Rea, David K; Basov, Ivan A; Shipboard Scientific Party (2005): X-ray fluorescence on samples of ODP Hole 145-883B [dataset]. PANGAEA, https://doi.org/10.1594/PANGAEA.271354
Always quote citation above when using data! You can download the citation in several formats below.
Related to:
ODP/TAMU (2005): JANUS Database. Ocean Drilling Program, Texas A&M University, College Station TX 77845-9547, USA; (data copied from Janus 2005-02 to 2005-06), http://www-odp.tamu.edu/database/
Rea, David K; Basov, L A; Janecek, Thomas R; Palmer-Julson, Amanda; et al. (1993): Proceedings of the Ocean Drilling Program|145 Initial Reports. Proceedings of the Ocean Drilling Program, Ocean Drilling Program, 145, 1040 pp, https://doi.org/10.2973/odp.proc.ir.145.1993
Project(s):
Ocean Drilling Program (ODP)
Coverage:
Latitude: 51.198500 * Longitude: 167.768800
Date/Time Start: 1992-08-09T09:40:00 * Date/Time End: 1992-08-12T09:00:00
Minimum DEPTH, sediment/rock: 209.78 m * Maximum DEPTH, sediment/rock: 818.65 m
Event(s):
145-883B * Latitude: 51.198500 * Longitude: 167.768800 * Date/Time Start: 1992-08-09T09:40:00 * Date/Time End: 1992-08-12T09:00:00 * Elevation: -2395.0 m * Penetration: 840.7 m * Recovery: 695.41 m * Location: North Pacific Ocean * Campaign: Leg145 * Basis: Joides Resolution * Method/Device: Drilling/drill rig (DRILL) * Comment: 88 cores; 840.7 m cored; 0 m drilled; 82.7 % recovery
Parameter(s):
# | Name | Short Name | Unit | Principal Investigator | Method/Device | Comment |
---|---|---|---|---|---|---|
1 | DEPTH, sediment/rock | Depth sed | m | Geocode | ||
2 | Depth, composite | Depth comp | mcd | Shipboard Scientific Party | ||
3 | Sample code/label | Sample label | Shipboard Scientific Party | DSDP/ODP/IODP sample designation | ||
4 | Sample comment | Sample comment | Shipboard Scientific Party | X-ray fluorescence (XRF) | ||
5 | Loss on ignition | LOI | % | Shipboard Scientific Party | X-ray fluorescence (XRF) | Bead_loi |
6 | Silicon dioxide | SiO2 | % | Shipboard Scientific Party | X-ray fluorescence (XRF) | |
7 | Titanium dioxide | TiO2 | % | Shipboard Scientific Party | X-ray fluorescence (XRF) | |
8 | Aluminium oxide | Al2O3 | % | Shipboard Scientific Party | X-ray fluorescence (XRF) | |
9 | Iron oxide, Fe2O3 | Fe2O3 | % | Shipboard Scientific Party | X-ray fluorescence (XRF) | |
10 | Manganese oxide | MnO | % | Shipboard Scientific Party | X-ray fluorescence (XRF) | |
11 | Magnesium oxide | MgO | % | Shipboard Scientific Party | X-ray fluorescence (XRF) | |
12 | Calcium oxide | CaO | % | Shipboard Scientific Party | X-ray fluorescence (XRF) | |
13 | Sodium oxide | Na2O | % | Shipboard Scientific Party | X-ray fluorescence (XRF) | |
14 | Potassium oxide | K2O | % | Shipboard Scientific Party | X-ray fluorescence (XRF) | |
15 | Phosphorus pentoxide | P2O5 | % | Shipboard Scientific Party | X-ray fluorescence (XRF) | |
16 | Sample type | Samp type | Shipboard Scientific Party | X-ray fluorescence (XRF) | ||
17 | Comment | Comment | Shipboard Scientific Party | X-ray fluorescence (XRF) |
License:
Creative Commons Attribution 3.0 Unported (CC-BY-3.0)
Size:
64 data points
Data
1 Depth sed [m] | 2 Depth comp [mcd] | 3 Sample label | 4 Sample comment | 5 LOI [%] | 6 SiO2 [%] | 7 TiO2 [%] | 8 Al2O3 [%] | 9 Fe2O3 [%] | 10 MnO [%] | 11 MgO [%] | 12 CaO [%] | 13 Na2O [%] | 14 K2O [%] | 15 P2O5 [%] | 16 Samp type | 17 Comment |
---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
209.78 | 209.78 | 145-883B-23H-2,88-90 | RUN GG; REP A | 6.63 | 68.79 | 0.74 | 11.64 | 6.78 | 0.09 | 2.11 | 5.47 | 2.53 | 1.06 | 0.52 | Sediment | SEDIMENT |
209.78 | 209.78 | 145-883B-23H-2,88-90 | RUN GG; REP B | 6.63 | 68.09 | 0.72 | 11.54 | 6.76 | 0.09 | 2.12 | 5.40 | 2.32 | 1.04 | 0.51 | Sediment | SEDIMENT |
818.65 | 818.65 | 145-883B-86X-1,15-18 | RUN GG; REP A | 2.73 | 56.66 | 2.36 | 14.30 | 14.33 | 0.26 | 4.98 | 0.82 | 1.74 | 3.03 | 0.44 | Sediment | SEDIMENT |
818.65 | 818.65 | 145-883B-86X-1,15-18 | RUN GG; REP B | 2.73 | 55.98 | 2.33 | 14.09 | 14.28 | 0.25 | 4.95 | 0.81 | 1.52 | 3.00 | 0.44 | Sediment | SEDIMENT |