescence (XRF) | |
| 23 | Nickel | Ni | mg/kg | Shipboard Scientific Party | X-ray fluorescence (XRF) | |
| 24 | Chromium | Cr | mg/kg | Shipboard Scientific Party | X-ray fluorescence (XRF) | |
| 25 | Vanadium | V | mg/kg | Shipboard Scientific Party | X-ray fluorescence (XRF) | |
| 26 | Cerium | Ce | mg/kg | Shipboard Scientific Party | X-ray fluorescence (XRF) | |
| 27 | Barium | Ba | mg/kg | Shipboard Scientific Party | X-ray fluorescence (XRF) | |
| 28 | Sample type | Samp type | Shipboard Scientific Party | X-ray fluorescence (XRF) | ||
| 29 | Comment | Comment | Shipboard Scientific Party | X-ray fluorescence (XRF) |
License:
Creative Commons Attribution 3.0 Unported (CC-BY-3.0)
Size:
62 data points
Data
| 1 Depth sed [m] | 2 Depth comp [mcd] | 3 Sample label | 4 Sample comment | 5 LOI [%] | 6 SiO2 [%] | 7 TiO2 [%] | 8 Al2O3 [%] | 9 Fe2O3 [%] | 10 MnO [%] | 11 MgO [%] | 12 CaO [%] | 13 Na2O [%] | 14 K2O [%] | 15 P2O5 [%] | 16 Nb [mg/kg] | 17 Zr [mg/kg] | 18 Y [mg/kg] | 19 Sr [mg/kg] | 20 Rb [mg/kg] | 21 Zn [mg/kg] | 22 Cu [mg/kg] | 23 Ni [mg/kg] | 24 Cr [mg/kg] | 25 V [mg/kg] | 26 Ce [mg/kg] | 27 Ba [mg/kg] | 28 Samp type | 29 Comment |
|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
| 11.48 | 11.48 | 157-954A-3H-1,98-101 | RUN UNKN; REP A | 3.65 | 55.26 | 1.33 | 14.97 | 7.96 | 0.33 | 3.84 | 3.83 | 5.76 | 3.52 | 0.80 | ||||||||||||||
| 11.48 | 11.48 | 157-954A-3H-1,98-101 | RUN UNKN; REP P | 354 | 1947 | 66 | 2870 | 69 | 265 | 28 | 55 | 64 | 70 | 495 | 1525 | none | ||||||||||||
| 56.83 | 56.83 | 157-954A-7H-6,83-87 | RUN UNKN; REP A | 1.01 | 46.22 | 3.74 | 13.82 | 13.49 | 0.18 | 7.35 | 9.81 | 2.93 | 1.53 | 0.58 | Sediment | |||||||||||||
| 56.83 | 56.83 | 157-954A-7H-6,83-87 | RUN UNKN; REP P | 81 | 362 | 27 | 847 | 26 | 125 | 68 | 112 | 222 | 277 | 101 | 492 | Sediment | none |