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Data Publisher for Earth & Environmental Science

Wefer, Gerold; Berger, Wolfgang H; Richter, Carl; Shipboard Scientific Party (2005): Natural gamma radiation of ODP Hole 175-1079B [dataset]. PANGAEA, https://doi.org/10.1594/PANGAEA.260949

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Related to:
ODP/TAMU (2005): JANUS Database. Ocean Drilling Program, Texas A&M University, College Station TX 77845-9547, USA; (data copied from Janus 2005-02 to 2005-06), http://www-odp.tamu.edu/database/
Wefer, Gerold; Berger, Wolfgang H; Richter, C; et al. (1998): Proceedings of the Ocean Drilling Program 175 Initial Reports. Proceedings of the Ocean Drilling Program, Ocean Drilling Program, 175, online, https://doi.org/10.2973/odp.proc.ir.175.1998
Further details:
Blum, Peter (1997): Gamma-ray densiometry. Physical properties handbook: a guide to the shipboard measurement of physical properties of deep-sea cores, hdl:10013/epic.40058.d003
Project(s):
Coverage:
Latitude: -11.929440 * Longitude: 13.308970
Date/Time Start: 1997-09-05T03:55:00 * Date/Time End: 1997-09-05T11:55:00
Minimum DEPTH, sediment/rock: 0.400 m * Maximum DEPTH, sediment/rock: 2.600 m
Event(s):
175-1079B * Latitude: -11.929440 * Longitude: 13.308970 * Date/Time Start: 1997-09-05T03:55:00 * Date/Time End: 1997-09-05T11:55:00 * Elevation: -738.2 m * Penetration: 128.3 m * Recovery: 129.9 m * Location: Benguela Current, South Atlantic Ocean * Campaign: Leg175 * Basis: Joides Resolution * Method/Device: Drilling/drill rig (DRILL) * Comment: 14 cores; 128.3 m cored; 0 m drilled; 101.2 % recovery
Parameter(s):
#NameShort NameUnitPrincipal InvestigatorMethod/DeviceComment
DEPTH, sediment/rockDepth sedmGeocode
Depth, compositeDepth compmcdShipboard Scientific Party
Sample code/labelSample labelShipboard Scientific PartyDSDP/ODP/IODP sample designation
Corrected countsCorr countsShipboard Scientific PartyNaI sensors on WC-MST
Total countsTotal counts#Shipboard Scientific PartyNaI sensors on WC-MST
Size:
24 data points

Data

Download dataset as tab-delimited text — use the following character encoding:


Depth sed [m]

Depth comp [mcd]

Sample label

Corr counts

Total counts [#]
0.4000.400175-1079B-1H-1,4022.3138.87
0.7500.750175-1079B-1H-1,7521.8138.37
1.1001.100175-1079B-1H-1,11023.5440.10
1.9001.900175-1079B-1H-2,4025.1741.73
2.2502.250175-1079B-1H-2,7524.4741.03
2.6002.600175-1079B-1H-2,11025.6742.23