Bougault, Henri; Cande, Steven C (2005): Major-element chemical analyses of Hole 82-563 [dataset]. PANGAEA, https://doi.org/10.1594/PANGAEA.262095
Always quote citation above when using data! You can download the citation in several formats below.
Related to:
DSDP (1989): Data from the Deep Sea Drilling Project. Sediment, hard rock and reference files. National Geophysical Data Center, National Environmental Satellite, Data and Information Service, National Oceanic and Atmospheric Administration, U.S. Department of Commerce, 1, CD-ROM
Weaver, Barry L; Rideout, M L; Neuser, R D; Khan, Mohammad Javed; Hill, Ian Ashley; Echols, D J; Drake, N; Curtis, Doris M; Clark, Murlene W; Christie, David M; Brannon, Joyce C; Mills, William; Bougault, Henri; Cande, Steven C (1985): Initial Reports of the Deep Sea Drilling Project. Initial Reports of the Deep Sea Drilling Project, U.S. Government Printing Office, LXXXII, 667 pp, https://doi.org/10.2973/dsdp.proc.82.1985
Further details:
Project(s):
Deep Sea Drilling Project (DSDP)
Coverage:
Latitude: 33.642200 * Longitude: -43.767300
Date/Time Start: 1981-10-24T00:00:00 * Date/Time End: 1981-10-24T00:00:00
Minimum DEPTH, sediment/rock: 364.74 m * Maximum DEPTH, sediment/rock: 376.02 m
Event(s):
82-563 * Latitude: 33.642200 * Longitude: -43.767300 * Date/Time: 1981-10-24T00:00:00 * Elevation: -3786.0 m * Penetration: 382.5 m * Recovery: 186.9 m * Location: North Atlantic/RIDGE * Campaign: Leg82 * Basis: Glomar Challenger * Method/Device: Drilling/drill rig (DRILL) * Comment: 24 cores; 216.5 m cored; 0 m drilled; 86.3 % recovery
Parameter(s):
# | Name | Short Name | Unit | Principal Investigator | Method/Device | Comment |
---|---|---|---|---|---|---|
1 | DEPTH, sediment/rock | Depth sed | m | Geocode | ||
2 | Sample code/label | Sample label | Bougault, Henri | DSDP/ODP/IODP sample designation | ||
3 | Sample ID | Sample ID | Bougault, Henri | |||
4 | Alteration | Alteration | Bougault, Henri | |||
5 | Rock type | Rock | Bougault, Henri | |||
6 | Lithology/composition/facies | Lithology | Bougault, Henri | |||
7 | Silicon dioxide | SiO2 | % | Bougault, Henri | ||
8 | Aluminium oxide | Al2O3 | % | Bougault, Henri | ||
9 | Iron oxide, Fe2O3 | Fe2O3 | % | Bougault, Henri | given as Fe2O3, total [%] | |
10 | Magnesium oxide | MgO | % | Bougault, Henri | ||
11 | Calcium oxide | CaO | % | Bougault, Henri | ||
12 | Sodium oxide | Na2O | % | Bougault, Henri | ||
13 | Potassium oxide | K2O | % | Bougault, Henri | ||
14 | Titanium dioxide | TiO2 | % | Bougault, Henri | ||
15 | Manganese oxide | MnO | % | Bougault, Henri | ||
16 | Phosphorus pentoxide | P2O5 | % | Bougault, Henri | ||
17 | Loss on ignition | LOI | % | Bougault, Henri | ||
18 | Sample method | Sample method | Bougault, Henri | |||
19 | Method comment | Method comm | Bougault, Henri |
License:
Creative Commons Attribution 3.0 Unported (CC-BY-3.0)
Size:
180 data points
Data
1 Depth sed [m] | 2 Sample label | 3 Sample ID | 4 Alteration | 5 Rock | 6 Lithology | 7 SiO2 [%] | 8 Al2O3 [%] | 9 Fe2O3 [%] | 10 MgO [%] | 11 CaO [%] | 12 Na2O [%] | 13 K2O [%] | 14 TiO2 [%] | 15 MnO [%] | 16 P2O5 [%] | 17 LOI [%] | 18 Sample method | 19 Method comm |
---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
364.74 | 82-563-23-1,22-25 | 2B | Fresh | Igneous | PLAG-OL MODERATELY PHYRIC BASALT | 49.64 | 15.25 | 10.43 | 7.66 | 13.40 | 1.61 | 0.22 | 1.01 | 0.17 | 0.10 | 0.46 | XF | FTTTFTF FT4FFF |
367.32 | 82-563-24-1,80-83 | 5B | Slightly altered | Igneous | PLAG-OL MODERATELY PHYRIC BASALT | 49.30 | 15.04 | 10.36 | 7.60 | 13.40 | 1.83 | 0.22 | 0.98 | 0.15 | 0.09 | 1.31 | XF | FTTTFTF FT4FFF |
368.90 | 82-563-24-2,88-91 | 3D | Slightly altered | Igneous | PLAG-OL SPARSELY PHYRIC BASALT | 49.51 | 15.73 | 9.48 | 7.87 | 13.46 | 1.77 | 0.07 | 0.96 | 0.15 | 0.08 | 0.88 | XF | FTTTFTF FT4FFF |
369.23 | 82-563-24-2,121-124 | 5A | Slightly altered | Igneous | OL-PLAG SPARSELY PHYRIC BASALT | 49.95 | 14.37 | 11.23 | 7.85 | 12.64 | 2.06 | 0.32 | 1.03 | 0.17 | 0.09 | 0.44 | XF | FTTTFTF FT4FFF |
371.40 | 82-563-24-4,38-41 | 1C | Fresh | Igneous | PLAG SPARSELY PHYRIC BASALT | 49.54 | 15.15 | 9.67 | 7.96 | 13.13 | 1.65 | 0.09 | 0.98 | 0.16 | 0.09 | 1.07 | XF | FTTTFTF FT4FFF |
373.95 | 82-563-25-1,43-46 | 1F | Fresh | Igneous | PLAG-OL SPARSELY PHYRIC BASALT | 49.18 | 15.58 | 9.42 | 7.65 | 13.52 | 1.56 | 0.13 | 0.96 | 0.16 | 0.09 | 1.23 | XF | FTTTFTF FT4FFF |
375.40 | 82-563-25-2,39-41 | 2A | Slightly altered | Igneous | PLAG-OL SPARSELY PHYRIC BASALT | 48.94 | 15.24 | 9.39 | 7.77 | 14.07 | 1.59 | 0.12 | 0.96 | 0.16 | 0.09 | 1.45 | XF | FTTTFTF FT4FFF |
375.73 | 82-563-25-2,71-74 | 3A | Slightly altered | Igneous | PLAG-OL SPARSELY PHYRIC BASALT | 49.05 | 15.37 | 9.98 | 7.44 | 13.37 | 1.57 | 0.20 | 0.95 | 0.16 | 0.08 | 1.11 | XF | FTTTFTF FT4FFF |
375.80 | 82-563-25-2,79-81 | 3E | Moderately altered | Igneous | PLAG-OL SPARSELY PHYRIC BASALT | 49.02 | 15.10 | 10.82 | 7.27 | 13.20 | 1.44 | 0.33 | 0.94 | 0.17 | 0.08 | 1.32 | XF | FTTTFTF FT4FFF |
376.02 | 82-563-25-2,101-103 | 3D | Slightly altered | Igneous | PLAG-OL SPARSELY PHYRIC BASALT | 49.61 | 15.32 | 9.70 | 7.59 | 13.56 | 1.52 | 0.11 | 0.98 | 0.16 | 0.11 | 1.12 | XF | FTTTFTF FT4FFF |