Myhre, Annik M; Thiede, Jörn; Shipboard Scientific Party (2005): X-ray fluorescence on samples of ODP Hole 151-910A [dataset]. PANGAEA, https://doi.org/10.1594/PANGAEA.271375
Always quote citation above when using data! You can download the citation in several formats below.
Related to:
Myhre, Annik M; Thiede, Jörn; Firth, John V; et al. (1995): Proceedings of the Ocean Drilling Program, 151 Initial Reports. Proceedings of the Ocean Drilling Program, Ocean Drilling Program, 151, 926 pp, https://doi.org/10.2973/odp.proc.ir.151.1995
ODP/TAMU (2005): JANUS Database. Ocean Drilling Program, Texas A&M University, College Station TX 77845-9547, USA; (data copied from Janus 2005-02 to 2005-06), http://www-odp.tamu.edu/database/
Project(s):
Ocean Drilling Program (ODP)
Coverage:
Latitude: 80.264700 * Longitude: 6.590000
Date/Time Start: 1993-08-17T15:30:00 * Date/Time End: 1993-08-17T23:38:00
Minimum DEPTH, sediment/rock: 4.24 m * Maximum DEPTH, sediment/rock: 21.74 m
Event(s):
151-910A * Latitude: 80.264700 * Longitude: 6.590000 * Date/Time Start: 1993-08-17T15:30:00 * Date/Time End: 1993-08-17T23:38:00 * Elevation: -567.0 m * Penetration: 34 m * Recovery: 24.26 m * Location: North Greenland Sea * Campaign: Leg151 * Basis: Joides Resolution * Method/Device: Drilling/drill rig (DRILL) * Comment: 5 cores; 34 m cored; 0 m drilled; 71.4 % recovery
Parameter(s):
# | Name | Short Name | Unit | Principal Investigator | Method/Device | Comment |
---|---|---|---|---|---|---|
1 | DEPTH, sediment/rock | Depth sed | m | Geocode | ||
2 | Depth, composite | Depth comp | mcd | Shipboard Scientific Party | ||
3 | Sample code/label | Sample label | Shipboard Scientific Party | DSDP/ODP/IODP sample designation | ||
4 | Sample comment | Sample comment | Shipboard Scientific Party | X-ray fluorescence (XRF) | ||
5 | Silicon dioxide | SiO2 | % | Shipboard Scientific Party | X-ray fluorescence (XRF) | |
6 | Titanium dioxide | TiO2 | % | Shipboard Scientific Party | X-ray fluorescence (XRF) | |
7 | Aluminium oxide | Al2O3 | % | Shipboard Scientific Party | X-ray fluorescence (XRF) | |
8 | Iron oxide, Fe2O3 | Fe2O3 | % | Shipboard Scientific Party | X-ray fluorescence (XRF) | |
9 | Manganese oxide | MnO | % | Shipboard Scientific Party | X-ray fluorescence (XRF) | |
10 | Magnesium oxide | MgO | % | Shipboard Scientific Party | X-ray fluorescence (XRF) | |
11 | Calcium oxide | CaO | % | Shipboard Scientific Party | X-ray fluorescence (XRF) | |
12 | Sodium oxide | Na2O | % | Shipboard Scientific Party | X-ray fluorescence (XRF) | |
13 | Potassium oxide | K2O | % | Shipboard Scientific Party | X-ray fluorescence (XRF) | |
14 | Phosphorus pentoxide | P2O5 | % | Shipboard Scientific Party | X-ray fluorescence (XRF) | |
15 | Sample type | Samp type | Shipboard Scientific Party | X-ray fluorescence (XRF) | ||
16 | Comment | Comment | Shipboard Scientific Party | X-ray fluorescence (XRF) |
License:
Creative Commons Attribution 3.0 Unported (CC-BY-3.0)
Size:
60 data points
Data
1 Depth sed [m] | 2 Depth comp [mcd] | 3 Sample label | 4 Sample comment | 5 SiO2 [%] | 6 TiO2 [%] | 7 Al2O3 [%] | 8 Fe2O3 [%] | 9 MnO [%] | 10 MgO [%] | 11 CaO [%] | 12 Na2O [%] | 13 K2O [%] | 14 P2O5 [%] | 15 Samp type | 16 Comment |
---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
4.24 | 4.24 | 151-910A-1H-3,124-126 | RUN ABE; REP A | 61.42 | 0.88 | 15.89 | 6.08 | 0.05 | 3.06 | 2.20 | 2.05 | 3.14 | 0.20 | Sediment | SEDIMENTS |
9.74 | 9.74 | 151-910A-2H-3,124-128 | RUN ABE; REP A | 61.42 | 0.89 | 15.64 | 6.11 | 0.05 | 3.03 | 2.24 | 1.96 | 3.15 | 0.20 | Sediment | SEDIMENTS |
17.13 | 17.13 | 151-910A-3H-2,63-67 | RUN ABE; REP A | 61.22 | 0.90 | 15.83 | 6.06 | 0.05 | 3.04 | 2.19 | 1.92 | 3.17 | 0.20 | Sediment | SEDIMENTS |
21.74 | 21.74 | 151-910A-4H-2,74-78 | RUN ABE; REP A | 62.55 | 0.89 | 15.55 | 5.90 | 0.05 | 2.99 | 2.15 | 1.95 | 3.17 | 0.20 | Sediment | SEDIMENTS |