/* DATA DESCRIPTION: Citation: Davis, Earl E; Mottl, Michael J; Shipboard Scientific Party (2005): X-ray fluorescence on samples of ODP Hole 139-858D. PANGAEA, https://doi.org/10.1594/PANGAEA.271336 Related to: Davis, Earl E; Mottl, Michael J; Fisher, Andrew T; et al. (1992): Proceedings of the Ocean Drilling Program, 139 Initial Reports. Proceedings of the Ocean Drilling Program, Ocean Drilling Program, 139, 1026 pp, https://doi.org/10.2973/odp.proc.ir.139.1992 ODP/TAMU (2005): JANUS Database. Ocean Drilling Program, Texas A&M University, College Station TX 77845-9547, USA; (data copied from Janus 2005-02 to 2005-06), http://www-odp.tamu.edu/database/ Project(s): Ocean Drilling Program (ODP) (URI: http://www-odp.tamu.edu/) Coverage: LATITUDE: 48.456200 * LONGITUDE: -128.708000 DATE/TIME START: 1991-08-14T15:30:00 * DATE/TIME END: 1991-08-15T08:00:00 MINIMUM DEPTH, sediment/rock: 3.98 m * MAXIMUM DEPTH, sediment/rock: 29.25 m Event(s): 139-858D * LATITUDE: 48.456200 * LONGITUDE: -128.708000 * DATE/TIME START: 1991-08-14T15:30:00 * DATE/TIME END: 1991-08-15T08:00:00 * ELEVATION: -2426.0 m * Penetration: 40.7 m * Recovery: 30.43 m * LOCATION: North Pacific Ocean * CAMPAIGN: Leg139 (URI: https://doi.org/10.2973/odp.proc.ir.139.1992) * BASIS: Joides Resolution (URI: http://www-odp.tamu.edu/resolutn.html) * METHOD/DEVICE: Drilling/drill rig (DRILL) * COMMENT: 7 cores; 40.7 m cored; 0 m drilled; 74.8 % recovery Parameter(s): DEPTH, sediment/rock [m] (Depth sed) * GEOCODE Depth, composite [mcd] (Depth comp) * PI: Shipboard Scientific Party Sample code/label (Sample label) * PI: Shipboard Scientific Party * METHOD/DEVICE: DSDP/ODP/IODP sample designation (URI: hdl:10013/epic.27914.d001) Sample comment (Sample comment) * PI: Shipboard Scientific Party * METHOD/DEVICE: X-ray fluorescence (XRF) Loss on ignition [%] (LOI) * PI: Shipboard Scientific Party * METHOD/DEVICE: X-ray fluorescence (XRF) * COMMENT: Bead_loi Silicon dioxide [%] (SiO2) * PI: Shipboard Scientific Party * METHOD/DEVICE: X-ray fluorescence (XRF) Titanium dioxide [%] (TiO2) * PI: Shipboard Scientific Party * METHOD/DEVICE: X-ray fluorescence (XRF) Aluminium oxide [%] (Al2O3) * PI: Shipboard Scientific Party * METHOD/DEVICE: X-ray fluorescence (XRF) Iron oxide, Fe2O3 [%] (Fe2O3) * PI: Shipboard Scientific Party * METHOD/DEVICE: X-ray fluorescence (XRF) Manganese oxide [%] (MnO) * PI: Shipboard Scientific Party * METHOD/DEVICE: X-ray fluorescence (XRF) Magnesium oxide [%] (MgO) * PI: Shipboard Scientific Party * METHOD/DEVICE: X-ray fluorescence (XRF) Calcium oxide [%] (CaO) * PI: Shipboard Scientific Party * METHOD/DEVICE: X-ray fluorescence (XRF) Sodium oxide [%] (Na2O) * PI: Shipboard Scientific Party * METHOD/DEVICE: X-ray fluorescence (XRF) Potassium oxide [%] (K2O) * PI: Shipboard Scientific Party * METHOD/DEVICE: X-ray fluorescence (XRF) Phosphorus pentoxide [%] (P2O5) * PI: Shipboard Scientific Party * METHOD/DEVICE: X-ray fluorescence (XRF) Niobium [mg/kg] (Nb) * PI: Shipboard Scientific Party * METHOD/DEVICE: X-ray fluorescence (XRF) Zirconium [mg/kg] (Zr) * PI: Shipboard Scientific Party * METHOD/DEVICE: X-ray fluorescence (XRF) Yttrium [mg/kg] (Y) * PI: Shipboard Scientific Party * METHOD/DEVICE: X-ray fluorescence (XRF) Strontium [mg/kg] (Sr) * PI: Shipboard Scientific Party * METHOD/DEVICE: X-ray fluorescence (XRF) Rubidium [mg/kg] (Rb) * PI: Shipboard Scientific Party * METHOD/DEVICE: X-ray fluorescence (XRF) Zinc [mg/kg] (Zn) * PI: Shipboard Scientific Party * METHOD/DEVICE: X-ray fluorescence (XRF) Copper [mg/kg] (Cu) * PI: Shipboard Scientific Party * METHOD/DEVICE: X-ray fluorescence (XRF) Nickel [mg/kg] (Ni) * PI: Shipboard Scientific Party * METHOD/DEVICE: X-ray fluorescence (XRF) Chromium [mg/kg] (Cr) * PI: Shipboard Scientific Party * METHOD/DEVICE: X-ray fluorescence (XRF) Vanadium [mg/kg] (V) * PI: Shipboard Scientific Party * METHOD/DEVICE: X-ray fluorescence (XRF) Cerium [mg/kg] (Ce) * PI: Shipboard Scientific Party * METHOD/DEVICE: X-ray fluorescence (XRF) Barium [mg/kg] (Ba) * PI: Shipboard Scientific Party * METHOD/DEVICE: X-ray fluorescence (XRF) Sample type (Samp type) * PI: Shipboard Scientific Party * METHOD/DEVICE: X-ray fluorescence (XRF) Comment (Comment) * PI: Shipboard Scientific Party * METHOD/DEVICE: X-ray fluorescence (XRF) License: Creative Commons Attribution 3.0 Unported (CC-BY-3.0) (URI: https://creativecommons.org/licenses/by/3.0/) Size: 268 data points */ Depth sed [m] Depth comp [mcd] Sample label Sample comment LOI [%] SiO2 [%] TiO2 [%] Al2O3 [%] Fe2O3 [%] MnO [%] MgO [%] CaO [%] Na2O [%] K2O [%] P2O5 [%] Nb [mg/kg] Zr [mg/kg] Y [mg/kg] Sr [mg/kg] Rb [mg/kg] Zn [mg/kg] Cu [mg/kg] Ni [mg/kg] Cr [mg/kg] V [mg/kg] Ce [mg/kg] Ba [mg/kg] Samp type Comment 3.98 3.98 139-858D-1H-3,98-102 RUN AC; REP A 6.46 59.31 1.00 17.47 8.17 0.08 3.26 4.59 1.71 3.05 0.22 Sediment SEDIMENT 3.98 3.98 139-858D-1H-3,98-102 RUN AC; REP B 6.46 59.71 1.01 17.44 8.28 0.09 3.34 4.60 1.66 3.04 0.22 Sediment SEDIMENT 3.98 3.98 139-858D-1H-3,98-102 RUN UNKN; REP P 0.87 12 171 25 297 105 115 65 45 83 155 30 686 Sediment SEDIMENT 7.80 7.80 139-858D-1H-6,30-33 RUN AJ; REP A 5.77 58.74 0.91 17.97 8.25 0.12 4.03 5.30 2.58 2.83 0.23 Sediment SEDIMENT 7.80 7.80 139-858D-1H-6,30-33 RUN AJ; REP B 5.77 58.72 0.90 17.97 8.26 0.12 3.99 5.29 2.67 2.83 0.23 Sediment SEDIMENT 7.80 7.80 139-858D-1H-6,30-33 RUN UNKN; REP P 0.85 9 134 20 349 88 131 61 58 89 169 7 706 Sediment SEDIMENT 11.91 11.91 139-858D-2H-2,111-113 RUN AH; REP A 5.23 59.31 0.90 16.99 9.48 0.09 4.82 2.63 1.67 3.09 0.19 Sediment SEDIMENT 11.91 11.91 139-858D-2H-2,111-113 RUN AH; REP B 5.23 59.48 0.91 17.03 9.46 0.09 4.91 2.66 1.80 3.09 0.19 Sediment SEDIMENT 11.91 11.91 139-858D-2H-2,111-113 RUN UNKN; REP P 0.88 10 129 21 164 96 117 55 54 103 194 2 977 Sediment SEDIMENT 18.53 18.53 139-858D-2H-7,23-25 RUN AI; REP A 6.76 61.21 0.82 16.05 9.57 0.11 7.17 0.58 1.16 3.64 0.16 Sediment SEDIMENT 18.53 18.53 139-858D-2H-7,23-25 RUN AI; REP B 6.76 60.81 0.82 15.96 9.39 0.11 7.15 0.58 1.16 3.61 0.16 Sediment SEDIMENT 18.53 18.53 139-858D-2H-7,23-25 RUN UNKN; REP P 0.79 11 130 19 90 109 144 63 60 101 180 13 954 Sediment SEDIMENT 23.63 23.63 139-858D-4H-4,59-63 RUN AH; REP A 28.80 69.78 0.80 16.04 4.68 0.05 5.56 0.45 0.47 3.30 0.21 Sediment SEDIMENT 23.63 23.63 139-858D-4H-4,59-63 RUN AH; REP B 28.80 69.32 0.81 15.94 4.55 0.06 5.51 0.45 0.29 3.27 0.21 Sediment SEDIMENT 23.63 23.63 139-858D-4H-4,59-63 RUN UNKN; REP P 0.80 13 150 19 53 108 103 38 37 114 153 15 491 Sediment SEDIMENT 29.25 29.25 139-858D-6X-1,45-49 RUN UNKN; REP P 0.58 8 96 16 18 6 21 33 40 81 118 4 14 Sediment SEDIMENT