Lange, Carina Beatriz; Wefer, Gerold; Berger, Wolfgang H; Richter, Carl; Shipboard Scientific Party (2005): Paleontological investigation on diatoms of ODP Hole 175-1078C [dataset]. PANGAEA, https://doi.org/10.1594/PANGAEA.270080
Always quote citation above when using data! You can download the citation in several formats below.
Related to:
ODP/TAMU (2005): JANUS Database. Ocean Drilling Program, Texas A&M University, College Station TX 77845-9547, USA; (data copied from Janus 2005-02 to 2005-06), http://www-odp.tamu.edu/database/
Wefer, Gerold; Berger, Wolfgang H; Richter, C; et al. (1998): Proceedings of the Ocean Drilling Program 175 Initial Reports. Proceedings of the Ocean Drilling Program, Ocean Drilling Program, 175, online, https://doi.org/10.2973/odp.proc.ir.175.1998
Project(s):
Ocean Drilling Program (ODP)
Coverage:
Latitude: -11.920770 * Longitude: 13.400250
Date/Time Start: 1997-09-03T18:10:00 * Date/Time End: 1997-09-04T06:05:00
Minimum DEPTH, sediment/rock: 131.47 m * Maximum DEPTH, sediment/rock: 160.94 m
Event(s):
175-1078C * Latitude: -11.920770 * Longitude: 13.400250 * Date/Time Start: 1997-09-03T18:10:00 * Date/Time End: 1997-09-04T06:05:00 * Elevation: -426.0 m * Penetration: 165.2 m * Recovery: 149.58 m * Location: Benguela Current, South Atlantic Ocean * Campaign: Leg175 * Basis: Joides Resolution * Method/Device: Drilling/drill rig (DRILL) * Comment: 18 cores; 165.2 m cored; 0 m drilled; 90.5 % recovery
Parameter(s):
| # | Name | Short Name | Unit | Principal Investigator | Method/Device | Comment |
|---|---|---|---|---|---|---|
| 1 | DEPTH, sediment/rock | Depth sed | m | Geocode | ||
| 2 | Depth, composite | Depth comp | mcd | Lange, Carina Beatriz | ||
| 3 | Sample code/label | Sample label | Lange, Carina Beatriz | DSDP/ODP/IODP sample designation | ||
| 4 | Abundance | Abund | Lange, Carina Beatriz | Diatoms | ||
| 5 | Preservation | Preserv | Lange, Carina Beatriz | |||
| 6 | Comment | Comment | Lange, Carina Beatriz |
License:
Creative Commons Attribution 3.0 Unported (CC-BY-3.0)
Size:
40 data points
Data
| 1 Depth sed [m] | 2 Depth comp [mcd] | 3 Sample label | 4 Abund | 5 Preserv | 6 Comment |
|---|---|---|---|---|---|
| 131.47 | 131.47 | 175-1078C-15X-2,117.3 | B | LIGHT LAYER | |
| 131.51 | 131.51 | 175-1078C-15X-2,120.7 | R | P | DARK LAYER |
| 131.53 | 131.53 | 175-1078C-15X-2,122.6 | F | MP | DARK LAYER |
| 131.58 | 131.58 | 175-1078C-15X-2,128.2 | C | M | LIGHT LAYER |
| 131.62 | 131.62 | 175-1078C-15X-2,131.5 | R | P | LIGHT LAYER |
| 134.36 | 134.36 | 175-1078C-15X-CC,20 | B | also checked 63?m fraction | |
| 140.33 | 140.33 | 175-1078C-16X-CC,108 | B | also checked 63?m fraction | |
| 155.37 | 155.37 | 175-1078C-17X-CC,47 | B | also checked 63?m fraction | |
| 160.94 | 160.94 | 175-1078C-18X-CC,27 | B | also checked 63?m fraction |