Barron, John A; Larsen, Birger; Shipboard Scientific Party (2005): X-ray fluorescence on samples of ODP Hole 119-744A [dataset]. PANGAEA, https://doi.org/10.1594/PANGAEA.271215
Always quote citation above when using data! You can download the citation in several formats below.
Related to:
Barron, John A; Larsen, Birger; et al. (1989): Proceedings of the Ocean Drilling Program, 119 Initial Reports. Proceedings of the Ocean Drilling Program, Ocean Drilling Program, 119, 942 pp, https://doi.org/10.2973/odp.proc.ir.119.1989
ODP/TAMU (2005): JANUS Database. Ocean Drilling Program, Texas A&M University, College Station TX 77845-9547, USA; (data copied from Janus 2005-02 to 2005-06), http://www-odp.tamu.edu/database/
Project(s):
Ocean Drilling Program (ODP)
Coverage:
Latitude: -61.579000 * Longitude: 80.595000
Date/Time Start: 1988-02-05T19:00:00 * Date/Time End: 1988-02-06T19:15:00
Minimum DEPTH, sediment/rock: 10.09 m * Maximum DEPTH, sediment/rock: 47.59 m
Event(s):
119-744A * Latitude: -61.579000 * Longitude: 80.595000 * Date/Time Start: 1988-02-05T19:00:00 * Date/Time End: 1988-02-06T19:15:00 * Elevation: -2318.0 m * Penetration: 176.1 m * Recovery: 144.91 m * Location: Indian Ocean * Campaign: Leg119 * Basis: Joides Resolution * Method/Device: Drilling/drill rig (DRILL) * Comment: 20 cores; 176.1 m cored; 0 m drilled; 82.3 % recovery
Parameter(s):
# | Name | Short Name | Unit | Principal Investigator | Method/Device | Comment |
---|---|---|---|---|---|---|
1 | DEPTH, sediment/rock | Depth sed | m | Geocode | ||
2 | Depth, composite | Depth comp | mcd | Shipboard Scientific Party | ||
3 | Sample code/label | Sample label | Shipboard Scientific Party | DSDP/ODP/IODP sample designation | ||
4 | Sample comment | Sample comment | Shipboard Scientific Party | X-ray fluorescence (XRF) | ||
5 | Silicon dioxide | SiO2 | % | Shipboard Scientific Party | X-ray fluorescence (XRF) | |
6 | Titanium dioxide | TiO2 | % | Shipboard Scientific Party | X-ray fluorescence (XRF) | |
7 | Aluminium oxide | Al2O3 | % | Shipboard Scientific Party | X-ray fluorescence (XRF) | |
8 | Iron oxide, Fe2O3 | Fe2O3 | % | Shipboard Scientific Party | X-ray fluorescence (XRF) | |
9 | Manganese oxide | MnO | % | Shipboard Scientific Party | X-ray fluorescence (XRF) | |
10 | Magnesium oxide | MgO | % | Shipboard Scientific Party | X-ray fluorescence (XRF) | |
11 | Calcium oxide | CaO | % | Shipboard Scientific Party | X-ray fluorescence (XRF) | |
12 | Sodium oxide | Na2O | % | Shipboard Scientific Party | X-ray fluorescence (XRF) | |
13 | Potassium oxide | K2O | % | Shipboard Scientific Party | X-ray fluorescence (XRF) | |
14 | Phosphorus pentoxide | P2O5 | % | Shipboard Scientific Party | X-ray fluorescence (XRF) | |
15 | Sample type | Samp type | Shipboard Scientific Party | X-ray fluorescence (XRF) |
License:
Creative Commons Attribution 3.0 Unported (CC-BY-3.0)
Size:
24 data points
Data
1 Depth sed [m] | 2 Depth comp [mcd] | 3 Sample label | 4 Sample comment | 5 SiO2 [%] | 6 TiO2 [%] | 7 Al2O3 [%] | 8 Fe2O3 [%] | 9 MnO [%] | 10 MgO [%] | 11 CaO [%] | 12 Na2O [%] | 13 K2O [%] | 14 P2O5 [%] | 15 Samp type |
---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
10.09 | 10.09 | 119-744A-2H-CC,10-15 | RUN UNKN; REP A | 75.77 | 0.34 | 13.10 | 2.73 | 0.59 | 0.34 | 1.38 | 2.89 | 3.97 | 0.09 | Sediment |
47.59 | 47.59 | 119-744A-6H-4,89-90 | RUN UNKN; REP A | 2.58 | 0.29 | 0.18 | 0.06 | 96.30 | 0.05 | Sediment |