/* DATA DESCRIPTION: Citation: Gradstein, Felix M; Ludden, John N; Shipboard Scientific Party (2005): X-ray fluorescence on samples of ODP Hole 123-766A. PANGAEA, https://doi.org/10.1594/PANGAEA.271234 Related to: Ludden, John N; Gradstein, Felix M; et al. (1990): Proceedings of the Ocean Drilling Program, 123 Initial Reports. Proceedings of the Ocean Drilling Program, Ocean Drilling Program, 123, 716 pp, https://doi.org/10.2973/odp.proc.ir.123.1990 ODP/TAMU (2005): JANUS Database. Ocean Drilling Program, Texas A&M University, College Station TX 77845-9547, USA; (data copied from Janus 2005-02 to 2005-06), http://www-odp.tamu.edu/database/ Project(s): Ocean Drilling Program (ODP) (URI: http://www-odp.tamu.edu/) Coverage: LATITUDE: -19.932000 * LONGITUDE: 110.454100 DATE/TIME START: 1988-10-19T20:45:00 * DATE/TIME END: 1988-10-26T00:00:00 MINIMUM DEPTH, sediment/rock: 82.03 m * MAXIMUM DEPTH, sediment/rock: 521.29 m Event(s): 123-766A * LATITUDE: -19.932000 * LONGITUDE: 110.454100 * DATE/TIME START: 1988-10-19T20:45:00 * DATE/TIME END: 1988-10-26T00:00:00 * ELEVATION: -4008.0 m * Penetration: 527.2 m * Recovery: 347.49 m * LOCATION: South Indian Ridge, South Indian Ocean * CAMPAIGN: Leg123 (URI: https://doi.org/10.2973/odp.proc.ir.123.1990) * BASIS: Joides Resolution (URI: http://www-odp.tamu.edu/resolutn.html) * METHOD/DEVICE: Drilling/drill rig (DRILL) * COMMENT: 55 cores; 527.2 m cored; 0 m drilled; 65.9 % recovery Parameter(s): DEPTH, sediment/rock [m] (Depth sed) * GEOCODE Depth, composite [mcd] (Depth comp) * PI: Shipboard Scientific Party Sample code/label (Sample label) * PI: Shipboard Scientific Party * METHOD/DEVICE: DSDP/ODP/IODP sample designation (URI: hdl:10013/epic.27914.d001) Sample comment (Sample comment) * PI: Shipboard Scientific Party * METHOD/DEVICE: X-ray fluorescence (XRF) Loss on ignition [%] (LOI) * PI: Shipboard Scientific Party * METHOD/DEVICE: X-ray fluorescence (XRF) * COMMENT: Bead_loi Silicon dioxide [%] (SiO2) * PI: Shipboard Scientific Party * METHOD/DEVICE: X-ray fluorescence (XRF) Titanium dioxide [%] (TiO2) * PI: Shipboard Scientific Party * METHOD/DEVICE: X-ray fluorescence (XRF) Aluminium oxide [%] (Al2O3) * PI: Shipboard Scientific Party * METHOD/DEVICE: X-ray fluorescence (XRF) Iron oxide, Fe2O3 [%] (Fe2O3) * PI: Shipboard Scientific Party * METHOD/DEVICE: X-ray fluorescence (XRF) Manganese oxide [%] (MnO) * PI: Shipboard Scientific Party * METHOD/DEVICE: X-ray fluorescence (XRF) Magnesium oxide [%] (MgO) * PI: Shipboard Scientific Party * METHOD/DEVICE: X-ray fluorescence (XRF) Calcium oxide [%] (CaO) * PI: Shipboard Scientific Party * METHOD/DEVICE: X-ray fluorescence (XRF) Sodium oxide [%] (Na2O) * PI: Shipboard Scientific Party * METHOD/DEVICE: X-ray fluorescence (XRF) Potassium oxide [%] (K2O) * PI: Shipboard Scientific Party * METHOD/DEVICE: X-ray fluorescence (XRF) Phosphorus pentoxide [%] (P2O5) * PI: Shipboard Scientific Party * METHOD/DEVICE: X-ray fluorescence (XRF) Niobium [mg/kg] (Nb) * PI: Shipboard Scientific Party * METHOD/DEVICE: X-ray fluorescence (XRF) Zirconium [mg/kg] (Zr) * PI: Shipboard Scientific Party * METHOD/DEVICE: X-ray fluorescence (XRF) Yttrium [mg/kg] (Y) * PI: Shipboard Scientific Party * METHOD/DEVICE: X-ray fluorescence (XRF) Strontium [mg/kg] (Sr) * PI: Shipboard Scientific Party * METHOD/DEVICE: X-ray fluorescence (XRF) Rubidium [mg/kg] (Rb) * PI: Shipboard Scientific Party * METHOD/DEVICE: X-ray fluorescence (XRF) Zinc [mg/kg] (Zn) * PI: Shipboard Scientific Party * METHOD/DEVICE: X-ray fluorescence (XRF) Copper [mg/kg] (Cu) * PI: Shipboard Scientific Party * METHOD/DEVICE: X-ray fluorescence (XRF) Nickel [mg/kg] (Ni) * PI: Shipboard Scientific Party * METHOD/DEVICE: X-ray fluorescence (XRF) Chromium [mg/kg] (Cr) * PI: Shipboard Scientific Party * METHOD/DEVICE: X-ray fluorescence (XRF) Vanadium [mg/kg] (V) * PI: Shipboard Scientific Party * METHOD/DEVICE: X-ray fluorescence (XRF) Cerium [mg/kg] (Ce) * PI: Shipboard Scientific Party * METHOD/DEVICE: X-ray fluorescence (XRF) Barium [mg/kg] (Ba) * PI: Shipboard Scientific Party * METHOD/DEVICE: X-ray fluorescence (XRF) Sample type (Samp type) * PI: Shipboard Scientific Party * METHOD/DEVICE: X-ray fluorescence (XRF) Comment (Comment) * PI: Shipboard Scientific Party * METHOD/DEVICE: X-ray fluorescence (XRF) License: Creative Commons Attribution 3.0 Unported (CC-BY-3.0) (URI: https://creativecommons.org/licenses/by/3.0/) Size: 495 data points */ Depth sed [m] Depth comp [mcd] Sample label Sample comment LOI [%] SiO2 [%] TiO2 [%] Al2O3 [%] Fe2O3 [%] MnO [%] MgO [%] CaO [%] Na2O [%] K2O [%] P2O5 [%] Nb [mg/kg] Zr [mg/kg] Y [mg/kg] Sr [mg/kg] Rb [mg/kg] Zn [mg/kg] Cu [mg/kg] Ni [mg/kg] Cr [mg/kg] V [mg/kg] Ce [mg/kg] Ba [mg/kg] Samp type Comment 82.03 82.03 123-766A-9R-5,73-75 RUN UNKN; REP A 2.51 50.41 2.65 17.72 10.05 0.10 4.80 8.18 3.79 1.48 0.32 Sediment BASALT PEBBLE 82.03 82.03 123-766A-9R-5,73-75 RUN UNKN; REP P 14 162 29 214 55 267 106 46 724 337 35 122 Sediment BASALT PEBBLE 430.66 430.66 123-766A-45R-6,36-40 RUN UNKN; REP B 8.60 57.05 1.13 20.46 8.98 0.04 4.42 0.65 1.77 3.73 0.13 Sediment SEDIMENT SAMPLE 460.87 460.87 123-766A-48R-7,25-27 RUN UNKN; REP A 2.26 46.36 2.90 16.50 16.92 0.15 5.34 7.06 3.92 0.09 0.22 BASEMENT 460.87 460.87 123-766A-48R-7,25-27 RUN UNKN; REP P 5 167 46 129 0 155 92 61 160 617 24 10 BASEMENT 467.06 467.06 123-766A-49R-4,106-108 RUN UNKN; REP A 1.10 49.23 1.08 14.90 10.25 0.16 7.69 13.23 2.72 0.06 0.06 BASEMENT 467.06 467.06 123-766A-49R-4,106-108 RUN UNKN; REP P 2 56 26 106 0 84 116 70 315 303 6 0 BASEMENT 471.88 471.88 123-766A-50R-1,68-70 RUN UNKN; REP A 3.39 45.85 2.19 14.60 17.63 0.12 9.99 3.54 3.52 0.90 0.14 BASEMENT 471.88 471.88 123-766A-50R-1,68-70 RUN UNKN; REP P 2 113 41 88 3 352 113 83 161 479 28 6 BASEMENT 472.93 472.93 123-766A-50R-2,26-28 RUN UNKN; REP A 1.43 48.06 1.86 14.42 14.17 0.24 6.96 9.81 2.88 0.05 0.13 BASEMENT 472.93 472.93 123-766A-50R-2,26-28 RUN UNKN; REP P 2 97 43 98 1 131 101 69 141 434 12 4 BASEMENT 481.93 481.93 123-766A-51R-2,8-10 RUN UNKN; REP A 0.02 49.76 1.76 13.04 15.21 0.22 6.34 10.41 2.40 0.05 0.12 BASEMENT 481.93 481.93 123-766A-51R-2,8-10 RUN UNKN; REP P 3 99 43 78 0 128 96 63 126 427 16 4 BASEMENT 487.39 487.39 123-766A-51R-5,118-120 RUN UNKN; REP A 0.23 49.91 1.73 13.05 15.05 0.20 6.63 10.19 2.45 0.05 0.11 BASEMENT 487.39 487.39 123-766A-51R-5,118-120 RUN UNKN; REP P 3 87 41 79 0 110 94 59 121 421 15 6 BASEMENT 494.67 494.67 123-766A-52R-4,47-49 RUN UNKN; REP A 49.94 1.67 12.96 14.94 0.21 6.74 10.41 2.55 0.05 0.11 BASEMENT 494.67 494.67 123-766A-52R-4,47-49 RUN UNKN; REP B 49.94 1.67 12.96 14.94 0.21 6.74 10.41 2.55 0.05 0.11 BASEMENT 494.67 494.67 123-766A-52R-4,47-49 RUN UNKN; REP P 2 91 40 79 0 104 91 64 124 418 11 0 BASEMENT 497.09 497.09 123-766A-52R-6,4-6 RUN UNKN; REP A 0.10 49.64 1.65 13.06 14.89 0.23 6.93 10.76 2.56 0.04 0.10 BASEMENT 497.09 497.09 123-766A-52R-6,4-6 RUN UNKN; REP P 2 89 40 77 0 104 92 62 136 412 10 14 BASEMENT 502.61 502.61 123-766A-53R-3,91-93 RUN UNKN; REP A 1.23 49.15 2.07 11.89 16.94 0.26 6.24 9.68 2.65 0.05 0.13 BASEMENT 502.61 502.61 123-766A-53R-3,91-93 RUN UNKN; REP P 3 112 49 77 0 121 95 41 25 493 14 9 BASEMENT 503.55 503.55 123-766A-53R-4,75-77 RUN UNKN; REP A 1.31 49.92 1.68 13.04 14.29 0.22 6.84 10.97 2.40 0.05 0.11 BASEMENT 503.55 503.55 123-766A-53R-4,75-77 RUN UNKN; REP B 1.31 49.42 1.68 13.04 14.29 0.22 6.84 10.97 2.40 0.05 0.11 BASEMENT 503.55 503.55 123-766A-53R-4,75-77 RUN UNKN; REP P 3 92 39 83 0 103 99 63 133 417 6 7 BASEMENT 512.09 512.09 123-766A-54R-3,116-118 RUN UNKN; REP A 1.10 49.80 1.71 12.99 14.47 0.20 6.85 10.54 2.54 0.05 0.11 BASEMENT 512.09 512.09 123-766A-54R-3,116-118 RUN UNKN; REP P 3 90 42 80 0 108 80 63 118 428 12 7 BASEMENT 519.52 519.52 123-766A-55R-2,74-76 RUN UNKN; REP A 1.72 49.41 1.66 13.11 14.54 0.21 6.93 10.71 2.31 0.04 0.10 BASEMENT 519.52 519.52 123-766A-55R-2,74-76 RUN UNKN; REP B 1.72 49.41 1.66 13.11 14.54 0.21 6.93 10.71 2.31 0.04 0.10 BASEMENT 519.52 519.52 123-766A-55R-2,74-76 RUN UNKN; REP P 3 86 41 77 0 108 94 65 136 412 0 0 BASEMENT 521.29 521.29 123-766A-55R-3,105-118 RUN UNKN; REP A 0.68 49.59 1.68 12.95 14.96 0.22 6.65 10.68 2.52 0.05 0.11 BASEMENT 521.29 521.29 123-766A-55R-3,105-118 RUN UNKN; REP P 3 94 45 76 0 122 102 64 123 403 12 6 BASEMENT