/* DATA DESCRIPTION: Citation: Parson, Lindsey M; Hawkins, James W; Shipboard Scientific Party (2005): X-ray fluorescence on samples of ODP Hole 135-838A. PANGAEA, https://doi.org/10.1594/PANGAEA.271298 Related to: ODP/TAMU (2005): JANUS Database. Ocean Drilling Program, Texas A&M University, College Station TX 77845-9547, USA; (data copied from Janus 2005-02 to 2005-06), http://www-odp.tamu.edu/database/ Parson, Lindsey M; Hawkins, James W; Allan, J; et al. (1992): Proceedings of the Ocean Drilling Program, 135 Initial Reports. Proceedings of the Ocean Drilling Program, Ocean Drilling Program, 135, 1230 pp, https://doi.org/10.2973/odp.proc.ir.135.1992 Project(s): Ocean Drilling Program (ODP) (URI: http://www-odp.tamu.edu/) Coverage: LATITUDE: -20.827000 * LONGITUDE: -176.890000 DATE/TIME START: 1991-01-12T06:45:00 * DATE/TIME END: 1991-01-13T16:25:00 MINIMUM DEPTH, sediment/rock: 55.70 m * MAXIMUM DEPTH, sediment/rock: 72.65 m Event(s): 135-838A * LATITUDE: -20.827000 * LONGITUDE: -176.890000 * DATE/TIME START: 1991-01-12T06:45:00 * DATE/TIME END: 1991-01-13T16:25:00 * ELEVATION: -2334.0 m * Penetration: 153.8 m * Recovery: 98.65 m * LOCATION: South Pacific Ocean * CAMPAIGN: Leg135 (URI: https://doi.org/10.2973/odp.proc.ir.135.1992) * BASIS: Joides Resolution (URI: http://www-odp.tamu.edu/resolutn.html) * METHOD/DEVICE: Drilling/drill rig (DRILL) * COMMENT: 20 cores; 153.8 m cored; 0 m drilled; 64.1 % recovery Parameter(s): DEPTH, sediment/rock [m] (Depth sed) * GEOCODE Depth, composite [mcd] (Depth comp) * PI: Shipboard Scientific Party Sample code/label (Sample label) * PI: Shipboard Scientific Party * METHOD/DEVICE: DSDP/ODP/IODP sample designation (URI: hdl:10013/epic.27914.d001) Sample comment (Sample comment) * PI: Shipboard Scientific Party * METHOD/DEVICE: X-ray fluorescence (XRF) Loss on ignition [%] (LOI) * PI: Shipboard Scientific Party * METHOD/DEVICE: X-ray fluorescence (XRF) * COMMENT: Bead_loi Silicon dioxide [%] (SiO2) * PI: Shipboard Scientific Party * METHOD/DEVICE: X-ray fluorescence (XRF) Titanium dioxide [%] (TiO2) * PI: Shipboard Scientific Party * METHOD/DEVICE: X-ray fluorescence (XRF) Aluminium oxide [%] (Al2O3) * PI: Shipboard Scientific Party * METHOD/DEVICE: X-ray fluorescence (XRF) Iron oxide, Fe2O3 [%] (Fe2O3) * PI: Shipboard Scientific Party * METHOD/DEVICE: X-ray fluorescence (XRF) Manganese oxide [%] (MnO) * PI: Shipboard Scientific Party * METHOD/DEVICE: X-ray fluorescence (XRF) Magnesium oxide [%] (MgO) * PI: Shipboard Scientific Party * METHOD/DEVICE: X-ray fluorescence (XRF) Calcium oxide [%] (CaO) * PI: Shipboard Scientific Party * METHOD/DEVICE: X-ray fluorescence (XRF) Sodium oxide [%] (Na2O) * PI: Shipboard Scientific Party * METHOD/DEVICE: X-ray fluorescence (XRF) Potassium oxide [%] (K2O) * PI: Shipboard Scientific Party * METHOD/DEVICE: X-ray fluorescence (XRF) Phosphorus pentoxide [%] (P2O5) * PI: Shipboard Scientific Party * METHOD/DEVICE: X-ray fluorescence (XRF) Niobium [mg/kg] (Nb) * PI: Shipboard Scientific Party * METHOD/DEVICE: X-ray fluorescence (XRF) Zirconium [mg/kg] (Zr) * PI: Shipboard Scientific Party * METHOD/DEVICE: X-ray fluorescence (XRF) Yttrium [mg/kg] (Y) * PI: Shipboard Scientific Party * METHOD/DEVICE: X-ray fluorescence (XRF) Strontium [mg/kg] (Sr) * PI: Shipboard Scientific Party * METHOD/DEVICE: X-ray fluorescence (XRF) Rubidium [mg/kg] (Rb) * PI: Shipboard Scientific Party * METHOD/DEVICE: X-ray fluorescence (XRF) Zinc [mg/kg] (Zn) * PI: Shipboard Scientific Party * METHOD/DEVICE: X-ray fluorescence (XRF) Copper [mg/kg] (Cu) * PI: Shipboard Scientific Party * METHOD/DEVICE: X-ray fluorescence (XRF) Nickel [mg/kg] (Ni) * PI: Shipboard Scientific Party * METHOD/DEVICE: X-ray fluorescence (XRF) Chromium [mg/kg] (Cr) * PI: Shipboard Scientific Party * METHOD/DEVICE: X-ray fluorescence (XRF) Vanadium [mg/kg] (V) * PI: Shipboard Scientific Party * METHOD/DEVICE: X-ray fluorescence (XRF) Cerium [mg/kg] (Ce) * PI: Shipboard Scientific Party * METHOD/DEVICE: X-ray fluorescence (XRF) Barium [mg/kg] (Ba) * PI: Shipboard Scientific Party * METHOD/DEVICE: X-ray fluorescence (XRF) Comment (Comment) * PI: Shipboard Scientific Party * METHOD/DEVICE: X-ray fluorescence (XRF) License: Creative Commons Attribution 3.0 Unported (CC-BY-3.0) (URI: https://creativecommons.org/licenses/by/3.0/) Size: 94 data points */ Depth sed [m] Depth comp [mcd] Sample label Sample comment LOI [%] SiO2 [%] TiO2 [%] Al2O3 [%] Fe2O3 [%] MnO [%] MgO [%] CaO [%] Na2O [%] K2O [%] P2O5 [%] Nb [mg/kg] Zr [mg/kg] Y [mg/kg] Sr [mg/kg] Rb [mg/kg] Zn [mg/kg] Cu [mg/kg] Ni [mg/kg] Cr [mg/kg] V [mg/kg] Ce [mg/kg] Ba [mg/kg] Comment 55.70 55.70 135-838A-7H-4,0-150 RUN UNKN; REP A 5.29 72.44 0.58 13.15 3.42 0.14 0.92 3.03 4.28 1.53 0.12 NONE 55.70 55.70 135-838A-7H-4,0-150 RUN UNKN; REP B 5.29 71.72 0.58 13.09 3.47 0.14 0.95 3.01 4.25 1.51 0.12 NONE 55.70 55.70 135-838A-7H-4,0-150 RUN UNKN; REP P 0.47 3 145 49 176 22 56 10 1 0 29 33 270 none 72.65 72.65 135-838A-9H-2,95-117 RUN UNKN; REP A 0.62 52.11 0.81 16.25 11.33 0.22 5.65 11.17 1.54 0.30 0.10 NONE 72.65 72.65 135-838A-9H-2,95-117 RUN UNKN; REP B 0.62 52.18 0.81 16.22 11.29 0.22 5.61 11.09 1.54 0.31 0.09 NONE 72.65 72.65 135-838A-9H-2,95-117 RUN UNKN; REP P 0.87 1 40 17 199 6 74 147 18 21 373 13 76 none