Okamoto, K; Lewis, Brian T R; Robinson, Paul T (2005): Major-element chemical analyses of Hole 65-482D [dataset]. PANGAEA, https://doi.org/10.1594/PANGAEA.262510
Always quote citation above when using data! You can download the citation in several formats below.
Related to:
DSDP (1989): Data from the Deep Sea Drilling Project. Sediment, hard rock and reference files. National Geophysical Data Center, National Environmental Satellite, Data and Information Service, National Oceanic and Atmospheric Administration, U.S. Department of Commerce, 1, CD-ROM
Zolotarev, Boris P; Stephen, Ralph A; Schmincke, Hans-Ulrich; Salisbury, Matthew H; Rangin, Claude; Morrison, M Ann; Kudo, A M; Hattner, J; Gutiérrez-Estrada, Mario; Flower, Martin F J; Duennebier, Frederick K; Day, Ron; Cambon, P; Blackinton, Grant; Benson, Richard N; Lewis, Brian T R; Robinson, P (1983): Initial Reports of the Deep Sea Drilling Project. Initial Reports of the Deep Sea Drilling Project, U.S. Government Printing Office, LXV, 752 pp, https://doi.org/10.2973/dsdp.proc.65.1983
Further details:
Project(s):
Deep Sea Drilling Project (DSDP)
Coverage:
Latitude: 22.788500 * Longitude: -107.991800
Date/Time Start: 1979-01-24T00:00:00 * Date/Time End: 1979-01-24T00:00:00
Minimum DEPTH, sediment/rock: 154.09 m * Maximum DEPTH, sediment/rock: 170.68 m
Event(s):
65-482D * Latitude: 22.788500 * Longitude: -107.991800 * Date/Time: 1979-01-24T00:00:00 * Elevation: -3008.0 m * Penetration: 186.5 m * Recovery: 64.2 m * Location: North Pacific/Gulf of California/CONT RISE * Campaign: Leg65 * Basis: Glomar Challenger * Method/Device: Drilling/drill rig (DRILL) * Comment: 13 cores; 114 m cored; 0 m drilled; 56.3 % recovery
Parameter(s):
| # | Name | Short Name | Unit | Principal Investigator | Method/Device | Comment |
|---|---|---|---|---|---|---|
| 1 | DEPTH, sediment/rock | Depth sed | m | Geocode | ||
| 2 | Sample code/label | Sample label | Okamoto, K | DSDP/ODP/IODP sample designation | ||
| 3 | Rock type | Rock | Okamoto, K | |||
| 4 | Lithology/composition/facies | Lithology | Okamoto, K | |||
| 5 | Silicon dioxide | SiO2 | % | Okamoto, K | ||
| 6 | Aluminium oxide | Al2O3 | % | Okamoto, K | ||
| 7 | Iron oxide, Fe2O3, fractionated | Fe2O3 frac | % | Okamoto, K | Calculated | given as Fe2O3 [%] |
| 8 | Iron oxide, FeO, fractionated | FeO frac | % | Okamoto, K | Calculated | given as FeO [%] |
| 9 | Magnesium oxide | MgO | % | Okamoto, K | ||
| 10 | Calcium oxide | CaO | % | Okamoto, K | ||
| 11 | Sodium oxide | Na2O | % | Okamoto, K | ||
| 12 | Potassium oxide | K2O | % | Okamoto, K | ||
| 13 | Titanium dioxide | TiO2 | % | Okamoto, K | ||
| 14 | Phosphorus pentoxide | P2O5 | % | Okamoto, K | ||
| 15 | Sample method | Sample method | Okamoto, K | |||
| 16 | Method comment | Method comm | Okamoto, K |
License:
Creative Commons Attribution 3.0 Unported (CC-BY-3.0)
Size:
195 data points
Data
| 1 Depth sed [m] | 2 Sample label | 3 Rock | 4 Lithology | 5 SiO2 [%] | 6 Al2O3 [%] | 7 Fe2O3 frac [%] | 8 FeO frac [%] | 9 MgO [%] | 10 CaO [%] | 11 Na2O [%] | 12 K2O [%] | 13 TiO2 [%] | 14 P2O5 [%] | 15 Sample method | 16 Method comm |
|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
| 154.09 | 65-482D-10-3,58-60 | Igneous | PLAG-CPX-OL SP PHYRIC BASALT | 50.65 | 15.56 | 2.27 | 8.22 | 8.08 | 12.03 | 2.46 | 0.08 | 1.45 | 0.13 | PR | FTTTFTF TF1TTF |
| 154.09 | 65-482D-10-3,58-60 | Igneous | PLAG-CPX-OL SP PHYRIC BASALT | 50.84 | 15.57 | 2.27 | 8.19 | 8.03 | 12.03 | 2.37 | 0.09 | 1.44 | 0.12 | PR | FTTTFTF TF1TTF |
| 154.20 | 65-482D-10-3,68-72 | Igneous | APHYRIC BASALT | 50.83 | 15.86 | 2.17 | 7.82 | 8.17 | 11.16 | 2.38 | 0.07 | 1.46 | 0.11 | PR | FTTTFTF TF1TTF |
| 154.20 | 65-482D-10-3,68-72 | Igneous | APHYRIC BASALT | 50.68 | 16.21 | 2.14 | 7.71 | 8.35 | 11.22 | 1.76 | 0.06 | 1.43 | 0.07 | PR | FTTTFTF TF1TTF |
| 154.39 | 65-482D-10-3,88-91 | Igneous | GLASS SELVEDGE | 50.09 | 14.30 | 2.33 | 8.40 | 7.38 | 12.14 | 2.47 | 0.08 | 1.52 | 0.12 | PR | FTTTFTF TF1TFF |
| 154.45 | 65-482D-10-3,93-97 | Igneous | GLASS SELVEDGE | 50.09 | 14.54 | 2.33 | 8.42 | 7.44 | 12.06 | 2.51 | 0.09 | 1.52 | 0.13 | PR | FTTTFTF TF1TFF |
| 154.83 | 65-482D-10-3,130-135 | Igneous | GLASS SELVEDGE | 50.63 | 14.68 | 2.37 | 8.54 | 7.44 | 12.18 | 2.54 | 0.10 | 1.52 | 0.14 | PR | FTTTFTF TF1TFF |
| 160.22 | 65-482D-11-1,69-74 | Igneous | APHYRIC BASALT | 50.48 | 15.60 | 2.25 | 8.14 | 8.01 | 11.85 | 2.31 | 0.09 | 1.42 | 0.12 | PR | FTTTFTF TF1TTF |
| 160.22 | 65-482D-11-1,69-74 | Igneous | APHYRIC BASALT | 50.28 | 15.53 | 2.30 | 8.28 | 8.03 | 12.03 | 2.28 | 0.10 | 1.39 | 0.13 | PR | FTTTFTF TF1TTF |
| 161.36 | 65-482D-11-2,33-38 | Igneous | GLASS SELVEDGE | 50.71 | 14.70 | 2.34 | 8.46 | 7.32 | 12.09 | 2.56 | 0.09 | 1.49 | 0.13 | PR | FTTTFTF TF1TFF |
| 162.71 | 65-482D-11-3,19-22 | Igneous | GLASS SELVEDGE | 51.38 | 14.40 | 2.37 | 8.58 | 7.39 | 12.21 | 2.53 | 0.10 | 1.58 | 0.13 | PR | FTTTFTF TF1TFF |
| 170.68 | 65-482D-12-2,64-71 | Igneous | PLAG MOD PHYRIC BASALT | 50.90 | 15.09 | 2.25 | 8.14 | 8.26 | 12.20 | 2.08 | 0.06 | 1.34 | 0.11 | PR | FTTTFTF TF1TTF |
| 170.68 | 65-482D-12-2,64-71 | Igneous | PLAG MOD PHYRIC BASALT | 51.10 | 15.38 | 2.20 | 7.95 | 8.35 | 12.22 | 1.72 | 0.05 | 1.28 | 0.08 | PR | FTTTFTF TF1TTF |