Lange, Carina Beatriz; Wefer, Gerold; Berger, Wolfgang H; Richter, Carl; Shipboard Scientific Party (2005): Paleontological investigation on diatoms of ODP Hole 175-1079A [dataset]. PANGAEA, https://doi.org/10.1594/PANGAEA.270081
Always quote citation above when using data! You can download the citation in several formats below.
Related to:
ODP/TAMU (2005): JANUS Database. Ocean Drilling Program, Texas A&M University, College Station TX 77845-9547, USA; (data copied from Janus 2005-02 to 2005-06), http://www-odp.tamu.edu/database/
Wefer, Gerold; Berger, Wolfgang H; Richter, C; et al. (1998): Proceedings of the Ocean Drilling Program 175 Initial Reports. Proceedings of the Ocean Drilling Program, Ocean Drilling Program, 175, online, https://doi.org/10.2973/odp.proc.ir.175.1998
Project(s):
Ocean Drilling Program (ODP)
Coverage:
Latitude: -11.929610 * Longitude: 13.309050
Date/Time Start: 1997-09-04T16:04:00 * Date/Time End: 1997-09-05T03:55:00
Minimum DEPTH, sediment/rock: 5.29 m * Maximum DEPTH, sediment/rock: 121.02 m
Event(s):
175-1079A * Latitude: -11.929610 * Longitude: 13.309050 * Date/Time Start: 1997-09-04T16:04:00 * Date/Time End: 1997-09-05T03:55:00 * Elevation: -737.9 m * Penetration: 121 m * Recovery: 124.61 m * Location: Benguela Current, South Atlantic Ocean * Campaign: Leg175 * Basis: Joides Resolution * Method/Device: Drilling/drill rig (DRILL) * Comment: 14 cores; 121 m cored; 0 m drilled; 103 % recovery
Parameter(s):
# | Name | Short Name | Unit | Principal Investigator | Method/Device | Comment |
---|---|---|---|---|---|---|
1 | DEPTH, sediment/rock | Depth sed | m | Geocode | ||
2 | Depth, composite | Depth comp | mcd | Lange, Carina Beatriz | ||
3 | Sample code/label | Sample label | Lange, Carina Beatriz | DSDP/ODP/IODP sample designation | ||
4 | Abundance | Abund | Lange, Carina Beatriz | Diatoms | ||
5 | Preservation | Preserv | Lange, Carina Beatriz | |||
6 | Comment | Comment | Lange, Carina Beatriz |
License:
Creative Commons Attribution 3.0 Unported (CC-BY-3.0)
Size:
57 data points
Data
1 Depth sed [m] | 2 Depth comp [mcd] | 3 Sample label | 4 Abund | 5 Preserv | 6 Comment |
---|---|---|---|---|---|
5.29 | 5.29 | 175-1079A-1H-CC,23 | T | P | also checked 38?m fraction |
15.16 | 15.16 | 175-1079A-2H-CC,22 | B | also checked 63 ?m fraction | |
24.78 | 25.64 | 175-1079A-3H-CC,15 | B | also checked 63 ?m fraction | |
34.04 | 35.60 | 175-1079A-4H-CC,17 | B | also checked 63 ?m fraction | |
43.57 | 45.25 | 175-1079A-5H-CC,27 | B | also checked 63 ?m fraction | |
53.19 | 55.49 | 175-1079A-6H-CC,23 | T | also checked 63? fraction | |
62.84 | 65.52 | 175-1079A-7H-CC,20 | B | also checked 63 ?m fraction | |
72.48 | 76.63 | 175-1079A-8H-CC,37 | B | also checked 63 ?m fraction | |
81.28 | 85.43 | 175-1079A-9H-CC,22 | B | also checked 63 ?m fraction | |
92.14 | 96.53 | 175-1079A-10H-CC,36 | B | also checked 63?m fraction | |
99.01 | 103.40 | 175-1079A-11H-CC,0 | B | also checked 63 ?m fraction | |
108.38 | 112.77 | 175-1079A-12H-CC,44 | B | also checked 63 ?m fraction | |
117.13 | 121.52 | 175-1079A-13H-CC,32 | B | also checked 63 ?m fraction | |
121.02 | 125.41 | 175-1079A-14H-CC,25 | B | also checked 63 ?m fraction |