Behrmann, Jan-Hinrich; Lewis, Stephen D; Shipboard Scientific Party (2005): X-ray fluorescence on samples of ODP Hole 141-863B [dataset]. PANGAEA, https://doi.org/10.1594/PANGAEA.271344
Always quote citation above when using data! You can download the citation in several formats below.
Related to:
Behrmann, Jan-Hinrich; Lewis, Stephen D; Musgrave, Robert J; et al. (1992): Proceedings of the Ocean Drilling Program, 141 Initial Reports. Proceedings of the Ocean Drilling Program, Ocean Drilling Program, 141, 807 pp, https://doi.org/10.2973/odp.proc.ir.141.1992
ODP/TAMU (2005): JANUS Database. Ocean Drilling Program, Texas A&M University, College Station TX 77845-9547, USA; (data copied from Janus 2005-02 to 2005-06), http://www-odp.tamu.edu/database/
Project(s):
Ocean Drilling Program (ODP)
Coverage:
Latitude: -46.237000 * Longitude: -75.772900
Date/Time Start: 1991-01-09T11:00:00 * Date/Time End: 1992-01-01T14:30:00
Minimum DEPTH, sediment/rock: 329.55 m * Maximum DEPTH, sediment/rock: 329.55 m
Event(s):
141-863B * Latitude: -46.237000 * Longitude: -75.772900 * Date/Time Start: 1992-01-01T14:30:00 * Date/Time End: 1991-01-09T11:00:00 * Elevation: -2576.0 m * Penetration: 742.9 m * Recovery: 192.91 m * Location: South Pacific Ocean * Campaign: Leg141 * Basis: Joides Resolution * Method/Device: Drilling/drill rig (DRILL) * Comment: 49 cores; 445.6 m cored; 0 m drilled; 43.3 % recovery
Parameter(s):
| # | Name | Short Name | Unit | Principal Investigator | Method/Device | Comment |
|---|---|---|---|---|---|---|
| 1 | DEPTH, sediment/rock | Depth sed | m | Geocode | ||
| 2 | Depth, composite | Depth comp | mcd | Shipboard Scientific Party | ||
| 3 | Sample code/label | Sample label | Shipboard Scientific Party | DSDP/ODP/IODP sample designation | ||
| 4 | Sample comment | Sample comment | Shipboard Scientific Party | X-ray fluorescence (XRF) | ||
| 5 | Silicon dioxide | SiO2 | % | Shipboard Scientific Party | X-ray fluorescence (XRF) | |
| 6 | Titanium dioxide | TiO2 | % | Shipboard Scientific Party | X-ray fluorescence (XRF) | |
| 7 | Aluminium oxide | Al2O3 | % | Shipboard Scientific Party | X-ray fluorescence (XRF) | |
| 8 | Iron oxide, Fe2O3 | Fe2O3 | % | Shipboard Scientific Party | X-ray fluorescence (XRF) | |
| 9 | Manganese oxide | MnO | % | Shipboard Scientific Party | X-ray fluorescence (XRF) | |
| 10 | Magnesium oxide | MgO | % | Shipboard Scientific Party | X-ray fluorescence (XRF) | |
| 11 | Calcium oxide | CaO | % | Shipboard Scientific Party | X-ray fluorescence (XRF) | |
| 12 | Sodium oxide | Na2O | % | Shipboard Scientific Party | X-ray fluorescence (XRF) | |
| 13 | Potassium oxide | K2O | % | Shipboard Scientific Party | X-ray fluorescence (XRF) | |
| 14 | Phosphorus pentoxide | P2O5 | % | Shipboard Scientific Party | X-ray fluorescence (XRF) | |
| 15 | Sample type | Samp type | Shipboard Scientific Party | X-ray fluorescence (XRF) | ||
| 16 | Comment | Comment | Shipboard Scientific Party | X-ray fluorescence (XRF) |
License:
Creative Commons Attribution 3.0 Unported (CC-BY-3.0)
Size:
30 data points
Data
| 1 Depth sed [m] | 2 Depth comp [mcd] | 3 Sample label | 4 Sample comment | 5 SiO2 [%] | 6 TiO2 [%] | 7 Al2O3 [%] | 8 Fe2O3 [%] | 9 MnO [%] | 10 MgO [%] | 11 CaO [%] | 12 Na2O [%] | 13 K2O [%] | 14 P2O5 [%] | 15 Samp type | 16 Comment |
|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
| 329.55 | 329.55 | 141-863B-4X-3,65-68 | RUN M8; REP A | 62.78 | 0.80 | 15.81 | 6.51 | 0.11 | 4.73 | 5.64 | 5.92 | 1.70 | 0.40 | Sediment | none |
| 329.55 | 329.55 | 141-863B-4X-3,65-68 | RUN M8; REP B | 53.93 | 0.69 | 13.48 | 5.73 | 0.10 | 4.32 | 4.84 | 5.45 | 1.46 | 0.36 | Sediment | none |