Shipley, Thomas H; Ogawa, Yujiro; Shipboard Scientific Party (2005): Magnetic susceptibility on ODP Hole 156-949C [dataset]. PANGAEA, https://doi.org/10.1594/PANGAEA.265849
Always quote citation above when using data! You can download the citation in several formats below.
Related to:
ODP/TAMU (2005): JANUS Database. Ocean Drilling Program, Texas A&M University, College Station TX 77845-9547, USA; (data copied from Janus 2005-02 to 2005-06), http://www-odp.tamu.edu/database/
Shipley, Thomas H; Ogawa, Yujiro; Blum, Peter; et al. (1996): Proceedings of the Ocean Drilling Program, 156 Initial Reports. Proceedings of the Ocean Drilling Program, Ocean Drilling Program, 156, 301 pp, https://doi.org/10.2973/odp.proc.ir.156.1995
Further details:
Blum, Peter (1997): Magnetic susceptibility. Physical properties handbook: a guide to the shipboard measurement of physical properties of deep-sea cores, hdl:10013/epic.40058.d004
Project(s):
Ocean Drilling Program (ODP)
Coverage:
Latitude: 15.536900 * Longitude: -58.714200
Date/Time Start: 1994-07-03T09:00:00 * Date/Time End: 1994-07-23T19:00:00
Minimum DEPTH, sediment/rock: 405.916 m * Maximum DEPTH, sediment/rock: 455.144 m
Event(s):
156-949C * Latitude: 15.536900 * Longitude: -58.714200 * Date/Time Start: 1994-07-03T09:00:00 * Date/Time End: 1994-07-23T19:00:00 * Elevation: -5005.0 m * Penetration: 463.8 m * Recovery: 2.18 m * Location: South Atlantic Ocean * Campaign: Leg156 * Basis: Joides Resolution * Method/Device: Drilling/drill rig (DRILL) * Comment: 7 cores; 62.8 m cored; 0 m drilled; 3.5 % recovery
Parameter(s):
| # | Name | Short Name | Unit | Principal Investigator | Method/Device | Comment |
|---|---|---|---|---|---|---|
| 1 | DEPTH, sediment/rock | Depth sed | m | Geocode | ||
| 2 | Depth, composite | Depth comp | mcd | Shipboard Scientific Party | ||
| 3 | Sample code/label | Sample label | Shipboard Scientific Party | DSDP/ODP/IODP sample designation | ||
| 4 | Magnetic susceptibility, volume | kappa | 10-6 SI | Shipboard Scientific Party | Bartington MS2C coil sensor |
License:
Creative Commons Attribution 3.0 Unported (CC-BY-3.0)
Size:
48 data points
Data
| 1 Depth sed [m] | 2 Depth comp [mcd] | 3 Sample label | 4 kappa [10-6 SI] |
|---|---|---|---|
| 405.916 | 405.916 | 156-949C-2R-CC,1.6 | 3624.0 |
| 425.246 | 425.246 | 156-949C-4R-1,4.6 | 6.0 |
| 425.444 | 425.444 | 156-949C-4R-1,24.4 | 37.0 |
| 425.756 | 425.756 | 156-949C-4R-CC,4.6 | 21.0 |
| 425.854 | 425.854 | 156-949C-4R-CC,14.4 | 11.0 |
| 434.946 | 434.946 | 156-949C-5R-CC,4.6 | 16.0 |
| 454.145 | 454.145 | 156-949C-7R-1,4.5 | 23.0 |
| 454.244 | 454.244 | 156-949C-7R-1,14.4 | 20.0 |
| 454.344 | 454.344 | 156-949C-7R-1,24.4 | 22.0 |
| 454.444 | 454.444 | 156-949C-7R-1,34.4 | 28.0 |
| 454.544 | 454.544 | 156-949C-7R-1,44.4 | 26.0 |
| 454.644 | 454.644 | 156-949C-7R-1,54.4 | 22.0 |
| 454.744 | 454.744 | 156-949C-7R-1,64.4 | 33.0 |
| 454.844 | 454.844 | 156-949C-7R-1,74.4 | 38.0 |
| 455.046 | 455.046 | 156-949C-7R-CC,4.6 | 36.0 |
| 455.144 | 455.144 | 156-949C-7R-CC,14.4 | 37.0 |